$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Laser delivery system and method for photolithographic mask repair 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G03B-027/54
  • G03B-027/42
  • G03B-027/32
  • G01N-021/88
출원번호 US-0512580 (2000-02-24)
발명자 / 주소
  • John O'Connor
  • Qiang Fu
출원인 / 주소
  • Quantronix Corporation
대리인 / 주소
    Nixon Peabody LLP
인용정보 피인용 횟수 : 45  인용 특허 : 64

초록

A system and method for photolithographic mask repair. The system includes a structure for supporting a mask to be operated on, a laser emitting device for effecting mask repair, a light source adjacent the support structure for selected illumination of the mask, a laser processor for effecting sequ

대표청구항

1. A system for photolithographic mask repair which comprises:a structure for supporting a mask to be operated on; a laser emitting device for effecting mask repair; a light source adjacent the support structure for selected illumination of the mask; a laser processor for effecting sequential angula

이 특허에 인용된 특허 (64)

  1. Bille Josef F. (Solana Beach CA) Brown Stuart I. (La Jolla CA), 3-Dimensional laser beam guidance system.
  2. Mourou Gerard A. (Ann Arbor MI) Squier Jeffrey (Ann Arbor MI) Coe John S. (Ann Arbor MI) Harter Donald J. (Ann Arbor MI), Amplification of ultrashort pulses with Nd:glass amplifiers pumped by alexandrite free running laser.
  3. L\Esperance ; Jr. Francis A. (Englewood NJ), Apparatus for performing ophthalmic laser surgery.
  4. L\Esperance ; Jr. Francis A. (Englewood NJ), Apparatus for performing ophthalmogolical surgery.
  5. Bille Josef (Am Pferchelhang 2/4 6900 Heidelberg DEX), Apparatus for, and method of, examining eyes.
  6. Bille Josef (AM Pferchelhang 2/4 6900 Heidelberg DEX) Hunklinger Siegfried (AM Buchsenackerhang 68 6900 Heidelberg DEX), Apparatus for, and methods of, determining the characteristics of semi-conductor wafers.
  7. Bille Josef (Am Pferchelhang 2/4 6900 Heidelberg DEX) Hunklinger Siegfried (Am Bchsenackerhang 68 6900 Heidelberg DEX), Appartus for, and methods of, inscribing patterns on semiconductor wafers.
  8. Herziger Gerd (Fasanenweg 2 6101 Rossdorf DEX) Beyer Eckhard (Alsbach DEX) Loosen Peter (Mainz DEX) Poprawe Reinhart (Knigstein DEX), Arrangement for machining workpieces by means of a laser beam by building up a plasma that is to be kept within limits.
  9. Levy Kenneth (Saratoga CA) Sandland Paul (San Jose CA), Automatic photomask inspection system and apparatus.
  10. Hayano Fuminori (Tokyo JPX), Defect inspection method and apparatus, and defect display method.
  11. Bille Josef F. (Rancho Santa Fe CA), Device for mapping corneal topography.
  12. Kawata Shintaro,JPX, Electron-beam-projection-exposure apparatus with integrated mask inspection and cleaning portions.
  13. Braren Bodil E. (Hartsdale NY) Srinivasan Rangaswamy (Yorktown Heights NY), Enhancement of ultraviolet laser ablation and etching organic solids.
  14. Bille Josef F. (Solana Beach CA) Brown Stuart I. (La Jolla CA), Eyetracker and method of use.
  15. Liu Kuo-Ching (Setauket NY), Frequency doubling a Q-switched laser beam by using intracavity Type II phase matching.
  16. Liu Kuo-Ching (Setauket NY), Frequency doubling a laser beam by using intracavity type II phase matching.
  17. Liu Kuo-Ching (Setauket NY), Frequency doubling a laser beam by using intracavity type II phase matching.
  18. Alfrey Anthony J. ; Sinofsky Ed, High efficiency high repetition rate, intra-cavity tripled diode pumped solid state laser.
  19. Liu Kuo-Ching (Setauket NY) Tornegard Sten (Smithtown NY) Rhoades Michael (Smithtown NY), High power Nd:YLF solid state lasers.
  20. Lai Shui T. (Del Mar CA), High power diode pumped laser.
  21. Bille Josef F. (Solana Beach CA) Brown Stuart I. (La Jolla CA), Imaging system for surgical lasers.
  22. Stringer Bradley J. ; Badger Lee W. ; Elwood Michael K., In motion dimensioning system for cuboidal objects.
  23. Stringer Bradley J. (Farmington UT) Badger Lee W. (Ogden UT) Elwood Michael K. (Salt Lake City UT), In-motion dimensioning system for cuboidal objects.
  24. Cohen Martin G. (Northport NY) Kern William I. (Smithtown NY) Trokel Stephen (New York NY), Infrared laser system for surgical purposes employing compound fiber probe.
  25. Zhou Fuzheng ; Fu Qiang ; Maikowski Michael, Intra-cavity and inter-cavity harmonics generation in high-power lasers.
  26. Kunz Rino E. (Steinmaur CHX) Murbach Urs (Neuenhof CHX) Huber Ernst (Wettingen CHX), Laser processing apparatus with means for selectively varying the transverse mode distribution of the laser beam.
  27. Yi ; Alberto, Laser removal of material from workpieces.
  28. Itzkan Irving (Boston MA), Laser system for providing target specific energy deposition and damage.
  29. Stringer Bradley J. (Farmington UT) Elwood Michael K. (Salt Lake City UT), Laser-based dimensioning system.
  30. Kryger David L. (Chelmsford MA) Killam R. William (Tewksbury MA), Mask analysis.
  31. Stringer Bradley J. (Farmington UT), Measuring method and apparatus.
  32. Stringer Bradley J. (Farmington UT) Kennington Robert L. (Farmington UT), Measuring method and apparatus.
  33. Stringer Bradley J. (Farmington UT) Smith Brian H. (Kaysville UT), Measuring method and apparatus.
  34. Stringer Bradley J. (Farmington UT) Smith Brian H. (Kaysville UT) Kennington Robert L. (Fruit Heights UT), Measuring method and apparatus.
  35. Liu Kuo-Ching (Setauket NY), Method and apparatus for autofocusing a microscope.
  36. Bille Josef (Heidelberg DEX), Method and apparatus for forming an image of the ocular fundus.
  37. Cohen Martin G. (Huntington NY) Liu Kuo-ching (East Setauket NY), Method and apparatus for frequency doubling a laser beam.
  38. Schfer Fritz P. (Goettingen DEX), Method and apparatus for generating short intensive pulses of electromagnetic radiation in the wavelength range below ab.
  39. Liu Kuo-Ching (Setauket NY), Method and apparatus for laser beam homogenization.
  40. Daly Richard T. (Huntington NY), Method and apparatus for laser irradiating semiconductor material.
  41. Sklar H. Alfred (San Francisco CA) Frank Alan M. (Livermore CA) Ferrer Olga M. (Miami FL) McMillan Charles F. (Livermore CA) Brown Stewart A. (Livermore CA) Rienecker Fred (Pleasanton CA) Harriss Pau, Method and apparatus for precision laser surgery.
  42. Von Allmen ; Martin ; Schwob ; Hans Peter, Method for ablating metal workpieces with laser radiation.
  43. Mourou Gerard A. (Ann Arbor MI) Du Detao (Ann Arbor MI) Dutta Subrata K. (Ann Arbor MI) Elner Victor (Ann Arbor MI) Kurtz Ron (Ann Arbor MI) Lichter Paul R. (Ann Arbor MI) Liu Xinbing (Ann Arbor MI) , Method for controlling configuration of laser induced breakdown and ablation.
  44. L\Esperance ; Jr. Francis A. (Englewood NJ), Method for ophthalmological surgery.
  45. L\Esperance ; Jr. Francis A. (Englewood NJ), Method for opthalmological surgery.
  46. Bille Josef F. (Heidelberg MO DEX) Schanzlin David (St. Louis MO), Method for removing cataractous material.
  47. Bille Josef F. (Rancho Santa Fe CA), Method for reshaping the cornea.
  48. Bille Josef F. (Rancho Santa Fe CA) Brown Stuart I. (La Jolla CA), Method for reshaping the eye.
  49. Strickler James H. (Ithaca NY) Webb Watt W. (Ithaca NY), Method for three dimensional optical data storage and retrieval.
  50. Miyauchi Tateoki (Yokohama JPX) Hongo Mikio (Yokohama JPX) Maruyama Shigenobu (Yokohama JPX) Mizukoshi Katsurou (Yokohama JPX) Yamaguchi Hiroshi (Fujisawa JPX) Morita Koyo (Yamanashi JPX), Method of cutting interconnection pattern with laser and apparatus thereof.
  51. Hatje Guenther H. (Hamburg DEX), Method of enhancing the well-being of a living creature.
  52. Schmidt-Hebbel Robert (Erlangen DEX), Method of forming high precision through holes in workpieces with a laser beam.
  53. Itoh Noriaki (Nagoya JPX) Nakai Yasuo (Kani JPX) Hattori Ken (Tokyo JPX) Okano Akiko (Toyota JPX), Method of quantitative determination of defect concentration on surfaces.
  54. Bille Josef F. (Solana Beach CA) Brown Stuart I. (La Jolla CA), Multiwavelength laser source.
  55. Drozdowicz Zbigniew (Stony Brook NY) Stone Harvey (Flushing NY) Vogler John (Smithtown NY), Photolithographic mask repair system.
  56. Zinck Jennifer J. (Calabasas CA) Brewer Peter D. (Newbury Park CA), Production of clean, well-ordered CdTe surfaces using laser ablation.
  57. Feld Michael S. (Waban MA) Itzkan Irving (Boston MA) Albagli Douglas (Cambridge MA) Izatt Joseph A. (Cambridge MA) Hayes Gary B. (Leominster MA) Rava Richard (Waltham MA), Pulsed laser system for the surgical removal of tissue.
  58. Danielson Donald L. (Palo Alto CA) Wihl Mark J. (Tracy CA) Joseph David A. (Santa Cruz CA), Reticle inspection system.
  59. Daly Richard T. (Huntington NY) Cohen Martin G. (Huntington NY), Segmented YAG laser rods and method of manufacture.
  60. Daly Richard T. (Huntington NY) Cohen Martin G. (Huntington NY) Kumar Binod (Centerville OH), Segmented YAG laser rods and methods of manufacture.
  61. York Kenneth K. (Apt. No. 28 ; 1633 Amberwood Dr. S. Pasadena CA 91030), Systems and methods for creating substrate surfaces by photoablation.
  62. Neev Joseph ; Da Silva Luiz B. ; Matthews Dennis L. ; Glinsky Michael E. ; Stuart Brent C. ; Perry Michael D. ; Feit Michael D. ; Rubenchik Alexander M., Ultrashort pulse high repetition rate laser system for biological tissue processing.
  63. Rink John L. (1741-C Mason St. San Francisco CA 94133) Cohen Howard S. (1105 The Alameda Berkeley CA 94707), Variable pulse width laser and method of use.
  64. Daly Richard T. (Huntington NY) Rhoades Walter (Port Jeff Sta NY) Stone Harvey (Flushing NY) Kaplan Robert A. (Huntington Station NY), YAG Laser system.

이 특허를 인용한 특허 (45)

  1. Sulfridge, Marc, Conductive interconnect structures and formation methods using supercritical fluids.
  2. Sulfridge, Marc, Conductive interconnect structures and formation methods using supercritical fluids.
  3. Sulfridge, Marc, Conductive interconnect structures and formation methods using supercritical fluids.
  4. Harter, Donald J., Femtosecond laser processing system with process parameters controls and feedback.
  5. Shah, Lawrence; Bovatsek, James M.; Arai, Alan Y.; Yamamoto, Tadashi; Patel, Rajesh S.; Harter, Donald J., Femtosecond laser processing system with process parameters controls and feedback.
  6. Shah, Lawrence; Bovatsek, James M.; Arai, Alan Y.; Yamamoto, Tadashi; Patel, Rajesh S.; Harter, Donald J., Femtosecond laser processing system with process parameters controls and feedback.
  7. Shah, Lawrence; Bovatsek, James M.; Arai, Alan Y.; Yamamoto, Tadashi; Patel, Rajesh S.; Harter, Donald J., Femtosecond laser processing system with process parameters, controls and feedback.
  8. Shah,Lawrence; Bovatsek,James M; Arai,Alan Y; Yamamoto,Tadashi; Patel,Rajesh S.; Harter,Donald J., Femtosecond laser processing system with process parameters, controls and feedback.
  9. Haight, Richard A.; Longo, Peter P.; Wagner, Alfred, Method and apparatus for repair of reflective photomasks.
  10. Smith, Jr., Donald L.; Orendorf, Daniel C.; Parks, Stefan A.; Bell, Thomas W.; Peters, Joseph J.; Wood, Ira L.; Para, Jason J., Method and system for marking tires.
  11. Zait,Eitan; Dmitriev,Vladimir J.; Oshemkov,Sergey V; Guletskiy,Nikolay N.; Ben Zvi,Guy, Method and system for repairing defected photomasks.
  12. Chong, Chin Hui; Lee, Choon Kuan, Method of manufacturing an interposer.
  13. Kirby, Kyle K., Methods for forming interconnects in microelectronic workpieces and microelectronic workpieces formed using such methods.
  14. Kirby, Kyle K., Methods for forming interconnects in microelectronic workpieces and microelectronic workpieces formed using such methods.
  15. Sulfridge, Marc, Methods for forming interconnects in microelectronic workpieces and microelectronic workpieces formed using such methods.
  16. Sulfridge, Marc, Methods for forming interconnects in microelectronic workpieces and microelectronic workpieces formed using such methods.
  17. Sulfridge, Marc, Methods for forming interconnects in microelectronic workpieces and microelectronic workpieces formed using such methods.
  18. Oliver,Steven D.; Kirby,Kyle K.; Hiatt,William M., Methods for forming interconnects in vias and microelectronic workpieces including such interconnects.
  19. Rigg,Sidney B.; Watkins,Charles M.; Kirby,Kyle K.; Benson,Peter A.; Akram,Salman, Methods for forming vias in microelectronic devices, and methods for packaging microelectronic devices.
  20. Hiatt, William M.; Kirby, Kyle K., Microelectronic devices and methods for filing vias in microelectronic devices.
  21. Hiatt, William M.; Kirby, Kyle K., Microelectronic devices and methods for filling vias in microelectronic devices.
  22. Kirby, Kyle K.; Akram, Salman; Hembree, David R.; Rigg, Sidney B.; Farnworth, Warren M.; Hiatt, William M., Microelectronic devices and methods for forming interconnects in microelectronic devices.
  23. Kirby, Kyle K.; Akram, Salman; Hembree, David R.; Rigg, Sidney B.; Farnworth, Warren M.; Hiatt, William M., Microelectronic devices and methods for forming interconnects in microelectronic devices.
  24. Clark, Douglas; Oliver, Steven D.; Kirby, Kyle K.; Dando, Ross S., Microelectronic workpieces and methods and systems for forming interconnects in microelectronic workpieces.
  25. Rigg, Sidney B.; Watkins, Charles M.; Kirby, Kyle K.; Benson, Peter A.; Akram, Salman, Microelectronics devices, having vias, and packaged microelectronic devices having vias.
  26. Lee, Teck Kheng; Lim, Andrew Chong Pei, Microfeature workpiece substrates having through-substrate vias, and associated methods of formation.
  27. Hiatt, William M.; Dando, Ross S., Microfeature workpieces and methods for forming interconnects in microfeature workpieces.
  28. Borthakur, Swarnal, Microfeature workpieces having conductive interconnect structures formed by chemically reactive processes, and associated systems and methods.
  29. Borthakur, Swarnal, Microfeature workpieces having conductive interconnect structures formed by chemically reactive processes, and associated systems and methods.
  30. Borthakur, Swarnal, Microfeature workpieces having conductive interconnect structures formed by chemically reactive processes, and associated systems and methods.
  31. Tuttle, Mark E., Microfeature workpieces having interconnects and conductive backplanes, and associated systems and methods.
  32. Tuttle, Mark E., Microfeature workpieces having interconnects and conductive backplanes, and associated systems and methods.
  33. Lee, Teck Kheng, Partitioned through-layer via and associated systems and methods.
  34. Lee, Teck Kheng, Partitioned through-layer via and associated systems and methods.
  35. Lee, Teck Kheng, Partitioned through-layer via and associated systems and methods.
  36. Chong,Chin Hui; Lee,Choon Kuan, Slanted vias for electrical circuits on circuit boards and other substrates.
  37. Watkins, Charles M.; Hiatt, William M., System and methods for forming apertures in microfeature workpieces.
  38. Watkins, Charles M.; Hiatt, William M., Systems and methods for forming apertures in microfeature workpieces.
  39. Watkins, Charles M.; Hiatt, William M., Systems and methods for forming apertures in microfeature workpieces.
  40. Watkins, Charles M.; Hiatt, William M., Systems and methods for forming apertures in microfeature workpieces.
  41. Watkins, Charles M.; Hiatt, William M., Systems and methods for forming apertures in microfeature workpieces.
  42. Jun, Sahng-Ik; Song, Yu-Ri; Park, Woon-Yong, Thin film transistor array substrate having laser illumination indicator.
  43. Akram, Salman; Watkins, Charles M.; Hiatt, William M.; Hembree, David R.; Wark, James M.; Farnworth, Warren M.; Tuttle, Mark E.; Rigg, Sidney B.; Oliver, Steven D.; Kirby, Kyle K.; Wood, Alan G.; Velicky, Lu, Through-wafer interconnects for photoimager and memory wafers.
  44. Akram, Salman; Watkins, Charles M.; Hiatt, William M.; Hembree, David R.; Wark, James M.; Farnworth, Warren M.; Tuttle, Mark E.; Rigg, Sidney B.; Oliver, Steven D.; Kirby, Kyle K.; Wood, Alan G.; Velicky, Lu, Through-wafer interconnects for photoimager and memory wafers.
  45. Akram, Salman; Watkins, Charles M.; Hiatt, William M.; Hembree, David R.; Wark, James M.; Farnworth, Warren M.; Tuttle, Mark E.; Rigg, Sidney B.; Oliver, Steven D.; Kirby, Kyle K.; Wood, Alan G.; Velicky, Lu, Through-wafer interconnects for photoimager and memory wafers.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로