초록 ▼

A programmable logic device (PLD) can be reconfigured without losing state data derived from logical operations performed using a previous logic configuration. One PLD in accordance with the invention includes a number of configurable logic blocks (CLBs) and input/output blocks (IOBs). Each CLB and

A programmable logic device (PLD) can be reconfigured without losing state data derived from logical operations performed using a previous logic configuration. One PLD in accordance with the invention includes a number of configurable logic blocks (CLBs) and input/output blocks (IOBs). Each CLB and IOB includes a number of configuration memory cells adapted to store the logical function of the FPGA. Each CLB and IOB additionally includes user storage elements adapted to store state data that-results from the PLD performing a programmed logical function, such as a selected combinatorial function of input signals. The PLD preserves the data stored in the user storage element as the PLD is reconfigured. The user data is therefore available for use by the PLD after the PLD is reconfigured to perform a new logic function.

대표청구항 ▼

A programmable logic device (PLD) can be reconfigured without losing state data derived from logical operations performed using a previous logic configuration. One PLD in accordance with the invention includes a number of configurable logic blocks (CLBs) and input/output blocks (IOBs). Each CLB and

A programmable logic device (PLD) can be reconfigured without losing state data derived from logical operations performed using a previous logic configuration. One PLD in accordance with the invention includes a number of configurable logic blocks (CLBs) and input/output blocks (IOBs). Each CLB and IOB includes a number of configuration memory cells adapted to store the logical function of the FPGA. Each CLB and IOB additionally includes user storage elements adapted to store state data that-results from the PLD performing a programmed logical function, such as a selected combinatorial function of input signals. The PLD preserves the data stored in the user storage element as the PLD is reconfigured. The user data is therefore available for use by the PLD after the PLD is reconfigured to perform a new logic function. bstantial part of said center portion, said elastic coating having relatively low electrical conductivity and relatively high elasticity, said elastic coating serving to substantially enhance the resilient characteristics of said length of conductive material. 12. In a wafer probing apparatus, an improved probe pin as recited in claim 11 wherein said length of conductive material is selected from the group consisting of gold, platinum, nickel, tungsten, copper and alloys thereof, electrically conductive plastics, stainless steel, electrically conductive polymer composites, berilium copper, rhenium tungsten and neodymium. 13. In a wafer probing apparatus, an improved probe pin as recited in claim 11 wherein said elastic coating is Nitinium. 14. In a wafer probing apparatus, an improved probe pin as recited in claim 11 wherein said center portion is substantially straight and said tip end portion is canted relative to the longitudinal axis of said center portion at an angle of θ degrees wherein θ is within the range of 0°-12°. 15. In a wafer probing apparatus, an improved probe pin as recited in claim 11 wherein said center portion is curved. 16. In a wafer probing apparatus, an improved probe pin as recited in claim 13 wherein said elastic coating is uniformly distributed along the length of said center portion. 17. In a wafer probing apparatus, an improved probe pin as recited in claim 13 wherein said elastic coating is asymmetrical about the axis of said center portion. 18. In a wafer probing apparatus, an improved probe pin as recited in claim 13 wherein said elastic coating is asymmetric about at least one orthogonal axis in a plane transverse to the length of said center portion. 19. In a wafer probing apparatus, an improved probe pin as recited in any of claims 11, 12, 14 and 15 wherein said elastic coating is Nitinium. 20. In a wafer probing apparatus, an improved probe pin as recited in any of claims 10, 12, 14 and 15 wherein said elastic coating is selected from the group of materials consisting of metals, alloys, ceramics, polymer composites and hybrid materials known to those skilled in the art to have properties substantially equivalent to the properties of Nitinium.