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Automatic manufacturing monitoring and tracking

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06F-019/00
출원번호 US-0184495 (1998-11-02)
발명자 / 주소
  • Brian M. Thiel
  • Guy E. Schalnat
  • Marilyn K. MacDonald
  • Gary E. Kleeman
출원인 / 주소
  • Mattec, Inc.
대리인 / 주소
    Wood, Herron & Evans, L.L.P.
인용정보 피인용 횟수 : 38  인용 특허 : 13

초록

A computerized system for tracking the activities of a manufacturing system. Identifiers for parts, subassemblies or assemblies produced or used by the manufacturing system are generated and stored by a data processing system. The data processing system performs multi-level tracking of the manufactu

대표청구항

1. A computerized system for tracking the activities of a manufacturing system, the manufacturing system performing a manufacturing process in which an assembly is assembled from parts or subassemblies, at least some of said parts or subassemblies being assembled into a subassembly in a first manufa

이 특허에 인용된 특허 (13)

  1. Kenik Frank W. (Wadsworth IL) Jensen Ronald J. (Libertyville IL) Bayer James J. (Kenosha WI) Allgeyer David F. (Antioch IL) McCarthy Richard R. (Antioch IL) Miceli Thomas A. (Zion IL), Apparatus and method for parts assembly.
  2. Street William L. ; Fruncek John G., Apparatus for use in parts assembly.
  3. Nissen Lanny ; Saeki Takehiko, Assembly prompting system.
  4. Kobayashi Mamoru (Hadano JPX) Sasaki Hideaki (Hadano JPX) Kato Kazuo (Yamato JPX) Kojima Akio (Hadano JPX) Ninomiya Sigeru (Tokyo JPX) Tsuji Yoshihisa (Hadano JPX), Computer-integrated manufacturing system and method.
  5. Beauchesne Robert C., Database manufacturing process management system.
  6. Bennett James S. (Palo Alto CA) Lark Jay S. (Palo Alto CA), Hierarchical knowledge system.
  7. Nagaoka Masao (Suzuka JPX), Manufacturing history management system.
  8. Teramoto Junichi,JPX ; Seikai Hiroshi,JPX ; Akiyoshi Nobuyasu,JPX ; Sato Susumu,JPX, Method of managing information exchanged between production information supervisory computer and line supervisory comput.
  9. Ahmed Belal (Bridgeport CT) Eisner Andrew (Stamford CT) Foodman Harold (Norwalk CT) Hartley G. Cecil (Seffner FL) Hartley Michael (Seffner FL) Marsh Robert (Brandon FL), Process control and data collection system.
  10. Imai Shinji (Sayama JPX) Hamano Hiroshi (Sayama JPX) Fujinuma Michio (Sayama JPX) Shimanaka Chikafumi (Sayama JPX) Urushidani Shinzo (Sayama JPX), Production management system and method of transmitting data.
  11. Cipelletti Marco (Pavia ITX) Pasti Orlando (Pavia ITX), Recording system for a production line.
  12. Fuduka Etsuo (Tokyo JPX) Tazawa Masayoshi (Tokyo JPX) Miura Kazuyki (Tokyo JPX) Takano Tomiko (Tokyo JPX) Satoguchi Yuichi (Tokyo JPX) Ozaki Yuichiro (Tokyo JPX), System for automatically producing different semiconductor products in different quantities through a plurality of proce.
  13. Crowley H. W., System for incorporation of post-production operations to a web output from an image transfer device.

이 특허를 인용한 특허 (38)

  1. Nguyen, Tri Minh, Apparatus and method for monitoring manufacturing status.
  2. De Martin, Lino, Autonomous device employed in a system for facilitating the assembly of a product.
  3. Kaneko, Tomohiro; Matsumoto, Takeshi, Coating and developing apparatus, coating and developing method, and storage medium.
  4. Senesac, Christopher J.; Kasik, David Joseph, Condition of assembly visualization system based on build cycles.
  5. Schaaf, Joachim; Schovenberg, Wolfgang, Data processing system and device for implementing cohesive, decentralized and dynamic management of a technical process.
  6. Jacobson, Neil G.; Flores, Jr., Emigdio M.; Srivastava, Sanjay; Dai, Bin; Mao, Sungnien Jerry; Chow, Rosa M. Y.; Tawade, Pushpasheel, Identification of multi-device systems.
  7. Hanses, Philip C.; Drago, Michael A., Intelligent assembly system and method of use.
  8. Jacobson, Neil G.; Flores, Jr., Emigdio M.; Srivastava, Sanjay; Dai, Bin; Mao, Sungnien Jerry; Chow, Rosa M. Y.; Tawade, Pushpasheel, Management of configuration data by generating a chain description data set that specifies an order of configuration chain for multi-device systems.
  9. Zeif,Alex G., Method and apparatus for sequentially collecting and analyzing real time data with interactive monitoring.
  10. Durrant,Douglas J.; Aldridge,Bruce E.; Gough,Ross E., Method and system for identifying manufacturing anomalies in a manufacturing system.
  11. Erickson, Steven C.; Knipfer, Ivory Wellman; Strong, Robert Noble; Zemke, Matthew H., Method for associating objects in a manufacturing process.
  12. Remtulla, Shain; Joseph, Elias Simon; Tai, Edmund, Method for coupling quality control data of a subassembly of components to a main product assembly.
  13. Collins, Dave Roy; Wendland, Steve, Method for error proofing body shop component selection.
  14. Clayman, Henry, Method for manufacturing multi-piece article using RFID tags.
  15. Kohl,Gerhard; Spreiter,Quirin, Method for producing an item list.
  16. Nakata, Tomohiro; Fujiwara, Takayuki, Method of and apparatus for manufacturing rolled medium products.
  17. Nakata,Tomohiro; Fujiwara,Takayuki, Method of and apparatus for manufacturing webs around cores using length and diameter data of cores.
  18. Meaney, Roy; Brisky, Philip; Hoxworth, Eric; Tallieu, Joseph, Method of manufacturing an information handling system.
  19. Meaney, Roy; Brisky, Philip; Hoxworth, Eric; Tallieu, Joseph, Method of manufacturing an information handling system.
  20. Meaney, Roy; Brisky, Philip; Hoxworth, Eric; Tallieu, Joseph, Method of manufacturing an information handling system.
  21. Meaney,Roy; Brisky,Philip; Hoxworth,Eric; Tallieu,Joseph, Method of manufacturing an item of build-to-order equipment.
  22. Durrant, Douglas J.; Hill, Gerald L.; Perez, Linda S., Method using statistically analyzed product test data to control component manufacturing process.
  23. Senesac, Christopher J., Methods and devices for visually querying an aircraft based on an area of an image.
  24. DeBusk, Brian C.; Shanks, Mark W.; Cofer, Michael C.; Lukens, W. Francis, Modular tracking and profiling system.
  25. Konar, Periyathiruvadi Gurunathan, Monitoring system for monitoring processing equipment.
  26. Boraas, Michael A.; Cai, Biao; Komatsu, Jeffrey G.; Maresca, John S., Multiple layer manufacturing line rejection management system.
  27. Senesac, Christopher J., Nonconformance visualization system.
  28. Robey, Joshua, Printout bin job identification and display.
  29. Sasko, David A.; Pennington, Terry W.; Mann, George; Hranica, James A., Process control system with ability to exchange data with production line machine controllers.
  30. Sanada, Mutsurou; Ode, Yoshiyuki, Production management system.
  31. Fago, Frank M.; Bantly, Matt; Wilson, David W., Radiopharmaceutical pig.
  32. Fago, Frank M.; Wilson, David W.; Bantly, Matt, Radiopharmaceutical pig.
  33. Fago,Frank M.; Bantly,Matt; Wilson,David W., Radiopharmaceutical pig.
  34. Senesac, Christopher J., Shop order status visualization system.
  35. Senesac, Christopher J.; Nelson, Bruce L.; Prazak, Nikoli E.; Gass, John Carney, Shop order status visualization system.
  36. Chung,Yung Cheng; Fu,Hsieh Shyh, System and method for correcting material and data mismatch in an automated manufacturing environment.
  37. Siegers, Johan; Haanstra, Kornelius; Zinger, Jan, System and method for fingerprinting of semiconductor processing tools.
  38. Holden,Randall; Stewart,Brian, System and method for in-line production of insulated glass units for custom windows.
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