초록 ▼

A circuit switching device or circuit breaker with integrated self-test enhancements is disclosed having separable contacts operable under processor control to control power to a circuit responsive to at least one of a plurality of fault conditions and operable according to a method for testing, inc

A circuit switching device or circuit breaker with integrated self-test enhancements is disclosed having separable contacts operable under processor control to control power to a circuit responsive to at least one of a plurality of fault conditions and operable according to a method for testing, including the steps of: controlling the switching device during a sampling cycle, to input one or more operating parameters sensed in the circuit to an A/D converter for measurement wherein the operating parameters enable detection of the fault conditions; determining whether to read a select one of the operating parameters from an output of the A/D converter into a first memory; and reading pre-determined parameter values from a second memory into the first memory during the sampling cycle instead of the operating parameters read from the A/D converter if a self-test has been invoked during the sampling cycle.

대표청구항 ▼

1. Apparatus for testing a circuit switching device, having separable contacts for controlling AC power supplied to a circuit responsive to at least one of a plurality of fault conditions, wherein the AC power provides an alternating line current having a line voltage and a frequency comprising:a pr

1. Apparatus for testing a circuit switching device, having separable contacts for controlling AC power supplied to a circuit responsive to at least one of a plurality of fault conditions, wherein the AC power provides an alternating line current having a line voltage and a frequency comprising:a processor having an A/D converter with parameter inputs coupled thereto and operating according to a periodic sampling cycle to measure operating parameters of said circuit with a sensing circuit and detect said fault conditions occurring therein; a first memory coupled to said processor for storing said operating parameters of said circuit output from said A/D converter when measured by said processor for use in determining said fault conditions; a second memory coupled to said processor and having stored therein predetermined parameter values for substitution for said measured parameters when a self-test has been invoked during said sampling cycle; a controller for running said self-test upon being invoked during said sampling cycle.