$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Method and apparatus for fixed abrasive substrate preparation and use in a cluster CMP tool 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/302
출원번호 US-0609590 (2000-06-30)
발명자 / 주소
  • John M. Boyd
  • Michael S. Lacy
출원인 / 주소
  • LAM Research Corporation
대리인 / 주소
    Brinks Hofer Gilson & Lione
인용정보 피인용 횟수 : 6  인용 특허 : 55

초록

A method of creating and using a polishing substrate having a coating layer that includes providing a substrate having a predetermined pattern disposed on a surface of the substrate and coating the surface of the substrate with an abrasive to form a coated substrate conforming to the predetermined p

대표청구항

1. A method of preparation and use of a polishing substrate to polish a semiconductor wafer comprising:providing a substrate having a substrate pattern on a surface of the substrate; coating the surface of the substrate with a coating layer; transferring the substrate to a chemical-mechanical polish

이 특허에 인용된 특허 (55)

  1. Rutherford Denise R. (Stillwater MN) Goetz Douglas P. (St. Paul MN) Thomas Cristina U. (Woodbury MN) Webb Richard J. (Inver Grove Heights MN) Bruxvoort Wesley J. (Woodbury MN) Buhler James D. (Shring, Abrasive construction for semiconductor wafer modification.
  2. Hoshizaki Jon A. ; Williams Roger O. ; Buhler James D. ; Reichel Charles A. ; Hollywood William K. ; De Geus Richard ; Lee Lawrence L., Apparatus for chemical mechanical polishing.
  3. Hyde Thomas C. (Chandler AZ) Roberts John V. H. (Newark DE), Apparatus for interlayer planarization of semiconductor material.
  4. Cote William J. (Poughquag NY) Ryan James G. (Newtown CT) Okumura Katsuya (Poughkeepsie NY) Yano Hiroyuki (Wappingers Falls NY), Apparatus for processing semiconductor wafers.
  5. Phillips James D. (Posen MI), Apparatus for trueing CBN abrasive belts and grinding wheels.
  6. Lund Douglas E. (13304 Purple Sage Dallas TX 75240), Automatic chemical and mechanical polishing system for semiconductor wafers.
  7. Smith Robert K. (52 Drayton Street Bowden ; 5007 AUX), Belt cleaner.
  8. Mohr Larry D. (5936 S. Dorsey La. Tempe AZ 85282), Belt cleaning apparatus.
  9. Takano Hiroshi (Hyogo JPX) Yokoyama Hiroshi (Hyogo JPX) Mizuno Takahide (Kobe JPX), Belt sleeve manufacturing method and apparatus.
  10. Shiraishi Yasushi,JPX, Chemical mechanical polishing device for a semiconductor wafer.
  11. Somekh Sasson, Chemical mechanical polishing with multiple polishing pads.
  12. Breivogel Joseph R. (Beaverton OR) Louke Sam F. (Portland OR) Oliver Michael R. (Tigard OR) Yau Leo D. (Portland OR), Composite polishing pad for semiconductor process.
  13. Englund Richard L. (St. Paul MN) Schwartz Thomas W. (St. Paul MN), Compounding, glazing or polishing pad.
  14. Shukla Jayendra G. (Marietta GA) Sohn Ki G. (Penn Yan NY) Twickler Carl (Milford CT) de Pierne Otto S. (E. Norwalk CT), Fixed ophthalmic lens polishing pad.
  15. Lustig Naftali E. (Croton-on-Hudson NY) Saenger Katherine L. (Ossining NY) Tong Ho-Ming (Yorktown Heights NY), In-situ endpoint detection and process monitoring method and apparatus for chemical-mechanical polishing.
  16. Hoffstein Mark F. (Newark DE) Shinagawa Takehisa (Sakai JPX), Inverted cell pad material for grinding, lapping, shaping and polishing.
  17. Talieh Homayoun (Santa Clara County CA) Weldon David Edwin (Santa Cruz County CA), Linear polisher and method for semiconductor wafer planarization.
  18. Trojan Daniel R. ; Lee Lawrence L., Low profile, low hysteresis force feedback gimbal system for chemical mechanical polishing.
  19. Pant Anil K. ; Young Douglas W. ; Breivogel Joseph R. ; Volodarski Konstantin ; Volfovski Leon, Method and apparatus for aligning and tensioning a pad/belt used in linear planarization for chemical mechanical polishi.
  20. Breivogel Joseph R. (Aloha OR) Price Matthew J. (Portland OR) Barns Christopher E. (Portland OR), Method and apparatus for conditioning a semiconductor polishing pad.
  21. Cadien Kenneth C. (Portland OR) Yau Leopoldo D. (Portland OR), Method and apparatus for conditioning of chemical-mechanical polishing pads.
  22. Robinson Karl M., Method and apparatus for conditioning polishing pads used in mechanical and chemical-mechanical planarization of substra.
  23. Hoshizaki Jon A. ; Williams Roger O. ; Buhler James D. ; Reichel Charles A. ; Hollywood William K. ; de Geus Richard ; Lee Lawrence L., Method for chemical mechanical polishing.
  24. Mattingly Wayne A. (Rio Rancho NM) Morimoto Seiichi (Beaverton OR) Preston Spencer E. (Portland OR), Method for conditioning the surface of a polishing pad.
  25. Schultz Laurence D. (Boise ID) Tuttle Mark E. (Boise ID) Doan Trung T. (Boise ID), Method for planarizing semiconductor wafers with a non-circular polishing pad.
  26. Meikle Scott G. (Boise ID) Marty Lucky F. (Scottsdale AZ), Method for selectively reconditioning a polishing pad used in chemical-mechanical planarization of semiconductor wafers.
  27. Bruxvoort Wesley J. ; Culler Scott R. ; Ho Kwok-Lun ; Kaisaki David A. ; Kessel Carl R. ; Klun Thomas P. ; Kranz Heather K. ; Messner Robert P. ; Webb Richard J. ; Williams Julia P., Method of modifying an exposed surface of a semiconductor wafer.
  28. Raina Kanwal K. ; Alwan James J., Methods of manufacturing microelectronic substrate assemblies for use in planarization processes.
  29. Gill Gerald L., Pad conditioner.
  30. Budinger William D. (Kennett Square PA) Jensen Elmer W. (Wilmington DE), Pad material for grinding, lapping and polishing.
  31. Andideh Ebrahim ; Prince Matthew J., Polish pad with non-uniform groove depth to improve wafer polish rate uniformity.
  32. Jensen Elmer W. (New Castle DE), Polishing apparatus and method using a rotary work holder travelling down a rail for polishing a workpiece with linear p.
  33. Baldy Andr (Seyssins FRX) Barrois Grard (Le Fontanil FRX) Blanc Henri (Saint Julien de Ratz FRX) Dominiak Marcel (Grenoble FRX), Polishing machine having a taut microabrasive strip and an improved wafer support head.
  34. Takizawa Gisaburo (Aichi JPX) Senda Tetsushi (Aichi JPX) Miura Shiro (Aichi JPX), Polishing method of goods and abrasive pad therefor.
  35. Tuttle Mark E. (Boise ID), Polishing pad.
  36. Pierce John M. (Palo Alto CA) Renteln Peter H. (Cupertino CA), Polishing pad and method for polishing semiconductor wafers.
  37. Talieh Homayoun (San Jose CA) Weldon David E. (Los Gatos CA), Polishing pad cluster for polishing a semiconductor wafer.
  38. Thomas Michael E. (Milpitas CA), Polishing pad for planarization.
  39. Takiyama Masahiro (Shiojiri JPX) Miyazaki Kunihiro (Shiojiri JPX) Shiozawa Kenichiro (Ashiya JPX), Polishing pad for semiconductor wafers.
  40. Tuttle Mark E. (Boise ID), Polishing pad with uniform abrasion.
  41. Roberts John V. H. (Newark DE), Polishing pads.
  42. Cook Lee M. (Steelville PA) Roberts John V. H. (Newark DE) Jenkins Charles W. (Newark DE) Pillai Raj R. (Newark DE), Polishing pads and methods for their use.
  43. Agarwal Vishnu K. ; Meikle Scott G., Polishing pads and planarizing machines for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies, and methods for making and using such pads and machines.
  44. Yu Chris C. (Austin TX), Polishing pads used to chemical-mechanical polish a semiconductor substrate.
  45. Kimura Tsuguji (5-7-17 Asahi-Chou Souka-City ; Saitama Prefec. 340 JPX) Watanabe Shinichi (4-4 Enkaiji Touyo-City ; Ehime Prefec. 799-13 JPX), Polishing sheet material and method for its production.
  46. Reinhardt Heinz F. (Chadds Ford PA) Roberts John V. H. (Newark DE) McClain Harry G. (Middletown DE) Budinger William D. (Newark DE) Jensen Elmer W. (New Castle DE), Polymeric polishing pad containing hollow polymeric microelements.
  47. Appel Andrew T. (Dallas TX) Chisholm Michael F. (Plano TX), Semiconductor substrate conditioning head having a plurality of geometries formed in a surface thereof for pad condition.
  48. Pant Anil K. ; Breivogel Joseph R. ; Young Douglas W. ; Jairath Rahul ; Engdahl Erik H., Sensors for a linear polisher.
  49. Jensen ; Jr. Elmer W. (Norwalk CT), Substrate containing fibers of predetermined orientation and process of making the same.
  50. Leach Michael A. (Bristol VT) Paulsen James K. (Jericho VT) Machesney Brian J. (Burlington VT) Venditti Daniel J. (Essex Junction VT) Whitaker Christopher R. (Jericho VT), System for mechanical planarization.
  51. Mogi Katsumi (Omiya JPX) Endo Osamu (Omiya JPX), Truing apparatus for wafer polishing pad.
  52. Klievoneit Harold R. (Phoenix AZ) Smith Arthur A. (Tucson AZ), Wafer grinder.
  53. Talieh Homayoun (San Jose CA) Weldon David E. (Los Gatos CA) Nagorski Boguslaw A. (San Jose CA), Wafer polishing machine with fluid bearings.
  54. Weldon David E. (Los Gatos CA) Nagorski Boguslaw A. (San Jose CA) Talieh Homayoun (San Jose CA), Wafer polishing machine with fluid bearings and drive systems.
  55. Simpson Steven C. (Kansas City MO) Witt Ronald D. (Kansas City MO) Volkland Gregory E. (Merriam KS), Wide belt sander cleaning device.

이 특허를 인용한 특허 (6)

  1. Dinh-Ngoc, Charles; Ramanath, Srinivasan; Schulz, Eric M.; Wu, Jianhui; Puthanangady, Thomas; Vedantham, Ramanujam; Hwang, Taewook, Abrasive tool for use as a chemical mechanical planarization pad conditioner.
  2. Wu, Jianhui; Hall, Richard W. J.; Schulz, Eric M.; Ramanath, Srinivasan, Chemical mechanical polishing conditioner.
  3. Wu, Jianhui; Hwang, Taewook; Vedantham, Ramanujam; Dinh-Ngoc, Charles; Puthanangady, Thomas K.; Schulz, Eric M.; Ramanath, Srinivasan, Corrosion-resistant CMP conditioning tools and methods for making and using same.
  4. Boyd, John M.; Lacy, Michael S., Method and apparatus for fixed abrasive substrate preparation and use in a cluster CMP tool.
  5. Lefevre, Paul Andre; Allison, William C.; Simpson, Alexander William; Scott, Diane; Huang, Ping; Charns, Leslie M.; Rinehart, James Richard; Kerprich, Robert, Polishing pad having polishing surface with continuous protrusions.
  6. Masumura, Hisashi; Suzuki, Fumio; Kitagawa, Kouji, Workpiece holder for polishing, workpiece polishing apparatus and polishing method.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로