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Method of producing strained microelectronic and/or optical integrated and discrete devices 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/30
  • H01L-021/46
출원번호 US-0710127 (2000-11-09)
발명자 / 주소
  • Rona E. Belford
대리인 / 주소
    Howard & Howard
인용정보 피인용 횟수 : 87  인용 특허 : 7

초록

A method of producing a strained crystalline semiconductor microelectronic device(s). Microelectronic device(s) are formed within a membrane. The method includes the steps of straining a membrane along at least one axis and bonding the membrane to a base substrate.

대표청구항

1. A method of producing a strained crystalline semiconductor microelectronic device, including the steps of:applying a tensile strain to a membrane along at least one axis, the microelectronic device being formed within the membrane; and bonding the membrane to a base substrate.

이 특허에 인용된 특허 (7)

  1. Laderman Stephen (Menlo Park CA) Scott Martin (San Francisco CA) Kamins Theodore I. (Palo Alto CA) Hoyt Judy L. (Palo Alto CA) King Clifford A. (Palo Alto CA) Gibbons James F. (Palo Alto CA) Noble Da, Fabricating a semiconductor device with strained Si1-xGex layer.
  2. Jeffers Frederick J. (Escondido CA), High sensitivity semiconductor strain gauge.
  3. Jakowetz Wolf,DEX ; Fischer Helmut,DEX, Method for producing a plurality of semiconductor components.
  4. Abe Takao (Annaka JPX) Nakazato Yasuaki (Koshoku JPX) Uchiyama Atsuo (Koshoku JPX), Method of producing semiconductor substrate.
  5. Kamiyama Satoshi,JPX ; Suzuki Masakatsu,JPX ; Uenoyama Takeshi,JPX ; Ohnaka Kiyoshi,JPX ; Takamori Akira,JPX ; Mannoh Masaya,JPX ; Kidoguchi Isao,JPX ; Adachi Hideto,JPX ; Ishibashi Akihiko,JPX ; Fuk, Semiconductor light emitting element and method for fabricating the same.
  6. Taylor ; Allen L., Strain sensor employing bi layer piezoelectric polymer.
  7. McKee Rodney Allen ; Walker Frederick Joseph, Strain-based control of crystal anisotropy for perovskite oxides on semiconductor-based material.

이 특허를 인용한 특허 (87)

  1. Forbes, Leonard, Bonded strained semiconductor with a desired surface orientation and conductance direction.
  2. Currie,Matthew T., Control of strain in device layers by prevention of relaxation.
  3. Currie,Matthew T., Control of strain in device layers by selective relaxation.
  4. Henley, Francois J.; Cheung, Nathan W., Controlled process and resulting device.
  5. Henley, Francois J.; Cheung, Nathan W., Controlled process and resulting device.
  6. Yamazaki,Shunpei; Murakami,Masakazu; Takayama,Toru; Maruyama,Junya, Display device having a curved surface.
  7. Wu,Kenneth C.; Fitzgerald,Eugene A.; Taraschi,Gianni; Borenstein,Jeffrey T., Etch stop layer system.
  8. Yamazaki, Shunpei; Murakami, Masakazu; Takayama, Toru; Maruyama, Junya, Flexible display panel having curvature that matches curved surface of vehicle part.
  9. Forbes, Leonard, Gettering of silicon on insulator using relaxed silicon germanium epitaxial proximity layers.
  10. Forbes, Leonard, Gettering of silicon on insulator using relaxed silicon germanium epitaxial proximity layers.
  11. Currie, Matthew T., Hybrid fin field-effect transistor structures and related methods.
  12. Henley, Francois J., Layer transfer of films utilizing controlled propagation.
  13. Henley, Francois J., Layer transfer of films utilizing controlled shear region.
  14. Forbes, Leonard, Localized compressive strained semiconductor.
  15. Forbes, Leonard, Localized compressive strained semiconductor.
  16. Forbes, Leonard, Localized compressive strained semiconductor.
  17. Forbes, Leonard, Localized compressive strained semiconductor.
  18. Forbes,Leonard, Localized strained semiconductor on insulator.
  19. Forbes,Leonard, Localized strained semiconductor on insulator.
  20. Henley,Francois J.; Kirk,Harry R., Manufacturing strained silicon substrates using a backing material.
  21. Henley, Francois J., Method and structure for fabricating solar cells using a thick layer transfer process.
  22. Henley,Francois J.; Ong,Philip James; Malik,Igor J.; Kirk,Harry R., Method and system for fabricating strained layers for the manufacture of integrated circuits.
  23. Henley,Francois J.; Ong,Philip James; Malik,Igor J., Method and system for lattice space engineering.
  24. Yamazaki, Shunpei; Murakami, Masakazu; Takayama, Toru; Maruyama, Junya, Method for fabricating a semiconductor device by bonding a layer to a support with curvature.
  25. Yamazaki, Shunpei; Murakami, Masakazu; Takayama, Toru; Maruyama, Junya, Method for fabricating a semiconductor device by bonding a layer to a support with curvature.
  26. Yamazaki, Shunpei; Murakami, Masakazu; Takayama, Toru; Maruyama, Junya, Method for fabricating a semiconductor device by transferring a layer to a support with curvature.
  27. Yamazaki,Shunpei; Murakami,Masakazu; Takayama,Toru; Maruyama,Junya, Method for fabricating a semiconductor device by transferring a layer to a support with curvature.
  28. Yamazaki, Shunpei; Murakami, Masakazu; Takayama, Toru; Maruyama, Junya, Method for fabricating light emitting device and method for fabricating liquid crystal display device.
  29. Henley,Francois J., Method for fabricating semiconductor devices using strained silicon bearing material.
  30. Cheng,Zhiyuan; Fitzgerald,Eugene A.; Antoniadis,Dimitri A., Method of fabricating a semiconductor structure that includes transferring one or more material layers to a substrate and smoothing an exposed surface of at least one of the material layers.
  31. Fitzgerald,Eugene; Currie,Matthew, Methods for fabricating strained layers on semiconductor substrates.
  32. Langdo, Thomas A.; Currie, Matthew T.; Hammond, Richard; Lochtefeld, Anthony J.; Fitzgerald, Eugene A., Methods for forming III-V semiconductor device structures.
  33. Langdo, Thomas A.; Currie, Matthew T.; Hammond, Richard; Lochtefeld, Anthony J.; Fitzgerald, Eugene A., Methods for forming strained-semiconductor-on-insulator device structures by mechanically inducing strain.
  34. Langdo,Thomas A.; Currie,Matthew T.; Hammond,Richard; Lochtefeld,Anthony J.; Fitzgerald,Eugene A., Methods for forming strained-semiconductor-on-insulator device structures by use of cleave planes.
  35. Currie,Matthew T., Methods of forming hybrid fin field-effect transistor structures.
  36. Bhattacharyya, Arup; Forbes, Leonard; Farrar, Paul A., Methods of forming strained semiconductor channels.
  37. Langdo, Thomas A.; Currie, Matthew T.; Hammond, Richard; Lochtefeld, Anthony J.; Fitzgerald, Eugene A., Methods of forming strained-semiconductor-on-insulator device structures.
  38. Lochtefeld,Anthony J.; Langdo,Thomas A.; Hammond,Richard; Currie,Matthew T.; Braithwaite,Glyn; Fitzgerald,Eugene A., Methods of forming strained-semiconductor-on-insulator finFET device structures.
  39. Forbes,Leonard, Micro-mechanically strained semiconductor film.
  40. Forbes,Leonard, Micro-mechanically strained semiconductor film.
  41. Forbes,Leonard, Micro-mechanically strained semiconductor film.
  42. Forbes,Leonard, Micromechanical strained semiconductor by wafer bonding.
  43. Forbes,Leonard, Micromechanical strained semiconductor by wafer bonding.
  44. Malik, Igor J.; Kang, Sien G.; Fuerfanger, Martin; Kirk, Harry; Flat, Ariel; Current, Michael Ira; Ong, Philip James, Non-contact etch annealing of strained layers.
  45. Ong,Philip; Henley,Francois; Malik,Igor, Non-contact etch annealing of strained layers.
  46. Wallis, David John, P-type semiconductor devices.
  47. Yamazaki, Shunpei; Suzuki, Kunihiko, Peeling method and peeling apparatus.
  48. Yasumoto, Seiji; Sato, Masataka; Eguchi, Shingo; Suzuki, Kunihiko, Peeling method, semiconductor device, and peeling apparatus.
  49. Cheng, Zhi-Yuan; Fitzgerald, Eugene A.; Antoniadis, Dimitri A.; Hoyt, Judy L., Process for producing semiconductor article using graded epitaxial growth.
  50. Henley, Francois J.; Brailove, Adam, Race track configuration and method for wafering silicon solar substrates.
  51. Yamazaki,Shunpei; Takayama,Toru, Semiconductor device and manufacturing method thereof.
  52. Arao, Tatsuya, Semiconductor device and method of manufacturing the same.
  53. Arao, Tatsuya, Semiconductor device and method of manufacturing the same.
  54. Yamazaki, Shunpei; Murakami, Masakazu; Takayama, Toru; Maruyama, Junya, Semiconductor device having aluminum-containing layer between two curved substrates.
  55. Yamazaki, Shunpei; Murakami, Masakazu; Takayama, Toru; Maruyama, Junya, Semiconductor device having aluminum-containing layer between two curved substrates.
  56. Yamazaki, Shunpei; Takayama, Toru, Semiconductor device including a flexible support.
  57. Cheng, Zhiyuan; Fitzgerald, Eugene A.; Antoniadis, Dimitri A., Semiconductor device structure.
  58. Bhattacharyya, Arup; Forbes, Leonard; Farrar, Paul A., Semiconductor device with strained channels.
  59. Forbes, Leonard, Semiconductor on insulator structure.
  60. Forbes,Leonard, Semiconductors bonded on glass substrates.
  61. Forbes,Leonard, Silicon oxycarbide substrates for bonded silicon on insulator.
  62. Forbes,Leonard, Strained Si/SiGe structures by ion implantation.
  63. Forbes,Leonard, Strained Si/SiGe structures by ion implantation.
  64. Forbes,Leonard, Strained Si/SiGe/SOI islands and processes of making same.
  65. Forbes,Leonard, Strained Si/SiGe/SOI islands and processes of making same.
  66. Langdo,Thomas A.; Currie,Matthew T.; Hammond,Richard; Lochtefeld,Anthony J.; Fitzgerald,Eugene A., Strained germanium-on-insulator device structures.
  67. Forbes, Leonard; Geusic, Joseph E.; Akram, Salman, Strained semiconductor by full wafer bonding.
  68. Forbes, Leonard; Geusic, Joseph E.; Akram, Salman, Strained semiconductor by full wafer bonding.
  69. Forbes, Leonard; Geusic, Joseph E.; Akram, Salman, Strained semiconductor by full wafer bonding.
  70. Forbes,Leonard; Geusic,Joseph E.; Akram,Salman, Strained semiconductor by full wafer bonding.
  71. Forbes,Leonard, Strained semiconductor by wafer bonding with misorientation.
  72. Forbes, Leonard; Farrar, Paul A., Strained semiconductor, devices and systems and methods of formation.
  73. Forbes,Leonard; Farrar,Paul A., Strained semiconductor, devices and systems and methods of formation.
  74. Langdo,Thomas A.; Currie,Matthew T.; Hammond,Richard; Lochtefeld,Anthony J.; Fitzgerald,Eugene A., Strained-semiconductor-on-insulator device structures.
  75. Langdo,Thomas A.; Currie,Matthew T.; Hammond,Richard; Lochtefeld,Anthony J.; Fitzgerald,Eugene A., Strained-semiconductor-on-insulator device structures.
  76. Langdo,Thomas A.; Currie,Matthew T.; Hammond,Richard; Lochtefeld,Anthony J.; Fitzgerald,Eugene A., Strained-semiconductor-on-insulator device structures with elevated source/drain regions.
  77. Langdo,Thomas A.; Currie,Matthew T.; Braithwaite,Glyn; Hammond,Richard; Lochtefeld,Anthony J.; Fitzgerald,Eugene A., Strained-semiconductor-on-insulator finFET device structures.
  78. Henley, Francois; Lamm, Al; Chow, Yi-Lei, Substrate cleaving under controlled stress conditions.
  79. Henley, Francois; Lamm, Al; Chow, Yi-Lei, Substrate cleaving under controlled stress conditions.
  80. Henley, Francois; Lamm, Al; Chow, Yi-Lei, Substrate cleaving under controlled stress conditions.
  81. Brailove, Adam; Liu, Zuqin; Henley, Francois J.; Lamm, Albert J., Techniques for forming thin films by implantation with reduced channeling.
  82. Forbes,Leonard, Ultra-thin semiconductors bonded on glass substrates.
  83. Forbes,Leonard, Ultra-thin semiconductors bonded on glass substrates.
  84. Yamazaki, Shunpei; Murakami, Masakazu; Takayama, Toru; Maruyama, Junya, Vehicle that includes a display panel having a curved surface.
  85. Takayama, Toru; Maruyama, Junya; Goto, Yuugo; Kuwabara, Hideaki; Yamazaki, Shunpei, Vehicle, display device and manufacturing method for a semiconductor device.
  86. Takayama,Toru; Maruyama,Junya; Goto,Yuugo; Kuwabara,Hideaki; Yamazaki,Shunpei, Vehicle, display device and manufacturing method for a semiconductor device.
  87. Forbes,Leonard, Wafer gettering using relaxed silicon germanium epitaxial proximity layers.

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