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Temperature control of electronic devices using power following feedback

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-031/02
출원번호 US-0352760 (1999-07-14)
발명자 / 주소
  • Thomas P. Jones
  • Jonathan E. Turner
  • Mark F. Malinoski
출원인 / 주소
  • Delta Design, Inc.
대리인 / 주소
    Foley & Lardner
인용정보 피인용 횟수 : 67  인용 특허 : 59

초록

A method for controlling a device temperature measures a parameter related to device power consumption and utilizes the parameter to control the device temperature. This can be achieved with a system including a heat exchanger, a power monitor, and a circuit which controls the temperature setting of

대표청구항

1. A method for controlling a temperature of a device under test with a thermal controller and a heat exchanger, the method comprising:measuring a parameter related to power consumption by the device; substantially determining the temperature of the device based on the equation: temperature of the d

이 특허에 인용된 특허 (59)

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  29. Herlein Richard F. (San Jose CA) Davis Jeffrey A. (Santa Clara CA) Cotriss E. James (San Jose CA), Method and apparatus for dynamically controlling the timing of signals in automatic test systems.
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  31. Taraci Richard (Phoenix AZ) Taraci Brian (Laguna Niguel CA) Gorgenyi Imre (Scottsdale AZ), Method and apparatus for maintaining electrically operating device temperatures.
  32. Taraci Richard (Phoenix AZ) Taraci Brian (Laguna Niguel CA) Gorgenyi Imre (Scottsdale AZ), Method and apparatus for maintaining electrically operating device temperatures.
  33. Schinabeck John (Pleasanton CA), Method and apparatus for monitoring automated testing of electronic circuits.
  34. Schinabeck John (Pleasanton CA) Murdock James R. (San Jose CA), Method and apparatus for monitoring response signals during automated testing of electronic circuits.
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  36. Hashinaga Tatsuya (Yokohama JPX) Nishiguchi Masanori (Yokohama JPX), Method and apparatus for varying temperature and electronic load conditions of a semiconductor device in a burn-in test.
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  44. Goto Masaharu (Hanno CO JPX) Koerner Christopher (Fort Collins CO), System and method for dynamic power compensation.
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  46. Eager George (Cambridge MA) Selverstone Pater (Cambridge MA), Temperature control for device under test.
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  49. Witkin ; Donald E. ; Bowles ; Arnold G., Temperature control method and apparatus.
  50. Tustaniwskyj Jerry Ihor ; Babcock James Wittman, Temperature control system for an electronic device in which device temperature is estimated from heater temperature and.
  51. Tustaniwskyj Jerry Ihor ; Babcock James Wittman, Temperature control system for an electronic device which achieves a quick response by interposing a heater between the.
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  53. Jones Elmer R., Test handler for DUT's.
  54. Igarashi Noriyuki,JPX ; Suzuki Kenpei,JPX, Test handler having turn table.
  55. West Burnell G. (Fremont CA) Herlein Richard F. (San Jose CA), Test period generator for automatic test equipment.
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  59. Stanley Gerald R. (Mishawaka IN), Thermal protection circuit for the die of a transistor.

이 특허를 인용한 특허 (67)

  1. Borkar, Shekhar Y., Active cooling to reduce leakage power.
  2. Borkar,Shekhar Y., Active cooling to reduce leakage power.
  3. Kabbani,Samer; Beyerle,Rick; Bachelder,Don, Active thermal control system with miniature liquid-cooled temperature control device for electronic device testing.
  4. Wall, Charles B.; Barnes, Cynthia M., Apparatus and method for controlling the temperature of an electronic device under test.
  5. Wall,Charles B.; Barnes,Cynthia M., Apparatus and method for controlling the temperature of an electronic device under test.
  6. Di Stefano, Thomas H., Apparatus to control device temperature utilizing multiple thermal paths.
  7. Di Stefano, Thomas H., Apparatus to control device temperature utilizing multiple thermal paths.
  8. Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.
  9. Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.
  10. Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.
  11. Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.
  12. Baquiano, Carmelo Engracia; Cayaban, Carmelo Delovino; Montalbo, Paul Francis Brosas; Celocia, Joseph Estorgio, Circuit board heatsink and heatframe structures with heater element for circuit board operation at below zero temperature.
  13. Patel, Chandrakant D.; Sharma, Ratnesh K.; Bash, Cullen E.; Beitelmal, Abdlmonem H., Controlled cooling of a data center.
  14. Patel,Chandrakant D.; Sharma,Ratnesh K.; Bash,Cullen E.; Beitelmal,Abdlmonem H., Controlled cooling of a data center.
  15. Martino, Peter, Damping vibrations within storage device testing systems.
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  17. Zhu,Xiaoxun; Liu,Yong; Au,Ka Man; Hou,Rui; Yu,Hongpeng; Tao,Xi; Liu,Liang; Zhang,Wenhua; Kotlarsky,Anatoly; Ghosh,Sankar; Schnee,Michael; Spatafore,Pasqual; Amundsen,Thomas; Byun,Sung; Schmidt,Mark; Russell,Garrett; Bonanno,John; Knowles,C. Harry, Digital imaging-based bar code symbol reading system employing a multi-mode illumination subsystem with far-field and near field led-based illumination arrays.
  18. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
  19. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
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  21. Kinsley, Tom, Electronic apparatus having IC temperature control.
  22. Kinsley, Tom, Electronic apparatus having IC temperature control.
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  24. Merrow, Brian S., Enclosed operating area for disk drive testing systems.
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  26. Campbell, Philip; Wrinn, Joseph F., Engaging test slots.
  27. Touzelbaev, Maxat, Feedforward temperature control of device under test.
  28. Wetzel, Stephen Aloysius; Trieu, Thanh, Heat sink pedestal with interface medium chamber.
  29. Yamashita,Tsuyoshi, Heater-equipped pusher, electronic component handling apparatus, and temperature control method for electronic component.
  30. Merrow, Brian S.; Akers, Larry W., Heating storage devices in a testing system.
  31. Walker, Winston Glenn; Saar, David A, Low power rf control system.
  32. Yoshida,Noboru; Taniguchi,Masato, Magnetic disk drive with parameter setting.
  33. Kumar,Arvind; O'Shea,David J., Method and an apparatus for managing power consumption of a server.
  34. Abadeer, Wagdi W.; Pilo, Harold; Seitzer, Daryl M., Method and apparatus for burn-in optimization.
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  42. Wetzel, Stephen Aloysius; Trieu, Thanh, Method of manufacturing a heat sink pedestal device with interface medium chamber.
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  46. Taylor, Troy; Callaway, Michael; Jones, Tom, Soak profiling.
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  49. Merrow, Brian S., Storage device testing system cooling.
  50. Merrow, Brian S., Storage device testing system cooling.
  51. Merrow, Brian S.; Akers, Larry W., Storage device testing system with a conductive heating assembly.
  52. Beaman,Daniel Paul; Florence, Jr.,Robert F.; Mahaney, Jr.,Howard Victor; Wright, IV,Frederic William, System, apparatus and method for controlling temperature of an integrated circuit under test.
  53. Jones, Thomas P.; Turner, Jonathan E.; Malinoski, Mark F., Temperature control of electronic devices using power following feedback.
  54. Merrow, Brian S., Temperature control within disk drive testing systems.
  55. Merrow, Brian S., Temperature control within disk drive testing systems.
  56. Merrow, Brian S., Temperature control within storage device testing systems.
  57. Stone, William M., Temperature-controlled thermal platform for automated testing.
  58. Stone, William M., Temperature-controlled thermal platform for automated testing.
  59. Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.
  60. Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.
  61. Merrow, Brian S., Thermal control system for test slot of test rack for disk drive testing system with thermoelectric device and a cooling conduit.
  62. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.
  63. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.
  64. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
  65. Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
  66. Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
  67. Merrow, Brian S., Vibration isolation within disk drive testing systems.
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