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Anode assembly for plating and planarizing a conductive layer 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C25B-011/03
출원번호 US-0568584 (2000-05-11)
발명자 / 주소
  • Rimma Volodarsky
  • Konstantin Volodarsky
  • Cyprian Uzoh
  • Homayoun Talieh
  • Douglas W. Young
출원인 / 주소
  • NuTool Inc.
대리인 / 주소
    Crowell & Moring, LLP
인용정보 피인용 횟수 : 23  인용 특허 : 43

초록

A particular anode assembly can be used to supply a solution for any of a plating operation, a planarization operation, and a plating and planarization operation to be performed on a semiconductor wafer. The anode assembly includes a rotatable shaft disposed within a chamber in which the operation i

대표청구항

1. An anode assembly which can be used to supply a solution for any of a plating operation, a planarization operation, and a plating and planarization operation to be performed on a workpiece comprising:a rotatable shaft disposed within a chamber in which the operation is performed and through which

이 특허에 인용된 특허 (43)

  1. Boudot Bernard (Paris FRX) Nury Georges (Frepillon FRX) Lambert Andre (Louvres FRX), Additive composition, bath and process for acid copper electroplating.
  2. Sun Lizhong ; Tsai Stan ; Redeker Fritz, Advanced electrolytic polish (AEP) assisted metal wafer planarization method and apparatus.
  3. Uzoh Cyprian E., Anode design for semiconductor deposition having novel electrical contact assembly.
  4. Cheung Robin ; Sinha Ashok ; Tepman Avi ; Carl Dan, Apparatus for electro-chemical deposition with thermal anneal chamber.
  5. Uzoh Cyprian Emeka ; Harper James McKell Edwin, Apparatus for electrochemical mechanical planarization.
  6. Dahms Wolfgang (Berlin DEX), Aqueous acidic bath for electrochemical deposition of a shiny and tear-free copper coating and method of using same.
  7. Sherwood Michael T. (Fremont CA) Lee Harry Q. (Mountain View CA) Shendon Norm (San Carlos CA) Spektor Semyon (San Francisco CA), Carrier head design for a chemical mechanical polishing apparatus.
  8. Zuniga Steven M. ; Blumenkranz Stephen J., Carrier head design for a chemical mechanical polishing apparatus.
  9. Zuniga Steven M., Carrier head with a flexible membrane and adjustable edge pressure.
  10. Perlov Iiya ; Gantvarg Eugene ; Ko Sen-Hou, Carrier head with a flexible membrane for a chemical mechanical polishing system.
  11. Watts David ; Bajaj Rajeev ; Das Sanjit ; Farkas Janos ; Dang Chelsea ; Freeman Melissa ; Saravia Jaime A. ; Gomez Jason ; Cook Lance B., Chemical mechanical polishing (CMP) slurry for copper and method of use in integrated circuit manufacture.
  12. Scherber Debra L. ; Kaufman Vlasta Brusic ; Kistler Rodney C. ; Mueller Brian L. ; Streinz Christopher C., Chemical mechanical polishing slurry for metal layers and films.
  13. Tsai Ming-Shih,TWX ; Tseng Wei-Tsu,TWX, Chemical mechanical polishing slurry for metallic thin film.
  14. Kaufman Vlasta Brusic ; Kistler Rodney C., Chemical mechanical polishing slurry useful for copper substrates.
  15. Brusic Vlasta A. ; Marino Jeffrey Robert ; O'Sullivan Eugene John ; Sambucetti Carlos Juan ; Schrott Alejandro Gabriel ; Uzoh Cyprian Emeka, Cobalt-tin alloys and their applications for devices, chip interconnections and packaging.
  16. Uzoh Cyprian E., Continuous highly conductive metal wiring structures and method for fabricating the same.
  17. Koon Kam Kwan,HKX, Continuous vertical plating system and method of plating.
  18. Andricacos Panayotis Constantinou ; Deligianni Hariklia ; Harper James McKell Edwin ; Hu Chao-Kun ; Pearson Dale Jonathan ; Reynolds Scott Kevin ; Tu King-Ning ; Uzoh Cyprian Emeka, Copper alloys for chip and package interconnections.
  19. Carpio Ronald A., Copper chemical mechanical polishing slurry utilizing a chromate oxidant.
  20. Miljkovic Momcilo (Hummelstown PA), Copper electroplating solutions and methods.
  21. Contolini Robert J. ; Reid Jonathan ; Patton Evan ; Feng Jingbin ; Taatjes Steve ; Dukovic John Owen, Electric potential shaping apparatus for holding a semiconductor wafer during electroplating.
  22. Bernhardt Anthony F. (Berkeley CA) Contolini Robert J. (Pleasanton CA), Electrochemical planarization.
  23. Uzoh Cyprian E., Electroetch and chemical mechanical polishing equipment.
  24. Broadbent Eliot K., Electroplating system with shields for varying thickness profile of deposited layer.
  25. Woo Christy Mei-Chu ; Iacoponi John A. ; Yang Kai, Electroplating uniformity by diffuser design.
  26. Uzoh Cyprian E., Electroplating workpiece fixture having liquid gap spacer.
  27. Burghartz Joachim Norbert ; Edelstein Daniel Charles ; Jahnes Christopher Vincent ; Uzoh Cyprian Emeka, Integrated circuit inductor.
  28. Burghartz Joachim Norbert ; Edelstein Daniel Charles ; Jahnes Christopher Vincent ; Uzoh Cyprian Emeka, Integrated circuit toroidal inductor.
  29. Talieh Homayoun, Method and apparatus for electro-chemical mechanical deposition.
  30. Guthrie William L. ; Cheng Tsungnan ; Ko Sen-Hou ; Lee Harry Q. ; Sherwood Michael T. ; Shendon Norm, Method and apparatus for using a retaining ring to control the edge effect.
  31. Simpson Cindy Reidsema ; Mikkola Robert Douglas ; Herrick Matthew T. ; Baker Brett Caroline ; Pena David Moralez ; Acosta Edward ; Chowdhury Rina ; Azrak Marijean ; Goldberg Cindy Kay ; Islam Mohamme, Method for forming a copper layer over a semiconductor wafer.
  32. Farkas Janos ; Freeman Melissa, Method for using ammonium salt slurries for chemical mechanical polishing (CMP).
  33. Carr Jeffrey W. (Fishkill NY) David Lawrence D. (Wappingers Falls NY) Guthrie William L. (Hopewell Junction NY) Kaufman Frank B. (Amawalk NY) Patrick William J. (Newburgh NY) Rodbell Kenneth P. (Poug, Method of chemical-mechanical polishing an electronic component substrate and polishing slurry therefor.
  34. Nenadic Anton (Red Hook NY) Pasco Robert W. (Wappingers Falls NY), Method of chemical-mechanical polishing an electronic component substrate and polishing slurry therefor.
  35. Uzoh Cyprian Emeka ; Harper James McKell Edwin, Method of electrochemical mechanical planarization.
  36. Reid Jonathan D. ; Contolini Robert J. ; Opocensky Edward C. ; Patton Evan E. ; Broadbent Eliot K., Method of electroplating semiconductor wafer using variable currents and mass transfer to obtain uniform plated layer.
  37. Liu Yauh-Ching ; Perng Dung-Ching, Method of single step damascene process for deposition and global planarization.
  38. Simon Andrew H. ; Uzoh Cyprian E., Open-bottomed via liner structure and method for fabricating same.
  39. Sasaki Yasutaka,JPX ; Hayasaka Nobuo,JPX ; Kaneko Hisashi,JPX ; Hirabayashi Hideaki,JPX ; Higuchi Masatoshi,JPX, Polishing agent and polishing method using the same.
  40. Ting Chiu H. ; Holtkamp William H. ; Ko Wen C. ; Lowery Kenneth J. ; Cho Peter, Process chamber and method for depositing and/or removing material on a substrate.
  41. Yu Chris C. (Boise ID) Doan Trung T. (Boise ID), Slurries for chemical mechanically polishing copper containing metal layers.
  42. Jorne Jacob ; Love Judith Ann, Uniform electroplating of wafers.
  43. Andricacos Panayotis C. (Croton-on-Hudson NY) Berridge Kirk G. (Fishkill NY) Dukovic John O. (Pleasantville NY) Flotta Matteo (Yorktown Heights NY) Ordonez Jose (Pleasant Valley NY) Poweleit Helmut R, Vertical paddle plating cell.

이 특허를 인용한 특허 (23)

  1. Volodarsky, Rimma; Volodarsky, Konstantin; Uzoh, Cyprian; Talieh, Homayoun; Young, Douglas W., Anode assembly for plating and planarizing a conductive layer.
  2. Yang, Michael X.; Kovarsky, Nicolay Y., Anolyte for copper plating.
  3. Ho, Shu Chuen; Yip, Kai Fat; Chng, Eng Cheng; Ngo, Yew Lan; Damodaran, Saravana Ranganathan, Apparatus for electroplating a tooling for use in semiconductor device encapsulation.
  4. Kovarsky,Nicolay; Yang,Michael; Lubomirsky,Dmitry, Contact plating apparatus.
  5. Herchen,Harald, Contact ring with embedded flexible contacts.
  6. Herchen,Harald; Lubomirsky,Dmitry; Zheng,Bo; Pang,Lily L., Electric field reducing thrust plate.
  7. Wylie,Ian W.; Anjur,Sriram P., Electrochemical-mechanical polishing system.
  8. Economikos, Laertis; Deligianni, Hariklia; Cotte, John M.; Grabarz, Henry J.; Chen, Bomy, Integrated plating and planarization process and apparatus therefor.
  9. Burkhart,Vincent E.; Herchen,Harald; Yahalom,Joseph, Liquid isolation of contact rings.
  10. Doi, Toshiro; Fujita, Takashi, Method and apparatus for chemical and mechanical polishing.
  11. Doi, Toshiro; Fujita, Takashi, Method and apparatus for chemical mechanical polishing.
  12. Petillo, Phillip J., Method and apparatus for generating hydrogen.
  13. Petillo, Phillip J.; Petillo, Stephen C., Method and apparatus for generating hydrogen.
  14. Mayer, Steven T.; Drewery, John S., Method and apparatus for uniform electropolishing of damascene IC structures by selective agitation.
  15. Mayer,Steven T.; Reid,Jonathan D.; Rea,Mark L.; Emesh,Ismail T.; Meinhold,Henner W.; Drewery,John S., Method for planar electroplating.
  16. Reid, Jonathan; Varadarajan, Sesha; Emekli, Ugur, Methods and apparatus for depositing copper on tungsten.
  17. Reid, Jonathan; Varadarajan, Sesha; Emekli, Ugur, Methods and apparatus for depositing copper on tungsten.
  18. Mayer, Steven T.; Porter, David W., Modulated metal removal using localized wet etching.
  19. Mayer, Steven T.; Drewery, John S.; Hill, Richard S.; Archer, Timothy M.; Kepten, Avishai, Selective electrochemical accelerator removal.
  20. Mayer, Steven T.; Drewery, John; Hill, Richard S.; Archer, Timothy; Kepten, Avishai, Selective electrochemical accelerator removal.
  21. Mayer, Steven T.; Stowell, Marshall R.; Drewery, John S.; Hill, Richard S.; Archer, Timothy M.; Kepten, Avishai, Selective electrochemical accelerator removal.
  22. Mayer, Steven T.; Rea, Mark L.; Hill, Richard S.; Kepten, Avishai; Stowell, R. Marshall; Webb, Eric G., Topography reduction and control by selective accelerator removal.
  23. Mayer, Steven T.; Rea, Mark L.; Hill, Richard S.; Kepten, Avishai; Stowell, R. Marshall; Webb, Eric G., Topography reduction and control by selective accelerator removal.
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