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Apparatus and method for controlling distribution of product in manufacturing process 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G05B-013/02
출원번호 US-0216877 (1998-12-21)
발명자 / 주소
  • William P. Ladd
출원인 / 주소
  • Recot, Inc.
대리인 / 주소
    Rothwell, Figg, Ernst & Manbeck
인용정보 피인용 횟수 : 35  인용 특허 : 14

초록

Apparatus and method for controlling the distribution of product items over a manufacturing line, in particular, for controlling the distribution of potato slices across the width of a fryer in a commercial potato chip manufacturing process, includes a number of sensors for measuring the moisture co

대표청구항

1. Apparatus for controlling the distribution profile of product items over a product manufacturing line, comprising:means for measuring a physical characteristic parameter of individual product items at a predetermined location in said line; means for comparing a measured characteristic parameter w

이 특허에 인용된 특허 (14)

  1. Petelle Joey (Scottsdale AZ) Stoesz Karen D. (Scottsdale AZ) Williams Lisa R. (Chandler AZ), Apparatus for making fat free potato chips.
  2. Smith J. Hudson P. (P.O. Box 734 Kimberton PA 19442), Apparatus for preparing and packaging potato chips.
  3. Thomas James A., Computer controlled separator device.
  4. Holm David (299 N. Lloyd Cir. Idaho Falls ID) Hix Veldon M. (299 N. Lloyd Cir. Idaho Falls ID) Willard Miles J. (299 N. Lloyd Cir. Idaho Falls ID 83402), Controlled surface bubbling fabricated snack products.
  5. Spinner Robert E.,CAX ; Baron Ian C.,CAX ; McCormick Keith T.,CAX ; Sankey J. Todd,CAX, Distributed intelligence actuator controller with peer-to-peer actuator communication.
  6. Lewis Glenn R. (Lawrenceville GA), Dual mode cross-directional moisture control.
  7. Maher ; Jr. Charles A., Electronic controller for heating apparatus.
  8. Quo Geoffrey Q. (Irving TX) Pound Philip W. (Irving TX), Method and apparatus for feeding produce items to centrifugal slicers.
  9. Antonissen Peter (Norfolk GB2), Method and apparatus for slicing a product in accordance with its anticipated weight distribution.
  10. Willard Miles J. (154 E. 49th South Idaho Falls ID 83404) Dayley Kyle E. (Rigby ID) Remer LaRue (Rigby ID) Arnold Jane (Idaho Falls ID), Method and apparatus for testing snack product ingredients.
  11. Hagart-Alexander Claud,CAX ; Hu Hung-Tzaw ; Watson David,CAX ; Preston John, Paper stock shear and formation control.
  12. Adamy Jurgen,DEX, Process and device for monitoring the cross-sectional profile of a continuously produced web of material.
  13. Henson William Douglas (Duncanville TX) Slovak William Roman (Arlington TX) Dalson Constantine Trifon (Irving TX) Slay Brenda Dee (Dallas TX), Process for producing kettle-style potato chips.
  14. Faulkner Keith (Bexley GB2) Appleford David E. (Romford GB2), Weighing and dispensing device.

이 특허를 인용한 특허 (35)

  1. Paik,Young J., Adjusting manufacturing process control parameter using updated process threshold derived from uncontrollable error.
  2. Schwarm,Alexander T., Automated design and execution of experiments with integrated model creation for semiconductor manufacturing tools.
  3. Arackaparambil,John F.; Chi,Tom; Chow,Billy; D'Souza,Patrick M.; Hawkins,Parris; Huang,Charles; Jensen,Jett; Krishnamurthy,Badri N.; Kulkarni,Pradeep M.; Kulkarni,Prakash M.; Lin,Wen Fong; Mohan,Shan, Computer integrated manufacturing techniques.
  4. Arackaparambil,John F.; Chi,Tom; Chow,Billy; D'Souza,Patrick M.; Hawkins,Parris; Huang,Charles; Jensen,Jett; Krishnamurthy,Badri N.; Kulkarni,Pradeep M.; Kulkarni,Prakash M.; Lin,Wen Fong; Mohan,Shan, Computer integrated manufacturing techniques.
  5. Paik, Young Joseph, Control of chemical mechanical polishing pad conditioner directional velocity to improve pad life.
  6. Paik,Young Joseph, Control of chemical mechanical polishing pad conditioner directional velocity to improve pad life.
  7. Ward, Nicholas A.; Danielson, Richard; Corey, David B., Dynamic control of wafer processing paths in semiconductor manufacturing processes.
  8. Shanmugasundram, Arulkumar P.; Schwarm, Alexander T., Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing.
  9. Shanmugasundram, Arulkumar P.; Schwarm, Alexander T., Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing.
  10. Shanmugasundram, Arulkumar P.; Schwarm, Alexander T., Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing.
  11. Paik, Young Jeen, Dynamic offset and feedback threshold.
  12. Chi, Yueh-Shian; Hawkins, Parris C M; Huang, Charles Q., Dynamic subject information generation in message services of distributed object systems.
  13. Chi,Yueh shian T.; Hawkins,Parris C. M.; Huang,Charles Q., Dynamic subject information generation in message services of distributed object systems in a semiconductor assembly line facility.
  14. Krishnamurthy,Badri N.; Hawkins,Parris C. M., Experiment management system, method and medium.
  15. Shanmugasundram, Arulkumar P.; Schwarm, Alexander T.; Prabhu, Gopalakrishna B., Feedback control of a chemical mechanical polishing device providing manipulation of removal rate profiles.
  16. Shanmugasundram,Arulkumar P.; Schwarm,Alexander T.; Prabhu,Gopalakrishna B., Feedback control of a chemical mechanical polishing device providing manipulation of removal rate profiles.
  17. Shanmugasundram, Arulkumar P.; Schwarm, Alexander T.; Iliopoulos, Ilias; Parkhomovsky, Alexander; Seamons, Martin J., Feedback control of plasma-enhanced chemical vapor deposition processes.
  18. Paik,Young Joseph, Feedforward and feedback control for conditioning of chemical mechanical polishing pad.
  19. Shanmugasundram,Arulkumar P.; Schwarm,Alexander T., Integrating tool, module, and fab level control.
  20. Reiss,Terry P.; Shanmugasundram,Arulkumar P.; Schwarm,Alexander T., Integration of fault detection with run-to-run control.
  21. Siew, Wei-ling; Zhang, Jiajie; Garg, Aditya, Method of dewatering in a continuous high internal phase emulsion foam forming process.
  22. Siew, Wei-ling; Zhang, Jiajie; Garg, Aditya, Method of dewatering in a continuous high internal phase emulsion foam forming process.
  23. Schwarm,Alexander T.; Shanmugasundram,Arulkumar P.; Pan,Rong; Hernandez,Manuel; Mohammad,Amna, Method of feedback control of sub-atmospheric chemical vapor deposition processes.
  24. Kokotov,Yuri; Entin,Efim; Seror,Jacques; Fisher,Yossi; Sarel,Shalomo; Shanmugasundram,Arulkumar P.; Schwarm,Alexander T.; Paik,Young Jeen, Method, system and medium for controlling manufacture process having multivariate input parameters.
  25. Al Bayati,Amir; Adibi,Babak; Foad,Majeed; Somekh,Sasson, Method, system and medium for controlling semiconductor wafer processes using critical dimension measurements.
  26. Shanmugasundram,Arulkumar P.; Armer,Helen; Schwarm,Alexander T., Method, system and medium for process control for the matching of tools, chambers and/or other semiconductor-related entities.
  27. Schwarm,Alexander T.; Shanmugasundram,Arulkumar P.; Seror,Jacques; Kokotov,Yuri; Entin,Efim, Method, system, and medium for handling misrepresentative metrology data within an advanced process control system.
  28. Paik,Young J., Process control by distinguishing a white noise component of a process variance.
  29. Paik,Young Jeen, Process control by distinguishing a white noise component of a process variance.
  30. Padhi,Deenesh; Gandikota,Srinivas; Naik,Mehul; Parikh,Suketu A.; Dixit,Girish A., Selective metal encapsulation schemes.
  31. Okabe,Tsuneyuki; Kaneko,Kengo, Semiconductor production system and semiconductor production process.
  32. Beaulieu, Kelly; Church, Philip Maurice, Specific gravity monitoring and sorting system.
  33. Grabscheid,Joachim; Hermann,Klaus; Augscheller,Thomas; Wegmann,Florian; Mayer,Roland; Kleiser,Georg, System for computer assisted monitoring of a cross profile of a quality parameter in a material web.
  34. Schwarm,Alexander T., System, method, and medium for monitoring performance of an advanced process control system.
  35. Surana,Rahul; Zutshi,Ajoy, Technique for process-qualifying a semiconductor manufacturing tool using metrology data.
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