초록 ▼

A handler for a device under test ("DUT") includes a rotating table which supports up to eight DUTs. The DUTs are held in place over openings in the table and separate heat exchangers contact the individual DUTs through the openings and conductively control the temperature of the DUTs. Six of the DU

A handler for a device under test ("DUT") includes a rotating table which supports up to eight DUTs. The DUTs are held in place over openings in the table and separate heat exchangers contact the individual DUTs through the openings and conductively control the temperature of the DUTs. Six of the DUTs are in conditioning stations and are lifted off of the rotary table until they contact separate spring-loaded pads. One of the DUTs is in a test station and it is lifted off of the rotary table until it contacts a test head, at which point testing is performed. The temperature of each of the DUTs is controlled throughout the process.

대표청구항 ▼

[ We claim:] [1.]1. A system for handling a device under test ("DUT"), comprising:a carrier to support the DUT, the carrier defining an aperture which is adapted to be disposed below at least a portion of the DUT;a receptacle to support the carrier, the receptacle defining an aperture, and the recep

[ We claim:] [1.]1. A system for handling a device under test ("DUT"), comprising:a carrier to support the DUT, the carrier defining an aperture which is adapted to be disposed below at least a portion of the DUT;a receptacle to support the carrier, the receptacle defining an aperture, and the receptacle being adapted to maintain the alignment of the carrier such that the carrier aperture overlaps at least part of the receptacle aperture;a tooling system to conductively control a temperature of the DUT and to support the DUT; anda lift mechanism coupled to the tooling system to raise and lower the tooling system when both the receptacle aperture and the carrier aperture are vertically aligned with the tooling system such that at least a portion of the tooling system can penetrate both the receptacle aperture and the carrier aperture and contact the DUT, wherein the lift mechanism is further coupled to the receptacle to facilitate the vertical alignment;wherein, when the tooling system is raised to contact the DUT, the lift mechanism further raises the tooling system to raise the DUT above the carrier such that the DUT is not in direct contact with the carrier.