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Process for lift-off of a layer from a substrate 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/30
  • H01L-021/46
출원번호 US-0578896 (2000-05-26)
발명자 / 주소
  • Alexander Yuri Usenko
출원인 / 주소
  • Silicon Wafer Technologies, Inc.
대리인 / 주소
    DeMont & Breyer, L.L.C.
인용정보 피인용 횟수 : 84  인용 특허 : 7

초록

Process for lift-off of a thin layer from a crystalline substrate, preferably the layer from a silicon wafer to further form a silicon-on-insulator (SOI) sandwich structure, wherein a separative interlayer comprises a thin quasi-continuous gaseous layer and said interlayer is obtained by gettering a

대표청구항

1. A process comprising:disordering a first region of a first substrate; diffusing hydrogen into said first region of said first substrate by an electrolytic process; adding a first amount of energy to said first region of said first substrate; and separating at least a part of said first region fro

이 특허에 인용된 특허 (7)

  1. Henley Francois J. ; Cheung Nathan, Controlled cleavage process using pressurized fluid.
  2. Linn Jack H. ; Speece William H. ; Shlepr Michael G. ; Rouse George V., Method for forming a bonded substrate containing a planar intrinsic gettering zone and substrate formed by said method.
  3. Gmitter Thomas J. (Lakewood NJ) Yablonovitch Eli (Middletown NJ), Method for lifting-off epitaxial films.
  4. Matsui Masaki,JPX ; Yamauchi Shoichi,JPX ; Ohshima Hisayoshi,JPX ; Onoda Kunihiro,JPX ; Asai Akiyoshi,JPX ; Sasaya Takanari,JPX ; Enya Takeshi,JPX ; Sakakibara Jun,JPX, Method for manufacturing a semiconductor substrate.
  5. Goesele Ulrich M. ; Tong Q.-Y., Method for the transfer of thin layers of monocrystalline material to a desirable substrate.
  6. Yamagata Kenji (Kawasaki JPX) Yonehara Takao (Atsugi JPX), Method of producing semiconductor substrate.
  7. Bruel Michel (Veurey FRX), Process for the production of thin semiconductor material films.

이 특허를 인용한 특허 (84)

  1. Clark, Jr., William F.; Nowak, Edward J.; Rankin, Jed H.; Tong, Minh H., Active well schemes for SOI technology.
  2. Farrar, Paul A.; Geusic, Joseph E., Aligned buried structures formed by surface transformation of empty spaces in solid state materials.
  3. Farrar, Paul A.; Geusic, Joseph E., Alignment for buried structures formed by surface transformation of empty spaces in solid state materials.
  4. He, Gang; Higashi, Gregg, Continuous feed chemical vapor deposition.
  5. Currie,Matthew T., Control of strain in device layers by prevention of relaxation.
  6. Currie,Matthew T., Control of strain in device layers by selective relaxation.
  7. Fitzgerald,Eugene A., Controlling threading dislocation densities in Ge on Si using graded GeSi layers and planarization.
  8. Ramappa, Deepak; Rodier, Dennis, Dark currents and reducing defects in image sensors and photovoltaic junctions.
  9. Mirth,George P., Electronic device manufacture.
  10. Lochtefeld, Anthony J.; Langdo, Thomas A.; Westhoff, Richard, Elevated source and drain elements for strained-channel heterojuntion field-effect transistors.
  11. Gmitter, Thomas; He, Gang, Epitaxial lift off stack having a multi-layered handle and methods thereof.
  12. Gmitter, Thomas; He, Gang; Hegedus, Andreas, Epitaxial lift off stack having a non-uniform handle and methods thereof.
  13. Gmitter, Thomas; He, Gang; Hegedus, Andreas, Epitaxial lift off stack having a non-uniform handle and methods thereof.
  14. Archer, Melissa; Atwater, Harry; Gmitter, Thomas; He, Gang; Hegedus, Andreas; Higashi, Gregg; Sonnenfeldt, Stewart, Epitaxial lift off stack having a pre-curved handle and methods thereof.
  15. Archer, Melissa; Atwater, Harry; Gmitter, Thomas; He, Gang; Hegedus, Andreas; Higashi, Gregg; Sonnenfeldt, Stewart, Epitaxial lift off stack having a pre-curved handle and methods thereof.
  16. Gmitter, Thomas; He, Gang; Hegedus, Andreas, Epitaxial lift off stack having a unidirectionally shrunk handle and methods thereof.
  17. Archer, Melissa; Atwater, Harry; Gmitter, Thomas; He, Gang; Hegedus, Andreas; Higashi, Gregg; Sonnenfeldt, Stewart, Epitaxial lift off stack having a universally shrunk handle and methods thereof.
  18. Wu,Kenneth C.; Fitzgerald,Eugene A.; Taraschi,Gianni; Borenstein,Jeffrey T., Etch stop layer system.
  19. Hallam, Brett Jason; Edwards, Matthew Bruce; Wenham, Stuart Ross; Hamer, Phillip George; Chan, Catherine Emily; Chong, Chee Mun; Lu, Pei Hsuan; Mai, Ly; Song, Li Hui; Sugianto, Adeline; Wenham, Alison Maree; Xu, Guang Qi, High concentration doping in silicon.
  20. Currie, Matthew T., Hybrid fin field-effect transistor structures and related methods.
  21. Croswell, Robert; Dunn, Gregory, Integration of monocrystalline oxide devices with fully depleted CMOS on non-silicon substrates.
  22. Koo, Hyun Woo; Kim, Ki Hyun; Kim, Sun Ho; Kim, Jeong ho, Manufacturing method of flexible display device.
  23. Archer, Melissa, Mesa etch method and composition for epitaxial lift off.
  24. Henley, Francois J.; Lamm, Albert; Adibi, Babak, Method and structure for thick layer transfer using a linear accelerator.
  25. Usenko,Alexander Yuri, Method for forming a fragile layer inside of a single crystalline substrate preferably for making silicon-on-insulator wafers.
  26. Kub, Francis J.; Hobart, Karl D., Method for making pyroelectric, electro-optical and decoupling capacitors using thin film transfer and hydrogen ion splitting techniques.
  27. Endo,Akihiko; Kusaba,Tatsumi, Method for manufacturing bonded substrate and bonded substrate manufactured by the method.
  28. Akiyama, Shoji; Kubota, Yoshihiro; Ito, Atsuo; Kawai, Makoto; Tanaka, Kouichi; Tobisaka, Yuji; Nojima, Yoshihiro, Method for producing silicon film-transferred insulator wafer.
  29. Farrar, Paul A.; Geusic, Joseph E., Method of alignment for buried structures formed by surface transformation of empty spaces in solid state materials.
  30. Farrar, Paul A.; Geusic, Joseph E., Method of alignment for buried structures formed by surface transformation of empty spaces in solid state materials.
  31. Fitzgerald, Eugene A.; Gerrish, Nicole, Method of fabricating CMOS inverter and integrated circuits utilizing strained surface channel MOSFETS.
  32. Akatsu, Takeshi; Rayssac, Olivier, Method of fabricating a release substrate.
  33. Rayssac, Olivier; Rayssac, legal representative, Pierre; Rayssac, legal representative, Gisèle; Akatsu, Takeshi, Method of fabricating a release substrate.
  34. Cheng,Zhiyuan; Fitzgerald,Eugene A.; Antoniadis,Dimitri A., Method of fabricating a semiconductor structure that includes transferring one or more material layers to a substrate and smoothing an exposed surface of at least one of the material layers.
  35. Washington, Lori D.; Bour, David P.; Higashi, Gregg; He, Gang, Method of high growth rate deposition for group III/V materials.
  36. Carr, William; Usenko, Alexander, Method of manufacture of a multi-layered substrate with a thin single crystalline layer and a versatile sacrificial layer.
  37. Bruel, Michel, Method of producing a plate-shaped structure, in particular, from silicon, use of said method and plate-shaped structure thus produced, in particular from silicon.
  38. Ulyashin, Alexander; Usenko, Alexander, Method of producing a thin layer of crystalline material.
  39. Nastasi,Michael A.; Shao,Lin; Theodore,N. David, Method of transferring a thin crystalline semiconductor layer.
  40. Nastasi, Michael A.; Shao, Lin, Method of transferring strained semiconductor structure.
  41. He, Gang; Higashi, Gregg; Sorabji, Khurshed; Hamamjy, Roger; Hegedus, Andreas; Archer, Melissa; Atwater, Harry; Sonnenfeldt, Stewart, Methods and apparatus for a chemical vapor deposition reactor.
  42. Fitzgerald,Eugene; Currie,Matthew, Methods for fabricating strained layers on semiconductor substrates.
  43. Langdo, Thomas A.; Currie, Matthew T.; Hammond, Richard; Lochtefeld, Anthony J.; Fitzgerald, Eugene A., Methods for forming III-V semiconductor device structures.
  44. Langdo, Thomas A.; Currie, Matthew T.; Hammond, Richard; Lochtefeld, Anthony J.; Fitzgerald, Eugene A., Methods for forming strained-semiconductor-on-insulator device structures by mechanically inducing strain.
  45. Langdo,Thomas A.; Currie,Matthew T.; Hammond,Richard; Lochtefeld,Anthony J.; Fitzgerald,Eugene A., Methods for forming strained-semiconductor-on-insulator device structures by use of cleave planes.
  46. Lee,Tien Hsi, Methods for transferring a layer onto a substrate.
  47. Fitzgerald, Eugene A., Methods of fabricating contact regions for FET incorporating SiGe.
  48. Langdo,Thomas A.; Lochtefeld,Anthony J., Methods of fabricating semiconductor structures having epitaxially grown source and drain elements.
  49. Langdo,Thomas A.; Lochtefeld,Anthony J., Methods of fabricating semiconductor structures having epitaxially grown source and drain elements.
  50. Currie,Matthew T., Methods of forming hybrid fin field-effect transistor structures.
  51. Currie,Matthew T.; Hammond,Richard, Methods of forming reacted conductive gate electrodes.
  52. Langdo, Thomas A.; Currie, Matthew T.; Hammond, Richard; Lochtefeld, Anthony J.; Fitzgerald, Eugene A., Methods of forming strained-semiconductor-on-insulator device structures.
  53. Lochtefeld,Anthony J.; Langdo,Thomas A.; Hammond,Richard; Currie,Matthew T.; Braithwaite,Glyn; Fitzgerald,Eugene A., Methods of forming strained-semiconductor-on-insulator finFET device structures.
  54. Bruel, Michel; Aspar, Bernard; Lagahe-Blanchard, Chrystelle, Methods of making substrate structures having a weakened intermediate layer.
  55. He, Gang; Hegedus, Andreas, Multiple stack deposition for epitaxial lift off.
  56. Ramappa, Deepak; Blake, Julian G., Pressurized treatment of substrates to enhance cleaving process.
  57. Usenko,Alexander, Process for forming a fragile layer inside of a single crystalline substrate.
  58. Cheng, Zhi-Yuan; Fitzgerald, Eugene A.; Antoniadis, Dimitri A.; Hoyt, Judy L., Process for producing semiconductor article using graded epitaxial growth.
  59. Currie, Matthew T.; Hammond, Richard, Reacted conductive gate electrodes.
  60. Fitzgerald,Eugene A., Relaxed SiGe platform for high speed CMOS electronics and high speed analog circuits.
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  69. Fathimulla, Mohammed A.; Keyser, Thomas, Silicon-on-insulator wafer for RF integrated circuit.
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  72. Fitzgerald,Eugene A.; Pitera,Arthur J., Strained gettering layers for semiconductor processes.
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  75. Langdo,Thomas A.; Currie,Matthew T.; Hammond,Richard; Lochtefeld,Anthony J.; Fitzgerald,Eugene A., Strained-semiconductor-on-insulator device structures with elevated source/drain regions.
  76. Langdo,Thomas A.; Currie,Matthew T.; Braithwaite,Glyn; Hammond,Richard; Lochtefeld,Anthony J.; Fitzgerald,Eugene A., Strained-semiconductor-on-insulator finFET device structures.
  77. Staple, Bevan; Buriak, Jillian, Surfactant-enhanced protection of micromechanical components from galvanic degradation.
  78. Staple,Bevan; Buriak,Jillian, Surfactant-enhanced protection of micromechanical components from galvanic degradation.
  79. Droes,Steven R.; Takafuji,Yutaka, System and method for hydrogen exfoliation gettering.
  80. Gmitter, Thomas; He, Gang; Archer, Melissa; Hegedus, Andreas, Tape-based epitaxial lift off apparatuses and methods.
  81. Gmitter, Thomas; He, Gang; Archer, Melissa; Hegedus, Andreas, Tape-based epitaxial lift off apparatuses and methods.
  82. He, Gang; Hegedus, Andreas, Tiled substrates for deposition and epitaxial lift off processes.
  83. Bower, Robert W., Transposed split of ion cut materials.
  84. Jeon, Kyung Yub; Kwon, Tae Yong; Kwon, Oh Seong; Jeong, Soo Yeon; Park, Yong Hee; Yoo, Jong Ryeol, Vertical tunneling field effect transistor and method for manufacturing the same.
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