$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Semiconductor wafer cleaning system 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B08B-003/08
  • B08B-003/12
  • C23G-001/02
출원번호 US-0694938 (2000-10-23)
발명자 / 주소
  • Michael B. Olesen
  • Mario E. Bran
출원인 / 주소
  • Verteq, Inc.
대리인 / 주소
    Knobbe, Martens, Olson & Bear, LLP
인용정보 피인용 횟수 : 21  인용 특허 : 35

초록

Semiconductor wafers are positioned in a cleaning tank and subjected to sequential flows of one or more highly diluted cleaning solutions that are injected into the lower end of the tank and allowed to overflow at the upper end. One solution has one part ammonium hydroxide, two parts hydrogen peroxi

대표청구항

1. A method of cleaning a semiconductor substrate comprising the steps of:positioning one or more substrates in a tank with flat sides of the substrates extending generally upwardly; introducing a highly diluted cleaning solution into the tank; quickly dumping the solution from the tank; introducing

이 특허에 인용된 특허 (35)

  1. Nishizawa Hisao (Shiga JPX) Nomura Yoshio (Shiga JPX) Araki Hiroyuki (Shiga JPX), Apparatus and system for treating surface of a wafer by dipping the same in a treatment solution and a gate device for c.
  2. Basso James E. (Hopewell Junction NY) Bhalla Parmesh K. (Pleasant Valley NY) Chahine John J. (Poughkeepsie NY) Diddell Daro (San Diego CA) Earle Gregory J. (Wallkill NY) Gabriel Edward P. (Newburgh N, Apparatus for cleaning and drying workpieces.
  3. Vetter William L. (American Fork UT) Mortensen Dennis L. (Sandy UT), Apparatus for cleaning and rinsing wafers.
  4. Coberly Robert A. (8006 Thoroughbred St. Alta Loma CA 91701) Beck Mark J. (Cucamonga CA) Azlin Dan S. (Brea CA) Gifford Karl J. (Nashville TN), Apparatus for cleaning, rinsing and drying substrates.
  5. McConnell Christopher F. (West Chester PA) Walter Alan E. (Exton PA), Apparatus for rinsing and drying surfaces.
  6. McConnell Christopher F. (Gulph Mills PA) Walter Alan E. (Exton PA), Apparatus for treating semiconductor wafers.
  7. McConnell Christopher F. (Gulph Mills PA) Walter Alan E. (Exton PA), Apparatus for treating wafers with process fluids.
  8. Takeyama Kokichi (Kanagawa JPX) Sugawara Kiyoshi (Kanagawa JPX) Fukagawa Yasuyuki (Kanagawa JPX), Automatic paper feeder for reproducing machine.
  9. Pedziwiatr Edward A. (50 Glenview Ter. Cresskill NJ 07626), Automatic ultrasonic cleaning apparatus.
  10. Nishi Mitsuo (Kurume JPX), Cleaning apparatus.
  11. Sugihara Yasuo (Tokyo JPX) Tanaka Kazushige (Tokyo JPX) Kawakami Michiya (Tokyo JPX), Cleaning solution of semiconductor substrate.
  12. Young Jack H. (Crawford PA) Karle David A. (Erie PA) Halleck Frank E. (Erie PA), Combined ultrasonic cleaning and biocidal treatment in a single pressure vessel.
  13. Moxness Sherman U. (Golden Valley MN) Grant Robert W. (Excelsior MN), High frequency sonic substrate processing module.
  14. Mase Yasukazu (Fujisawa JPX) Hirata Osamu (Kawasaki JPX) Abe Masahiro (Yokohama JPX), Method and apparatus for cleaning semiconductor devices.
  15. Morita Toyoo (Uozu JPX), Method and apparatus for cutting a chain of elongate products.
  16. Koleilat Bashir M. ; Cain David E., Method and apparatus for sealing between casing and wellhead connector structure.
  17. McConnell Christopher F. (Gulph Mills PA) Walter Alan E. (Exton PA), Method and system for fluid treatment of semiconductor wafers.
  18. Kuo So Wein,TWX ; Shih Tsu,TWX ; Chang Chung-Long,TWX, Method for CMP cleaning improvement.
  19. Jain Kailash C. (Sterling Heights MI) MacIver Bernard A. (Lathrup Village MI), Method for patterning silicon dioxide with high resolution in three dimensions.
  20. McConnell Christopher F. (Two Soldiers Field Park Boston MA 02163), Method of treating wafers with fluid.
  21. Stanford ; Jr. Thomas B. (San Pedro CA) Chao Sidney C. (Manhattan Beach CA), Method using megasonic energy in liquefied gases.
  22. Malik Farid A. (Beaverton OR), Post-polish cleaning of oxidized substrates by reverse colloidation.
  23. McConnell Christopher F. (Gulph Mills PA) Walter Alan E. (Exton PA), Process and apparatus for treating wafers with process fluids.
  24. Huynh Cuc Kim ; Rutten Matthew Jeremy ; Cohen Susan L. ; Nadeau Douglas Paul ; Jurjevic Robert Albin ; Gilhooly James Albert, Process for removing residue from a semiconductor wafer after chemical-mechanical polishing.
  25. Blackwell, Robert E., Removing slurry residue from semiconductor wafer planarization.
  26. Chen Chao-Yang (Taipei TWX), Room temperature wafer cleaning process.
  27. Olesen Michael B. ; Bran Mario E., Semiconductor wafer cleaning method.
  28. Olesen Michael B. (Yorba Linda CA) Bran Mario E. (Garden Grove CA), Semiconductor wafer cleaning system.
  29. Olesen Michael B. ; Bran Mario E., Semiconductor wafer cleaning system.
  30. Olesen Michael B. ; Bran Mario E., Semiconductor wafer cleaning system.
  31. Bran Mario E. (Garden Grove CA), Single chamber megasonic energy cleaner.
  32. Bran Mario E. (Garden Grove CA), Single wafer megasonic semiconductor wafer processing system.
  33. Fox Joseph R. (Solon OH) White Douglas A. (Cleveland Heights OH), VLS Fiber growth process.
  34. McConnell Christopher F. (978 S. Gulph Rd. Gulph Mills PA 19406), Vessel and system for treating wafers with fluids.
  35. McConnell Christopher F. (Gulph Mills PA), Vessel and system for treating wafers with fluids.

이 특허를 인용한 특허 (21)

  1. Fani, Pejman; Rouillard, Mark; Korbler, John; Brown, James; Hosack, Chad, Acoustic energy system, method and apparatus for processing flat articles.
  2. Fani, Pejman; Rouillard, Mark; Korbler, John; Brown, James; Hosack, Chad, Acoustic energy system, method and apparatus for processing flat articles.
  3. Hahn, Christopher; Lee, Hanjoo, Apparatus for ejecting fluid onto a substrate and system and method incorporating the same.
  4. Korbler, John A.; Novak, Richard, Composite transducer apparatus and system for processing a substrate and method of constructing the same.
  5. Korbler, John A.; Novak, Richard, Composite transducer apparatus and system for processing a substrate and method of constructing the same.
  6. Schenkl, Manfred; Pesce, Robert; Oshinowo, John; Muller, Uwe, Device and method for the treatment of semiconductor wafers.
  7. Brown, Ian J.; Printz, Wallace P., Method and system of process chemical temperature control using an injection nozzle.
  8. Bran, Mario E., Method for megasonic processing of an article.
  9. Pejman, Fani; Rouillard, Mark; Korbler, John; Brown, James; Hosack, Chad, Method for processing flat articles.
  10. Tsuga, Toshihito; Fube, Minoru; Nakayama, Kazutaka, Method for removing particles on semiconductor wafers.
  11. Le Tiec, Yannick; Grenouillet, Laurent; Vinet, Maud; Wacquez, Romain, Method for treating the surface of a silicon substrate.
  12. Bran, Mario E., Method of manufacturing integrated circuit devices.
  13. Puri, Suraj; Medeiros, Jr., Joseph; Becker, David Scott; Narayanswami, Natraj, Methods for cleaning microelectronic substrates using ultradilute cleaning liquids.
  14. Kam Beng Chong SG; Chin Choon Khee SG; Chua Kien Heng SG; Teh Guai Cheng SG, State of the art constant flow device.
  15. Ravkin, Michael; deLarios, John; Nickhou, Afshin; Mikhaylichenko, Katrina; Garcia, James P., Substrate processing using a fluid re-circulation system in a wafer scrubbing system.
  16. Bran, Mario E., System for megasonic processing of an article.
  17. Puri, Suraj, Systems and methods for charging a cleaning solution used for cleaning integrated circuit substrates.
  18. Puri, Suraj, Systems and methods for charging a cleaning solution used for cleaning integrated circuit substrates.
  19. Puri, Suraj, Systems and methods for single integrated substrate cleaning and rinsing.
  20. Puri, Suraj, Systems and methods for single integrated substrate cleaning and rinsing.
  21. Arndt, Russell H.; Hilscher, David F., Tool for manufacturing semiconductor structures and method of use.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로