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Electronic device tray electronic device tray, transporting apparatus, and electronic device testing apparatus

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-001/04
출원번호 US-0320691 (1999-05-27)
우선권정보 JP-0150051 (1998-05-29); JP-0248215 (1998-09-02); JP-0106155 (1999-04-14)
발명자 / 주소
  • Kazuyuki Yamashita JP
  • Hiroto Nakamura JP
  • Shin Nemoto JP
출원인 / 주소
  • Advantest Corporation JP
대리인 / 주소
    Birch, Stewart, Kolasch & Birch, LLP
인용정보 피인용 횟수 : 24  인용 특허 : 14

초록

An electronic device tray 110 having a plurality of IC holders 14 in which IC chips are held and having a shutter 15 for opening and closing openings of the IC holders 14, the shutter 15 being opened and closed by fluid pressure cylinders etc. provided at an IC tester. Further, a tray vertical carri

대표청구항

1. An electronic device tray transporting apparatus for transporting the tray in a substantially vertical direction, the tray holding at least one electronic device, comprising:a tray end holding member able to detachably hold an end of a lowermost level tray positioned at a lowermost level in the d

이 특허에 인용된 특허 (14)

  1. Ishii Takao,JPX ; Akiyama Shuji,JPX ; Hosaka Hiroki,JPX, Apparatus and method for testing semiconductor device.
  2. Klug Mark W. (San Diego CA) Toth Thomas E. (San Diego CA) Guenther Theodore C. (San Diego CA) Twite Martin (Coronado CA) Tsurishima Kazuyuki (Saitama JPX) Tani Mitsuaki (Saitama JPX) Baba Minoru (Sai, Apparatus for automatic handling.
  3. Pennington James Q. (Brentwood TN) Story Ray A. (Nashville TN), Dual temperature maintenance food serving compartment with pre-cooled cooling modules and heat storage pellets.
  4. Emery Roy W. (1 Donino Ct. Toronto ; Ontario CAX M4N 2H6) Emery John R. (83 Ames Circle Don Mills ; Ontario CAX M3B 3C2), Egg carton.
  5. Twigg Ray G. (San Diego CA) Klug Mark W. (San Diego CA) Marrone Santino (Poway CA) Hawkes Malcolm V. (San Diego CA), Electronic device test handler.
  6. Beyer Anthony W., Modular tray system.
  7. Goins ; III Fred (Boise ID), Module handling apparatus and method with rapid switchover capability.
  8. Smith Paul E., SIMM board handler.
  9. Sakai Iwao (Itami JPX), Semiconductor device test system.
  10. Carter Jesse Donald (741 Orizaba Ave. ; No. 3 Long Beach CA 90804), Storage and carrying case for compact cassettes.
  11. Giddings James N. (Mesquite TX) Howell Robert P. (San Jose CA), Tester for integrated circuits.
  12. Nemoto Hisashi (Tokyo JPX), Tray for semiconductor devices.
  13. Pakeriasamy Saragarvani, Tray for shipping PCMCIA cards.
  14. Pakeriasamy Saragarvani, Tray with flippable cover.

이 특허를 인용한 특허 (24)

  1. Cojocneanu, Christian O.; Scurtu, Lucian, Apparatus and method for testing semiconductor devices.
  2. Cojocneanu, Christian O.; Iosub, Doru G., Apparatus having a member to receive a tray(s) that holds semiconductor devices for testing.
  3. Wong, Hon Meng; Lam, Lek Seng, Automated tray transfer device for prevention of mixing post and pre-test dies, and method of using same.
  4. Wong,Hon Meng; Lam,Lek Seng, Automated tray transfer device for prevention of mixing post and pre-test dies, and method of using same.
  5. Uchino,Yoshiaki; Arakawa,Osamu, Carrier transporting apparatus, method of transporting a carrier and transporting apparatus.
  6. Tsuji,Shinjiro; Nishimoto,Tomotaka; Murata,Takahiko; Ida,Masayuki, Component mounting apparatus and component mounting method, and recognition apparatus for a component mount panel, component mounting apparatus for a liquid crystal panel, and component mounting meth.
  7. Rogel-Favila, Ben; Nalluri, Padmaja; Allison, Kirsten, Controlling automated testing of devices.
  8. Rogel-Favila, Ben; Fishman, James, Customizable tester having testing modules for automated testing of devices.
  9. Langer, Alfred; Hellmuth, Christian, Device and method for testing electronic components.
  10. Jun Shimizu JP, IC test system for testing BGA packages.
  11. Hopkins,James E.; Costello,Michael Peter; Tsai,Herbert; Chen,Ching Too, Method for testing micro SD devices using each test circuits.
  12. Rogel-Favila, Ben; Fishman, James, Multi-configurable testing module for automated testing of a device.
  13. Sum,Kai Wah; Tan,Wee Boon; Yap,Liop Jin, Multi-package conversion kit for a pick and place handler.
  14. Wah, Sum Kai; Boon, Tan Wee; Jin, Yap Liop, Multi-package conversion kit for a pick and place handler.
  15. Na, Yun-Sung; Jeon, In-Gu; Yo, Dong-Hyun; Lee, Young-Chul, Pick and place apparatus for electronic device inspection equipment.
  16. Na, Yun-Sung; Jeon, In-Gu; Yo, Dong Hyun; Lee, Young-Chul, Pick and place apparatus for electronic device inspection equipment, picking apparatus thereof, and method for loading electronic devices onto loading element.
  17. Hiroyuki Kozono JP, Semiconductor device for use in evaluating integrated circuit device.
  18. Rogel-Favila, Ben; Fishman, James, Supporting automated testing of devices in a test floor system.
  19. Kim, Yong Sun; Yun, Hyo Chul; Yun, Dae Gon, Test tray and handler using the test tray.
  20. Rogel-Favila, Ben; Wolff, Roland; Kushnick, Eric; Fishman, James, Universal container for device under test.
  21. Rogel-Favila, Ben; Wolff, Roland; Kushnick, Eric; Fishman, James, Universal test cell.
  22. Rogel-Favila, Ben; Wolff, Roland; Kushnick, Eric; Fishman, James; Su, Mei-Mei, Universal test floor system.
  23. Lu, Sheng Feng; Hsiao, Yu Kun, Wafer level assemble chip multi-site testing solution.
  24. Partee, Jimmie Paul, Wireless enclosure for testing electronic devices.
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