$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Synthetic reference thermal imaging method 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-025/72
출원번호 US-0568053 (2000-05-10)
발명자 / 주소
  • Harry I. Ringermacher
  • Donald R. Howard
출원인 / 주소
  • General Electric Company
대리인 / 주소
    Nixon & Vanderhye PC
인용정보 피인용 횟수 : 24  인용 특허 : 12

초록

In an infrared (IR) transient thermography system a sequence of image frames is acquired from an IR sensitive focal-plane array camera. Each sequentially acquired image frame is made up of an array of pixels and has assigned a frame number that corresponds to elapsed time. A method of analyzing ther

대표청구항

1. In an infrared (IR) transient thermography system wherein a sequence of image frames is acquired from an IR sensitive camera, each sequentially acquired image frame comprising an array of pixels and having assigned a frame number that corresponds to elapsed time, a method of analyzing thermal ima

이 특허에 인용된 특허 (12)

  1. Osanai Takahito (Tokyo JPX), Apparatus and method for diagnosing deterioration of smokestack.
  2. Lebeau Christopher J. (Tempe AZ) Ogden Paul A. (Phoenix AZ) Wang Shay-Ping T. (Tempe AZ), Bond inspection technique for a semiconductor chip.
  3. Annigeri Balkrishna S. (Manchester CT) Favrow Leroy H. (Newington CT) Haas Robert J. (Coventry CT) Winter Michael (New Haven CT) Holland ; Jr. Ronald I. (East Hampton CT) Wegge Jason S. (Springfield , Crack monitoring apparatus.
  4. Shepard Steven M. (Southfield MI), Method and apparatus for enhancing thermal wave imaging of reflective low-emissivity solids.
  5. Nakata Shuji (7-17 ; Honmachi 5-Chome Toyonaka-Shi ; Osaka-Fu JPX) Nakamura Minoru (Osaka JPX) Sakai Takeo (Kawagoe JPX) Shimizu Yoshimasa (Kawagoe JPX) Kondo Yoshihiro (Kawagoe JPX), Method and device for checking joint of electronic component.
  6. Adams Mark J. (Kennesaw GA) Crisman ; Jr. Elton M. (St. Cloud FL), Method of and apparatus for thermographic evaluation of spot welds.
  7. Shepard Steven M. (23656 Hunter\s La. Southfield MI 48034), Method of interpreting thermographic data for non-destructive evaluation.
  8. Ringermacher Harry I. ; Archacki ; Jr. Raymond J. ; Veronesi William A., Nondestructive testing: transient depth thermography.
  9. Cox ; Jr. Eldon E. (Lowell MA) Rolla Michael P. (Maynard MA), Product defect detection using thermal ratio analysis.
  10. Lesniak Jon R. (Madison WI), Structure analysis method using time-varying thermal signal.
  11. Chang David B. (Tustin CA) Berg Michael F. (Fruita CA) Drummond James E. (Oceanside CA) Mickelson Lee (Long Beach CA), Thermal technique for simultaneous testing of circuit board solder joints.
  12. Crisman ; Jr. Elton M. (Saint Cloud FL), Thermographic evaluation technique.

이 특허를 인용한 특허 (24)

  1. Rothenfusser, Max; Shannon, Robert E.; Goldammer, Matthias; Homma, Christian, Advanced processing of active thermography signals.
  2. Key, Douglas E., Apparatus and method for analyzing relative outward flow characterizations of fabricated features.
  3. Key,Douglas E.; Easton,Beau, Apparatus and method for analyzing relative outward flow characterizations of fabricated features.
  4. Strandemar, Katrin; Jönsson, Henrik; Hamrelius, Torbjörn; Palm, Gunnar, Apparatus and method to calculate energy dissipated from an object.
  5. Strandemar, Katrin; Jönsson, Henrik; Hamrelius, Torbjörn; Palm, Gunnar, Apparatus and method to calculate energy dissipated from an object.
  6. Brinz, Thomas; Lewis, Jane; Tiefenbacher, Markus; Geiger, Thomas; Burk, Tobias, Automatic detection of coating flaws.
  7. Young,Alan, Calibration system and method to correct distortion of thermal images from in-line and rotary thermoforming machines.
  8. Ringermacher, Harry Israel; Howard, Donald Robert; Knight, Bryon Edward; Patterson, William George; Bantel, Thomas Edward, Characterization of flaws in composites identified by thermography.
  9. Gustavsson, Jonas Patrik Richard; Badami, Vivek Venugopal; Tralshawala, Nilesh; Estevadeordal, Jordi, Hyperspectral imaging system for pyrometry applications and method of operating the same.
  10. Strandemar, Katrin; Jönsson, Henrik; Hamrelius, Torbjörn; Palm, Gunnar, Infrared camera and method for calculating output power value indicative of an amount of energy dissipated in an image view.
  11. Howard, Donald Robert; Ringermacher, Harry Israel; Faidi, Waseem Ibrahim; Knight, Bryon Edward, Lamp assembly for a thermographic nondestructive evaluation system.
  12. Goldammer, Matthias; Heinrich, Werner, Method and apparatus for determining component parameters by means of thermography.
  13. Harding,Kevin George; Rebello,Alexander Bernard Flavian; Howard,Donald Robert, Method and apparatus for internal feature reconstruction.
  14. Tralshawala, Nilesh; Howard, Donald Robert; Ringermacher, Harry Israel; Knight, Bryon Edward, Method and apparatus for thermographic nondestructive evaluation of an object.
  15. Rothenfusser,Max; Homma,Christian; Zombo,Paul John; Vona,Paul D.; Shannon,Robert E., Method for calibrating and enhancing flaw detection of an acoustic thermography system.
  16. Sun,Jiangang, Method for thermal tomography of thermal effusivity from pulsed thermal imaging.
  17. Lorraine, Peter William; Howard, Donald Robert; Ringermacher, Harry Israel; Dubois, Marc; Drake, Thomas E., Non-destructive inspection using laser-ultrasound and infrared thermography.
  18. Zalameda, Joseph N.; Winfree, William P., Synchronized electronic shutter system and method for thermal nondestructive evaluation.
  19. Knight, Bryon Edward; Howard, Donald Robert; Ringermacher, Harry Israel, System and method for thermographic inspection.
  20. Ringermacher, Harry Israel; Howard, Donald Robert; Knight, Bryon Edward; Plotnikov, Yury Alexeyevich; Osterlitz, Mark John; Li, Jian; Thompson, Jeffry Lynn; Aksel, Gulperi Nuzhet, Systems and method for locating failure events in samples under load.
  21. Shepard, Steven M., Temporal noise reduction, compression and analysis of thermographic image data sequences.
  22. Sun, Jiangang; Deemer, Chris, Thermal imaging measurement of lateral diffusivity and non-invasive material defect detection.
  23. Ringermacher, Harry Israel; Howard, Donald Robert; Knight, Bryon Edward, Thermal imaging method and apparatus for evaluating coatings.
  24. Foes, Scott; Yazdi, Hamid, Transient defect detection algorithm.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로