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Supercritical fluid drying system and method of use 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • F26B-003/00
출원번호 US-0665932 (2000-09-20)
발명자 / 주소
  • Heiko D Moritz
  • Jonathan A. Talbott
  • Mohan Chandra
  • James A. Tseronis
  • Ijaz Jafri
출원인 / 주소
  • S.C. Fluids, Inc.
대리인 / 주소
    Vernon C. Maine
인용정보 피인용 횟수 : 51  인용 특허 : 39

초록

A method and apparatus for fabricating and drying wafers, including micro-electro-mechanical system (MEMS) structures, in a second, supercritical processing fluid environment. The apparatus utilizes an inverted pressure vessel connected to a supercritical processing fluid supply and recover system,

대표청구항

1. An apparatus for drying wafers in a supercritical environment, comprising:an inverted pressure vessel, a horizontal base plate, a wafer cassette configured for supporting at least one wafer for drying, a container sufficiently large to submerge said wafer cassette and said at least one wafer in a

이 특허에 인용된 특허 (39)

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  25. Morch Leo,DKX, Pivotable and sealable cap assembly for opening in a large container.
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  31. White ; III Dorsey E. (Poquoson VA) Updike ; deceased Benjamin T. (late of Newport News VA by Barbara G. Updike ; legal representative) Allred Johnny W. (Newport News VA), Quick actuating closure.
  32. Holtz Michael, Reactor vessel seal and method for temporarily sealing a reactor pressure vessel from the refueling canal.
  33. Pechacek Raymond E. (Houston TX) Clay Henry J. (Bellaire TX), Remotely operable vessel cover positioner.
  34. Takei Toshitaka (Suita JPX) Funatsu Tsunemasa (Sakai JPX), Resist developing apparatus.
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  37. Takahashi Nobuaki (Hachioji JPX), Surface treatment method and apparatus.
  38. Bertoncini Joseph (Gaithersburg MD), Tubeless cell harvester.
  39. Heudecker Gerhard (Pentling-Poign DEX), Vessel closure machine.

이 특허를 인용한 특허 (51)

  1. Mehmandoust, Yassin, Apparatus and method for drying a substrate using hydrophobic and polar organic compounds.
  2. Yokomizo,Kenji, Apparatus and method of securing a workpiece during high-pressure processing.
  3. Shrinivasan,Krishnan; Banerjee,Souvik; Juarez,Francisco; Reinhardt,Karen A.; Gopinath,Sanjay, Apparatus and methods for processing semiconductor substrates using supercritical fluids.
  4. Biberger, Maximilian Albert; Layman, Frederick Paul; Sutton, Thomas Robert, Apparatus for supercritical processing of a workpiece.
  5. Biberger, Maximilian Albert; Layman, Frederick Paul; Sutton, Thomas Robert, Apparatus for supercritical processing of multiple workpieces.
  6. Kroeker,Tony R., Cluster tool process chamber having integrated high pressure and vacuum chambers.
  7. Jones,William Dale, Control of fluid flow in the processing of an object with a fluid.
  8. Sheydayi,Alexei; Sutton,Thomas, Gate valve for plus-atmospheric pressure semiconductor process vessels.
  9. Fukuoka, Tetsuo; Akimoto, Masami; Kitano, Takahiro; Kimura, Yoshio; Hayashi, Shinichi; Ito, Hikaru, Heating apparatus, and coating and developing apparatus.
  10. Sutton, Thomas R.; Biberger, Maximilan A., High pressure compatible vacuum chuck for semiconductor wafer including lift mechanism.
  11. Jones, William D., High pressure fourier transform infrared cell.
  12. Biberger, Maximilian A.; Layman, Frederick Paul; Sutton, Thomas Robert, High pressure processing chamber for semiconductor substrate.
  13. Biberger,Maximilian A.; Layman,Frederick Paul; Sutton,Thomas Robert, High pressure processing chamber for semiconductor substrate.
  14. Jones,William Dale, High-pressure processing chamber for a semiconductor wafer.
  15. Jones,William Dale, High-pressure processing chamber for a semiconductor wafer.
  16. Stockert,David L.; Evans,Timothy B.; Sobeck,Robert J., Housingless washer.
  17. Stockert,David L.; Tristani,Timothy P.; Menzer,David M., Housingless washer.
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  19. Skerlos, Steven J.; Hayes, Kim F.; Clarens, Andres F., Metalworking lubricant formulations based on supercritical carbon dioxide.
  20. Sheydayi,Alexei, Method and apparatus for clamping a substrate in a high pressure processing system.
  21. Goshi,Gentaro, Method and apparatus for cooling motor bearings of a high pressure pump.
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  23. Parent,Wayne M.; Goshi,Gentaro, Method and system for cooling a pump.
  24. Parent,Wayne M., Method and system for determining flow conditions in a high pressure processing system.
  25. Parent, Wayne M.; Geshell, Dan R., Method and system for passivating a processing chamber.
  26. Hansen,Brandon; Lowe,Marie, Method and system for treating a substrate with a high pressure fluid using fluorosilicic acid.
  27. Wagner, Mark I.; DeYoung, James P., Method and system of drying a microelectronic topography.
  28. Kawamura,Kohei; Asano,Akira; Miyatani,Koutarou; Hillman,Joseph T.; Palmer,Bentley, Method for supercritical carbon dioxide processing of fluoro-carbon films.
  29. Biberger, Maximilian Albert; Layman, Frederick Paul; Sutton, Thomas Robert, Method for supercritical processing of multiple workpieces.
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  31. Sheydayi,Alexei, Non-contact shuttle valve for flow diversion in high pressure systems.
  32. Stockert,David L, Parts washer system.
  33. Namatsu, Hideo, Pattern formation method and apparatus.
  34. Sheydayi,Alexei, Pressure energized pressure vessel opening and closing device and method of providing therefor.
  35. Wuester,Christopher D., Process flow thermocouple.
  36. John Michael Cotte ; Dario L. Goldfarb ; Kenneth John McCullough ; Wayne Martin Moreau ; Keith R. Pope ; John P. Simons ; Charles J. Taft, Process of drying semiconductor wafers using liquid or supercritical carbon dioxide.
  37. Kohama, Kyouji; Shimbo, Eiji; Kamikawa, Yuji; Toshima, Takayuki; Ohno, Hiroki, Processing apparatus and processing method.
  38. Berman, Allan, Processing tank with improved quick dump valve.
  39. Mullee, William H., Removal of photoresist and photoresist residue from semiconductors using supercritical carbon dioxide process.
  40. Kim, Hyun Jong; Kim, Ju Won; Cho, Jung Keun, Spin head and substrate treating method using the same.
  41. Kamikawa, Yuji, Substrate processing apparatus.
  42. Toshima, Takayuki; Terada, Kazuo; Honda, Kazuyuki, Substrate processing apparatus and substrate processing method.
  43. Kamikawa, Yuji, Substrate processing apparatus, substrate processing method and storage medium.
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  45. Namatsu, Hideo, Supercritical drying method and supercritical drying apparatus.
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  47. Simons, John P.; McCullough, Kenneth J.; Moreau, Wayne M.; Taft, Charles J., Topcoat process to prevent image collapse.
  48. Jacobson,Gunilla; Yellowaga,Deborah, Treatment of a dielectric layer using supercritical CO.
  49. Kevwitch, Robert, Treatment of substrate using functionalizing agent in supercritical carbon dioxide.
  50. Sheydayi,Alexei, Vacuum chuck utilizing sintered material and method of providing thereof.
  51. Foster, John Stuart; Feierabend, Patrick Edward; Shillinger, Michael James, Wafer level method for probing micromechanical devices.
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