초록 ▼

A calibration system is provided for calibrating a sensor with respect to an external reference frame associated with manufacturing gauging station. A target calibration device is positioned at a vantage point to detect and calibrate its reference frame in relation to the external reference frame. A

A calibration system is provided for calibrating a sensor with respect to an external reference frame associated with manufacturing gauging station. A target calibration device is positioned at a vantage point to detect and calibrate its reference frame in relation to the external reference frame. A reference target having at least three non-coplanar reflective surfaces is illuminated by the structured light emanating from the sensor. In this way, the calibration system is able to determine the spatial location and orientation of the reference target in relation to the sensor. The calibration system further includes a coordinate transformation system for coordinating the measurement data from the target calibration device and from the feature sensor, whereby the feature sensor is calibrated with respect to the external reference frame.

대표청구항 ▼

1. A sensor calibration system for calibrating a non-contact sensor with respect to an external reference frame, the non-contact sensor of the type having a sensing zone associated with a sensor reference frame, comprising:a target calibration device having a calibration field of observation associa

1. A sensor calibration system for calibrating a non-contact sensor with respect to an external reference frame, the non-contact sensor of the type having a sensing zone associated with a sensor reference frame, comprising:a target calibration device having a calibration field of observation associated with a calibration device reference frame; a reference target for placement within the observation field of said target calibration device and within the sensing zone of said feature sensor, said reference target having at least three non-coplanar reflective surfaces; a reference indicia disposed in fixed relation to said external reference frame, such that the target calibration device is positionable at vantage point where the reference indicia is within the calibration field; a coordinate transformation system being adapted for coupling to said target calibration device for collecting data from said reference indicia and for establishing a first relationship between the calibration device reference frame and external reference frame; said coordinate transformation system further being adapted for coupling to said target calibration device and to said feature sensor for collecting data from the reference target and for establishing a second relationship between the calibration device reference frame and the feature sensor reference frame; and said coordinate transformation system determining a third relationship between the external reference frame and the feature sensor reference frame, whereby the feature sensor is calibrated with respect to the external reference frame.