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Method and apparatus for determining the severity of a trend toward an impending machine failure and responding to the same

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H04B-015/00
출원번호 US-0390063 (1999-09-03)
발명자 / 주소
  • Jagannathan Sarangapani
  • Sri K. Rangarajan
출원인 / 주소
  • Caterpillar Inc.
대리인 / 주소
    Blackwell Sanders Peper Martin LLP
인용정보 피인용 횟수 : 50  인용 특허 : 21

초록

A method and apparatus for determining severity of a trend toward an impending machine failure under actual operating conditions. The method and apparatus includes providing a typical failure trend based on a set of normal operating conditions for the machine, determining a slope value for the typic

대표청구항

1. A method for determining severity of a trend toward an impending machine failure under actual operating conditions, comprising the steps of:(a) providing a typical failure trend based on a set of normal operating conditions for the machine; (b) providing a trend toward an impending machine failur

이 특허에 인용된 특허 (21)

  1. Boen Charles G. (Dunlap IL) Hadank John M. (Dunlap IL) McGuire Kenneth J. (Peoria IL) Schricker David R. (Peoria IL) Scholl Rolland D. (Dunlap IL), Apparatus and method for providing historical data regarding machine operating parameters.
  2. Frey Donald J. (Boulder CO) Holtz Michael J. (Boulder CO), Automated diagnostic system having temporally coordinated wireless sensors.
  3. Moore M. Samuel (Northridge CA), Comprehensive engine monitor and recorder.
  4. Hoffman John P. (Peoria IL) Vance Ricky D. (Washington IL) Barney Dennis A. (Morton IL) Kozlevcar Joseph G. (Peoria IL), Computerized diagnostic and monitoring system.
  5. Morrow Robert S. (Dublin OH), Data acquisition system.
  6. Berge Gerhard,DEX ; Mewes Frank,DEX, Electronic sensor module.
  7. Spoerre Julie K. (Tallahassee FL) Lin Chang-Ching (Tallahassee FL) Wang Hsu-Pin (Tallahassee FL), Machine performance monitoring and fault classification using an exponentially weighted moving average scheme.
  8. Schricker David R. (Dunlap IL) Shetty Satish M. (East Peoria IL), Method and apparatus for indicating a fault condition.
  9. Schricker David R. (Dunlap IL) Scholl Rolland D. (Dunlap IL) Shetty Satish M. (East Peoria IL) Young David G. (Peoria IL), Method and apparatus for machine health inference by comparing two like loaded components.
  10. Hoth Donald K. ; Morrelly C. Kenneth, Method and apparatus for performing pre-emptive maintenance on operating equipment.
  11. Sarangapani Jagannathan ; Schricker David R., Method and apparatus for predicting a fault condition.
  12. Sarangapani Jagannathan, Method and apparatus of predicting a fault condition.
  13. Haseley Robert K. (Mooresville NC) Kirkpatrick Paul A. (Charlotte NC), Method for collecting machine vibration data.
  14. Yamato Akihiro (Shiki JPX) Otobe Yutaka (Shiki JPX), Method for detecting abnormality in the functioning of an electronic control system.
  15. Doskocil Douglas C. (North Reading MA) Offt Alan M. (Chelmsford MA), Method for fault diagnosis by assessment of confidence measure.
  16. Berruyer Yves (94 Boulevard Gabriel Pri 92240 Malakoff FRX), Method of monitoring to anticipate the triggering of an alarm.
  17. Mott Jack E. (Idaho Falls ID), Method of system state analysis.
  18. Scarola Kenneth ; Jamison David S. ; Manazir Richard M. ; Rescorl Robert L. ; Harmon Daryl L., Method of validating measurement data of a process parameter from a plurality of individual sensor inputs.
  19. Reismiller Paul R. (West Chester OH) Brunemann ; Jr. George A. (Cincinnati OH), Predictor algorithm for actuator control.
  20. Lane Leslie A. (Santa Clara CA) Lybeck Lynn V. (Moss Beach CA) Perloff David S. (Sunnyvale CA) Kumagi Shoji (Santa Clara CA), Process control interface system for managing measurement data.
  21. Mochizuki Yasumasa (Shizuoka JPX) Yoshino Tomoaki (Shizuoka JPX) Hasegawa Shinichi (Shizuoka JPX) Sano Masakazu (Shizuoka JPX), System and method for predicting failure in machine tool.

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