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Reactor for processing a semiconductor wafer 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/311
출원번호 US-0437711 (1999-11-10)
발명자 / 주소
  • Steven L. Peace
  • Gary L. Curtis
  • Raymon F. Thompson
  • Brian Aegerter
  • Curt T. Dundas
출원인 / 주소
  • Semitool, Inc.
대리인 / 주소
    Lyon & Lyon LLP
인용정보 피인용 횟수 : 30  인용 특허 : 53

초록

A method for processing a semiconductor wafer or similar article includes the step of spinning the wafer and applying a fluid to a first side of the wafer, while it is spinning. The fluid flows radially outwardly in all directions, over the first side of the wafer, via centrifugal force. As the flui

대표청구항

1. A method for processing a workpiece, comprising the steps of:spinning the workpiece; applying a processing fluid to a first side of the workpiece; allowing the processing fluid to flow outwardly over the first side of the workpiece, via centrifugal force generated by the spinning; collecting the

이 특허에 인용된 특허 (53)

  1. Kottman Rickie A. (Dallas TX) Terrill Robert E. (Carrollton TX) Wise Ann E. (Dallas TX), Apparatus and method for edge cleaning.
  2. Allevato Tony E. (Stafford TX), Apparatus and method of material removal having a fluid filled slot.
  3. Titus Stephen D. (Houston TX), Apparatus and method of material removal with fluid flow within a slot.
  4. Blackwood Robert S. (Chanhassen MN), Apparatus for and method of cleaning and removing static charges from substrates.
  5. Inuta Kazuo (Shiga JPX) Watanabe Akira (Hiroshima JPX), Apparatus for processing wafers and the like.
  6. Mears Eric L. (Rockport MA) Hertel Richard J. (Boxford MA) Brick Robert V. (Gloucester MA) Holt ; Jr. Carl J. (Newburyport MA), Apparatus for retaining wafers.
  7. Mimasaka Masahiro (Kyoto JPX) Hirai Hiroyuki (Kyoto JPX), Apparatus for treating a wafer surface.
  8. Lam Ken (Colorado Springs CO), Bumpless bonding process having multilayer metallization.
  9. Thompson Raymon F. (Lakeside MT) Owczarz Aleksander (Kalispell MT), Centrifugal wafer carrier cleaning apparatus.
  10. Doan Trung T., Chemical dispensing system for semiconductor wafer processing.
  11. Akimoto Masami (Kumamoto JPX), Cleaning apparatus for cleaning reverse surface of semiconductor wafer.
  12. Sago Hiroyoshi (Kanagawa JPX) Fujiyama Shigemi (Kanagawa JPX) Kudo Katsuhiko (Kanagawa JPX) Kumazawa Hirotsugu (Kanagawa JPX), Cleaning device for cleaning planar workpiece.
  13. Motoda Kimio,JPX ; Tateyama Kiyohisa,JPX, Coating apparatus therefor.
  14. Kitamura Yoshiyuki,JPX ; Ido Hideo,JPX ; Suzuki Tetsuo,JPX ; Abe Kazuhiko,JPX ; Kanamori Hiromitsu,JPX ; Goto Tetsuya,JPX ; Akamatsu Takayoshi,JPX ; Tooyama Masaharu,JPX ; Sekido Toshihide,JPX, Coating machine having a timer for continuously forming a coating of uniform thickness on a substrate.
  15. Nakagawa Seiji,JPX ; Ito Yasushi,JPX, Developing treatment apparatus used in the process for manufacturing a semiconductor device, and method for the develop.
  16. Sumnitsch Franz,ATX, Device for treatment of wafer-shaped articles, especially silicon wafers.
  17. Walker Michael A. (Boise ID) Robinson Karl M. (Boise ID), Directional spray pad scrubber.
  18. deBoer Wiebe B. (Eersel OR NLX) Ozias Albert E. (Aumsville OR), Drive shaft apparatus for a susceptor.
  19. Bergman Eric J. (120 Midale Kalispell MT 59901), Dynamic semiconductor wafer processing using homogeneous chemical vapors.
  20. Harashima Keiichi (Tokyo JPX) Akimoto Takeshi (Tokyo JPX), Electrostatic chuck with mechanism for lifting up the peripheral of a substrate.
  21. Jain Manoj K. (Plano TX), Mechanical scrubbing for particle removal.
  22. Hood Roderic Kermit (Williston VT), Meniscus-contained method of handling fluids in the manufacture of semiconductor wafers.
  23. Matsuoka Yasuo (Kawasaki JPX), Method and apparatus for creation of resist patterns by chemical development.
  24. Sugimoto Kenji (Kyoto JPX) Sugimoto Hiroaki (Kyoto JPX) Kitagawa Masaru (Kyoto JPX), Method and apparatus for drying a substrate having a resist film with a miniaturized pattern.
  25. Yamasaka Miyako,JPX, Method for washing and drying substrates.
  26. Maekawa Toshiro,JPX ; Ono Koji,JPX ; Tsujimura Manabu,JPX, Method of and apparatus for cleaning workpiece.
  27. Lewis Charles H. (106 Kingswood Dr. Lafayette LA 70501), Musical instrument mouthpiece cover holder.
  28. Sakai Mitsuhiro,JPX ; Nomura Masafumi,JPX ; Tsunoda Kazuaki,JPX, Processing apparatus and processing method.
  29. Smith ; Jr. William Charles (Verbank NY) Lord Donn Allan (Hyde Park NY), Programmable apparatus for cleaning semiconductor elements.
  30. Tateyama Kiyohisa,JPX ; Motoda Kimio,JPX ; Iwasaki Tatsuya,JPX ; Matsuo Takenobu,JPX ; Denpoh Kazuki,JPX ; Yamaguchi Eiji,JPX, Resist processing apparatus for a rectangular substrate.
  31. Tomoeda Takayuki,JPX ; Murakami Masaaki,JPX ; Nishioka Kenichi,JPX, Resist processing method and apparatus.
  32. Sago Hiroyoshi (Kanagawa-ken JPX) Kobari Hideya (Kanagawa-ken JPX) Ueda Koji (Kanagawa-ken JPX) Miyamoto Hidenori (Kanagawa-ken JPX) Takatsuki Ryuzo (Okayama-ken JPX), Rotary chemical treater having stationary cleaning fluid nozzle.
  33. Matsuki Hirohisa,JPX ; Kado Kenichi,JPX ; Watanabe Eiji,JPX ; Imamura Kazuyuki,JPX ; Yurino Takahiro,JPX, Semiconductor device with pad structure.
  34. Thompson Raymon F. (Lakeside MT) Reardon Timothy J. (Kalispell MT) Owczarz Aleksander (Kalispell MT), Semiconductor processor wafer holder.
  35. Bleck Martin C. ; Reardon Timothy J. ; Bergman Eric J., Semiconductor processor with wafer face protection.
  36. Marohl Dan A. ; Rosenstein Michael, Semiconductor wafer alignment member and clamp ring.
  37. Gardner Mark I. ; Gilmer Mark C., Semiconductor wafer, handling apparatus, and method.
  38. Thompson Raymon F. (Kalispell MT) Gordon Robert W. (Seattle WA) Durado Daniel (Kalispell MT), Single wafer processor.
  39. Thompson Raymon F. (Kalispell MT) Gordon Robert W. (Seattle WA) Durado Daniel (Kalispell MT), Single wafer processor.
  40. Thompson Raymon F. (Kalispell MT) Owczarz Aleksander (Kalispell MT), Single wafer processor with a frame.
  41. Hasebe Keizo,JPX ; Fujimoto Akihiro,JPX ; Inada Hiroichi,JPX ; Iino Hiroyuki,JPX ; Kitamura Shinzi,JPX ; Deguchi Masatoshi,JPX ; Nambu Mitsuhiro,JPX, Solvent and resist spin coating apparatus.
  42. Ueno Kinya,JPX, Spin cleaning method.
  43. Shoda Mikio (Kyoto JPX) Yamamoto Masaaki (Kyoto JPX), Spin coating apparatus with an upper spin plate cleaning nozzle.
  44. Ueyama Tsutomu,JPX ; Izumi Akira,JPX ; Adachi Hideki,JPX, Substrate spin treating apparatus.
  45. Sumnitsch Franz (Klagenfurt ATX), Support for slice-shaped articles and device for etching silicon wafers with such a support.
  46. Perlov Ilya (Santa Clara CA), Susceptor drive and wafer displacement mechanism.
  47. Tanaka Masato (Shiga JPX), System for treating a surface of a rotating wafer.
  48. Nakayama Muneo (Tokyo JPX) Uehara Akira (Kanagawa JPX) Sago Hiroyoshi (Tokyo JPX) Mizuki Hideyuki (Tokyo JPX), Thin-film coating apparatus.
  49. Cady, Wayne A., VLSI chemical reactor.
  50. Grebinski ; Jr. Thomas J. (Santa Clara CA) Stephenson Samuel H. (Mountain View CA), Wafer etching, cleaning and stripping apparatus.
  51. Thompson Raymon F. (Kalispell MT) Owczarz Aleksander (Kalispell MT), Wafer holder with flexibly mounted gripping fingers.
  52. Silvernail James M. (Maple Plain MN) Schneider Dallas J. (Cologne MN), Wafer processing machine.
  53. Shaw R. Howard (Palo Alto CA), Wafer support assembly.

이 특허를 인용한 특허 (30)

  1. Yang, Michael X.; Kovarsky, Nicolay Y., Anolyte for copper plating.
  2. Yang,Michael X.; Kovarsky,Nicolay Y., Anolyte for copper plating.
  3. Davis, Jeffry Alan; Harris, Randy A., Apparatus and method for cleaning and drying a container for semiconductor workpieces.
  4. Yokomizo,Kenji, Apparatus and method of securing a workpiece during high-pressure processing.
  5. Hanson,Kyle M., Apparatus and methods for electrochemical processing of microelectronic workpieces.
  6. Hanson,Kyle M.; Ritzdorf,Thomas L.; Wilson,Gregory J.; McHugh,Paul R., Apparatus and methods for electrochemical processing of microelectronic workpieces.
  7. Hanson,Kyle M.; Ritzdorf,Thomas L.; Wilson,Gregory J.; McHugh,Paul R., Apparatus and methods for electrochemical processing of microelectronic workpieces.
  8. Wirth, Paul Z.; Peace, Steven L.; Lund, Erik, Apparatus and methods for processing a workpiece.
  9. Wirth, Paul Z.; Peace, Steven L.; Lund, Erik, Apparatus and methods for processing a workpiece.
  10. Wirth, Paul Z.; Peace, Steven L., Apparatus for processing a workpiece.
  11. Yang,Michael X.; Lubomirsky,Dmitry; Dordi,Yezdi; Singh,Saravjeet; Tulshibagwale,Sheshraj; Kovarsky,Nicolay, Electrochemical processing cell.
  12. Magome, Nobutaka; Takaiwa, Hiroaki; Arai, Dai, Exposure apparatus and method for producing device.
  13. Wirth, Paul; Woodruff, Daniel J., Integrated tool assemblies with intermediate processing modules for processing of microfeature workpieces.
  14. Ritzdorf,Thomas L.; Eudy,Steve L.; Wilson,Gregory J.; McHugh,Paul R.; Weaver,Robert A.; Aegerter,Brian; Dundas,Curt; Peace,Steven L., Methods and apparatus for processing microelectronic workpieces using metrology.
  15. Yang,Michael X.; Xi,Ming; Ellwanger,Russell C.; Britcher,Eric B.; Donoso,Bernardo; Pang,Lily L.; Sherman,Svetlana; Ho,Henry; Nguyen,Anh N.; Lerner,Alexander N.; D'Ambra,Allen L.; Shanmugasundram,Arul, Multi-chemistry plating system.
  16. Curtis, Gary L.; Thompson, Raymon F., Reactor for processing a microelectronic workpiece.
  17. Peace, Steven L.; Curtis, Gary L.; Thompson, Raymon F.; Aegerter, Brian; Dundas, Curt T., Reactor for processing a semiconductor wafer.
  18. Peace, Steven L.; Curtis, Gary L.; Thompson, Raymon F.; Aegerter, Brian; Dundas, Curt T., Reactor for processing a semiconductor wafer.
  19. Olgado, Donald J. K.; Donoso, Bernardo; Lerner, Alexander, Rotary vacuum-chuck with venturi formed at base of rotating shaft.
  20. Aegerter,Brian K.; Dundas,Curt T.; Ritzdorf,Tom L.; Curtis,Gary L.; Jolley,Michael; Peace,Steven L., Selective treatment of microelectric workpiece surfaces.
  21. Rye, Jason A.; Hanson, Kyle M.; Woodruff, Daniel J., Single side workpiece processing.
  22. Hanson, Kyle M.; Lund, Eric; Grove, Coby; Peace, Steven L.; Wirth, Paul Z.; Bruner, Scott A.; Kuntz, Jonathan, Single workpiece processing system.
  23. Hanson, Kyle M.; Wirth, Paul Z.; Peace, Steven L.; Kuntz, Jon; Bruner, Scott A., Single workpiece processing system.
  24. Thompson, Raymon F.; Davis, Jeffry A.; Harris, Randy; Scranton, Dana R.; Pfeifle, Ryan; Peace, Steven A.; Aegerter, Brian, Single workpiece processing system.
  25. Gleissner, Andreas; Junk, Markus; Bandarapu, Bhaskar, Spin chuck with rotating gas showerhead.
  26. Kitano, Takahiro; Kobayashi, Shinji; Esaki, Yukihiko; Morikawa, Masateru, Substrate processing unit and processing method.
  27. Iwata, Yasumasa, Surface treatment apparatus.
  28. Wilson, Gregory J.; McHugh, Paul R.; Hanson, Kyle M., System for electrochemically processing a workpiece.
  29. Hanson,Kyle M., System for processing a workpiece.
  30. Wilson,Gregory J.; McHugh,Paul R.; Hanson,Kyle M., Workpiece processor having processing chamber with improved processing fluid flow.
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