Sensor apparatus for transmitting electrical pulses from a signal line into and out of a vessel to measure a process variable-in order to be more informative
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G01D-021/00
G01F-023/22
G01F-023/28
G01S-013/00
G01S-013/02
출원번호
US-0220100
(1998-12-23)
발명자
/ 주소
Donald V. Eason
출원인 / 주소
Endress +Hauser GmbH +Co. DE
대리인 / 주소
Bose McKinney & Evans LLP
인용정보
피인용 횟수 :
11인용 특허 :
30
초록▼
A sensor apparatus (1) designed for industrial applications is provided for transmitting electrical pulses from a signal line (2) into and out of a vessel to measure a process variable, which has a low outer diameter, preferably of 11/2′ or lower, while providing high mechanical stability and mainta
A sensor apparatus (1) designed for industrial applications is provided for transmitting electrical pulses from a signal line (2) into and out of a vessel to measure a process variable, which has a low outer diameter, preferably of 11/2′ or lower, while providing high mechanical stability and maintaining a high degree of transmission efficiency. It comprises a mounting section (3) configured to be coupled to the vessel, at least two concentric at least partially overlapping dielectric inserts (6, 9, 10, 11, 17) stacked inside one another located inside the mounting section (3), the dielectric inserts (6, 9, 10, 11, 17) comprising central apertures, a conductive probe element (4) mounted inside the mounting section (3) and extending through the apertures of the dielectric inserts (6, 9, 10, 11, 17) into the vessel, an electrical connector (5) configured to couple the signal line (2) to the probe element (4), wherein an electric impedance inside the mounting section (3), is nearly constant and approximately equal to the electric impedance of the signal line (2).
대표청구항▼
1. A sensor apparatus (1) for transmitting electrical pulses from a signal line (2) into and out of a vessel to measure a process variable, the sensor apparatus (1) comprising:a mounting section (3) for coupling the sensor apparatus to the vessel, at least two concentric at least partially overlappi
1. A sensor apparatus (1) for transmitting electrical pulses from a signal line (2) into and out of a vessel to measure a process variable, the sensor apparatus (1) comprising:a mounting section (3) for coupling the sensor apparatus to the vessel, at least two concentric at least partially overlapping dielectric inserts (6, 9, 10, 11, 17) stacked inside one another and located inside the mounting section (3), said dielectric inserts (6, 9, 10, 11, 17) comprising central apertures, a conductive probe element (4) mounted inside the mounting section (3) and extending through the apertures of the dielectric inserts (6, 9, 10, 11, 17) into the vessel, an electrical connector (5) configured for coupling the signal line (2) to the probe element (4), wherein an electric impedance inside the mounting section (3), is nearly constant and approximately equal to the electric impedance of the signal line (2), each dielectric insert (6, 9, 10, 11, 17) has one end facing towards the vessel and one end facing away from the vessel, all ends located inside the mounting section (3) have outer and inner surfaces, said surfaces being oriented such that the thickness of the insert decreases towards said ends, and the inner and outer diameters of each dielectric insert inside the mounting section (3) are at least one of constant and change gradually in a direction parallel to a longitudinal axis of the respective dielectric insert (6, 9, 10, 11, 17).
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이 특허에 인용된 특허 (30)
Murphy George W., Apparatus and method for providing leak proof sealing between a metal rod and a plastic housing molded there around.
Lang Hugo (Pfeffingen CHX) Alznauer Miroslaw (Wies DEX), Device for the electrically insulated attachment of a metallic probe electrode in the opening of a housing.
Dalrymple Thomas H. (Crown Point IN) Jean Buford R. (Round Rock TX) Erb Tom L. (Austin TX) Whitehead Frederick L. (Austin TX), Method and apparatus for monitoring a flowable material in a transportable vessel.
Maltby Frederick L. (Jenkintown PA) Loewenstern Kenneth M. (Warminster PA) Benning ; Jr. Jack G. (Lansdale PA), Method of using capacitor probe with a semiconductive electrode.
Ookubo, Norio; Kodama, Noriyuki; Kikuchi, Hiroaki; Naitou, Yuichi, Coaxial probe with cantilever and scanning micro-wave microscope including the same.
Griessbaum, Karl; Fehrenbach, Josef; Motzer, Jurgen, Combination of a feedthrough element for an electric high-frequency signal and a probe, and a level meter metering device including a combination of this type.
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