$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Method of fabricating low-dielectric constant interlevel dielectric films for BEOL interconnects with enhanced adhesion and low-defect density 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/31
  • H01L-021/469
출원번호 US-0789422 (2001-02-21)
발명자 / 주소
  • Andrew Robert Eckert
  • John C. Hay
  • Jeffrey Curtis Hedrick
  • Kang-Wook Lee
  • Eric Gerhard Liniger
  • Eva Erika Simonyi
출원인 / 주소
  • International Business Machines Corporation
대리인 / 주소
    Scully, Scott, Murphy & Presser
인용정보 피인용 횟수 : 25  인용 특허 : 5

초록

A substantially defect-free, low-k dielectric film having improved adhesion is provided by (a) applying a silane coupling agent containing at least one polymerizable group to a surface of a substrate so as to provide a substantially uniform coating of said silane-coupling agent on said substrate; (b

대표청구항

1. A method of fabricating an integrated circuit comprising the steps of:(a) applying a silane coupling agent containing at least one polymerizable group to a surface of a substrate to provide a substantially uniform coating of said silane-coupling agent on said substrate; (b) heating said substrate

이 특허에 인용된 특허 (5)

  1. Brewer Terry (Rolla MO) Flaim Tony D. (St. James MO) Moss Mary G. (Rolla MO), Adhesion promoting product and process for treating an integrated circuit substrate.
  2. Brewer Terry (Rolla MO) Flaim Tony D. (St. James MO) Moss Mary G. (Rolla MO), Adhesion promoting product and process for treating an integrated circuit substrate therewith.
  3. Yokotsuka Shunsuke,JPX ; Serita Aya,JPX ; Aosaki Ko,JPX ; Matsukura Ikuo,JPX ; Narita Takenori,JPX ; Morishima Hiroyuki,JPX ; Uchimura Shunichiro,JPX, Low dielectric resin composition.
  4. Matsuzawa Nobuyuki,JPX ; Hasegawa Toshiaki,JPX, Method of forming insulating film.
  5. Knotter Dirk M. (Eindhoven NLX) Wijdenes Jacob (Eindhoven NLX), Method of manufacturing a thin silicon-oxide layer.

이 특허를 인용한 특허 (25)

  1. Gracias, David H.; Ramachandrarao, Vijayakumar S., Adhesion of carbon doped oxides by silanization.
  2. Weigel,Scott Jeffrey; Vincent,Jean Louise; Coulter,Sarah Kathryn; MacDougall,James Edward, Aerosol misted deposition of low dielectric organosilicate films.
  3. Johnson, Ward A., Alleviation of the corrosion pitting of chip pads.
  4. Karnik, Tomas, Anode for a solid electrolytic capacitor containing a non-metallic surface treatment.
  5. Lee, Chung J.; Kumar, Atul, Composite polymer dielectric film.
  6. Hawker, Craig Jon; Hedrick, James Lupton; Huang, Elbert Emin; Lee, Victor Yee-Way; Magbitang, Teddie; Mecerreyes, David; Miller, Robert Dennis; Volksen, Willi, Defect-free dielectric coatings and preparation thereof using polymeric nitrogenous porogens.
  7. Karnik, Tomas, Doped ceramic powder for use in forming capacitor anodes.
  8. Breznova, Hana; Biler, Martin, Electrolytic capacitor anode treated with an organometallic compound.
  9. Spencer,Gregory S.; Junker,Kurt H.; Vires,Jason A., Integration of ultra low K dielectric in a semiconductor fabrication process.
  10. Kon, Junichi; Yano, Ei; Nakata, Yoshihiro; Imada, Tadahiro, Material for forming adhesion reinforcing layer, adhesion reinforcing layer, semiconductor device, and manufacturing method thereof.
  11. Buehler, Mark F.; Fredrickson, Larry R., Method for post-CMP conversion of a hydrophobic surface of a low-k dielectric layer to a hydrophilic surface.
  12. McCracken, Colin; Grant, Nigel Patrick, Method of forming anode bodies for solid state capacitors.
  13. Spencer, Gregory S.; Turner, Michael D., Method of making a semiconductor device having a low K dielectric.
  14. An, Kwang-Hyup; Couture, Aaron Judy; Parthasarathy, Gautam; Zhao, Ri-An; Liu, Jie Jerry, Organic X-ray detector with barrier layer.
  15. Hwang, Cherngye; McKean, Dennis R.; Suzuki, Gary J., Patterning a surface comprising silicon and carbon.
  16. Biler, Martin; Sita, Zdenek, Polymer based solid state capacitors and a method of manufacturing them.
  17. Gleason,Karen K.; Wu,Qingguo; Ross,April, Porous material formation by chemical vapor deposition onto colloidal crystal templates.
  18. RamachandraRao,Vijayakumar S.; Gracias,David H., Replenishment of surface carbon and surface passivation of low-k porous silicon-based dielectric materials.
  19. RamachandraRao,Vijayakumar S.; Gracias,David H., Replenishment of surface carbon and surface passivation of low-k porous silicon-based dielectric materials.
  20. Bryks, Whitney Michael; Angoua, Bainye Francoise; Seneviratne, Dilan Anuradha, Semiconductor package substrate having an interfacial layer.
  21. Lee,Chung J.; Kumar,Atul, Single and dual damascene techniques utilizing composite polymer dielectric film.
  22. Breznova, Hana; Biler, Martin, Sintered anode pellet etched with an organic acid for use in an electrolytic capacitor.
  23. Breznova, Hana; Biler, Martin, Sintered anode pellet treated with a surfactant for use in an electrolytic capacitor.
  24. Agarwala, Birendra N.; Nguyen, Du B.; Rathore, Hazara S., Structure and method for eliminating time dependent dielectric breakdown failure of low-k material.
  25. Lee,Chung J.; Kumar,Atul; Chen,Chieh; Pikovsky,Yuri, System for forming composite polymer dielectric film.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로