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Thermal resonance imaging method 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-025/72
출원번호 US-0568052 (2000-05-10)
발명자 / 주소
  • Harry I. Ringermacher
  • Donald R. Howard
출원인 / 주소
  • General Electric Company
대리인 / 주소
    Nixon & Vanderhye PC
인용정보 피인용 횟수 : 22  인용 특허 : 13

초록

In an infrared (IR) transient thermography system a sequence of image frames is acquired from an IR sensitive focal-plane array camera. Each sequentially acquired image frame is made up of an array of pixels and has assigned a frame-number that corresponds to elapsed time. Temperature-versus-time (T

대표청구항

1. A method for determining a thickness of an object having a surface which can be visualized as an array of pixels, comprising the steps of:a) rapidly heating the surface of an object; b) recording pixel intensity in a sequence of IR images, each image having an assigned sequential frame-number rel

이 특허에 인용된 특허 (13)

  1. Osanai Takahito (Tokyo JPX), Apparatus and method for diagnosing deterioration of smokestack.
  2. Lebeau Christopher J. (Tempe AZ) Ogden Paul A. (Phoenix AZ) Wang Shay-Ping T. (Tempe AZ), Bond inspection technique for a semiconductor chip.
  3. Annigeri Balkrishna S. (Manchester CT) Favrow Leroy H. (Newington CT) Haas Robert J. (Coventry CT) Winter Michael (New Haven CT) Holland ; Jr. Ronald I. (East Hampton CT) Wegge Jason S. (Springfield , Crack monitoring apparatus.
  4. Lesniak Jon R. (Madison WI), Differential temperature stress measurement employing array sensor with local offset.
  5. Shepard Steven M. (Southfield MI), Method and apparatus for enhancing thermal wave imaging of reflective low-emissivity solids.
  6. Nakata Shuji (7-17 ; Honmachi 5-Chome Toyonaka-Shi ; Osaka-Fu JPX) Nakamura Minoru (Osaka JPX) Sakai Takeo (Kawagoe JPX) Shimizu Yoshimasa (Kawagoe JPX) Kondo Yoshihiro (Kawagoe JPX), Method and device for checking joint of electronic component.
  7. Adams Mark J. (Kennesaw GA) Crisman ; Jr. Elton M. (St. Cloud FL), Method of and apparatus for thermographic evaluation of spot welds.
  8. Shepard Steven M. (23656 Hunter\s La. Southfield MI 48034), Method of interpreting thermographic data for non-destructive evaluation.
  9. Ringermacher Harry I. ; Archacki ; Jr. Raymond J. ; Veronesi William A., Nondestructive testing: transient depth thermography.
  10. Cox ; Jr. Eldon E. (Lowell MA) Rolla Michael P. (Maynard MA), Product defect detection using thermal ratio analysis.
  11. Lesniak Jon R. (Madison WI), Structure analysis method using time-varying thermal signal.
  12. Chang David B. (Tustin CA) Berg Michael F. (Fruita CA) Drummond James E. (Oceanside CA) Mickelson Lee (Long Beach CA), Thermal technique for simultaneous testing of circuit board solder joints.
  13. Crisman ; Jr. Elton M. (Saint Cloud FL), Thermographic evaluation technique.

이 특허를 인용한 특허 (22)

  1. Eren, Gonen; Ercil, Aytul; Sanchez, Luis A.; Aubreton, Olivier; Fofi, David; Meriaudeau, Fabrice; Truchetet, Frederic, 3D scanner.
  2. Key, Douglas E., Apparatus and method for analyzing relative outward flow characterizations of fabricated features.
  3. Key,Douglas E.; Easton,Beau, Apparatus and method for analyzing relative outward flow characterizations of fabricated features.
  4. Brinz, Thomas; Lewis, Jane; Tiefenbacher, Markus; Geiger, Thomas; Burk, Tobias, Automatic detection of coating flaws.
  5. Ringermacher, Harry Israel; Howard, Donald Robert; Knight, Bryon Edward; Patterson, William George; Bantel, Thomas Edward, Characterization of flaws in composites identified by thermography.
  6. Brummel,Hans Gerd, Infrared-based method and apparatus for online detection of cracks in steam turbine components.
  7. Goldammer, Matthias; Heinrich, Werner, Method and apparatus for determining component parameters by means of thermography.
  8. Zombo, Paul J.; Lemieux, Dennis; Diatzikis, Evangelos, Method and apparatus for measuring on-line failure of turbine thermal barrier coatings.
  9. Tralshawala, Nilesh; Howard, Donald Robert; Ringermacher, Harry Israel; Knight, Bryon Edward, Method and apparatus for thermographic nondestructive evaluation of an object.
  10. Dehais, Christophe; Mammou, Khaled; Choukroun, Ariel; Le Gallou, Sylvain, Method for producing photorealistic 3D models of glasses lens.
  11. Srinivasan, Venugopal; Nelson, Dan; Ramaswamy, Arun, Methods and apparatus for embedding and recovering an image for use with video content.
  12. Srinivasan, Venugopal; Nelson, Dan; Ramaswamy, Arun, Methods and apparatus for embedding and recovering an image for use with video content.
  13. Koshti, Ajay M., Methods and systems for characterization of an anomaly using infrared flash thermography.
  14. Koshti, Ajay M., Methods and systems for measurement and estimation of normalized contrast in infrared thermography.
  15. Koshti, Ajay M., Methods and systems for measurement and estimation of normalized contrast in infrared thermography.
  16. Zalameda, Joseph N.; Winfree, William P., Synchronized electronic shutter system and method for thermal nondestructive evaluation.
  17. Knight, Bryon Edward; Howard, Donald Robert; Ringermacher, Harry Israel, System and method for thermographic inspection.
  18. Ringermacher, Harry Israel; Howard, Donald Robert; Knight, Bryon Edward; Plotnikov, Yury Alexeyevich; Osterlitz, Mark John; Li, Jian; Thompson, Jeffry Lynn; Aksel, Gulperi Nuzhet, Systems and method for locating failure events in samples under load.
  19. McMillan, Alison J., Test apparatus and method.
  20. Sun, Jiangang; Deemer, Chris, Thermal imaging measurement of lateral diffusivity and non-invasive material defect detection.
  21. Ouyang,Zhong; Smith,Kevin D., Thermal imaging method and apparatus.
  22. Ringermacher, Harry Israel; Howard, Donald Robert; Knight, Bryon Edward, Thermal imaging method and apparatus for evaluating coatings.
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