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Bayesian belief networks for industrial processes 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06N-007/00
출원번호 US-0374438 (1999-08-13)
발명자 / 주소
  • Arlen S. Heger
  • Hrishikesh B. Aradhye
출원인 / 주소
  • University of New Mexico
대리인 / 주소
    Jeffrey D. Myers
인용정보 피인용 횟수 : 66  인용 특허 : 14

초록

A method and an apparatus for diagnosis of sensors and/or processes through use of Bayesian belief networks. More specifically, the method and apparatus of the present invention achieve sensor and/or process fault detection, isolation, and accommodation.

대표청구항 ▼

1. A method for diagnosis of sensors comprising:a) providing at least one sensor-status node wherein each sensor-status node comprises a known probability table; b) providing at least one process-variable node wherein each process-variable node comprises a known probability table; c) providing at le

이 특허에 인용된 특허 (14)

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  7. Scarola Kenneth (Windsor CT) Jamison David S. (Windsor CT) Manazir Richard M. (North Canton CT) Rescorl Robert L. (Vernon CT) Harmon Daryl L. (Enfield CT), Indicator system for advanced nuclear plant control complex.
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  8. Qin S. Joe (Austin TX) Dunia Ricardo H. (Austin TX) Hayes Randall L. (Georgetown TX), Method and apparatus for detecting and identifying faulty sensors in a process.
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  9. Sheppard John W. (Glen Burnie MD) Simpson William R. (Edgewater MD) Graham Jerry L. (Baldwin MD), Method and apparatus for diagnostic testing including a neural network for determining testing sufficiency.
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  10. Saxena Sharad (Richardson TX), Method of diagnosing malfunctions in semiconductor manufacturing equipment.
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  11. Scarola Kenneth ; Jamison David S. ; Manazir Richard M. ; Rescorl Robert L. ; Harmon Daryl L., Method of validating measurement data of a process parameter from a plurality of individual sensor inputs.
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  12. Sztipanovits Janos (Nashville TN) Biegl Csaba (Nashville TN) Karsai Gabor (Nashville TN) Padalkar Samir (Nashville TN) Miyasaka Nobuji (Toyonaka JPX) Okuda Koji (Nishinomiya JPX), Optimization method for adaptive sensor reading scheduling and delayed alarm evaluation in real-time diagnostic systems.
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  14. Gross Kenneth C. (Bolingbrook IL) Hoyer Kristin K. (Chicago IL) Humenik Keith E. (Columbia MD), System for monitoring an industrial process and determining sensor status.
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