System and method for calibrating a thermocouple sensor
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G01K-015/00
G01K-001/14
출원번호
US-0688751
(2000-10-16)
발명자
/ 주소
Koh, Hock Chuan
Chen, Kah Shan
Ajmer, Justin Valentino
출원인 / 주소
Advanced Micro Devices, Inc.
대리인 / 주소
Foley & Lardner
인용정보
피인용 횟수 :
4인용 특허 :
9
초록▼
A jig assembly for use in calibrating a thermocouple sensor includes a conductive member, a holder, and a fastener. The conductive member has a recess configured to receive a test wire and a test surface configured for thermal contact with the thermocouple sensor. The holder is adapted to receive th
A jig assembly for use in calibrating a thermocouple sensor includes a conductive member, a holder, and a fastener. The conductive member has a recess configured to receive a test wire and a test surface configured for thermal contact with the thermocouple sensor. The holder is adapted to receive the conductive member. The fastener is coupleable to the holder, wherein the holder and fastener form a recess configured to receive the test wire.
대표청구항▼
A jig assembly for use in calibrating a thermocouple sensor includes a conductive member, a holder, and a fastener. The conductive member has a recess configured to receive a test wire and a test surface configured for thermal contact with the thermocouple sensor. The holder is adapted to receive th
A jig assembly for use in calibrating a thermocouple sensor includes a conductive member, a holder, and a fastener. The conductive member has a recess configured to receive a test wire and a test surface configured for thermal contact with the thermocouple sensor. The holder is adapted to receive the conductive member. The fastener is coupleable to the holder, wherein the holder and fastener form a recess configured to receive the test wire. .; US-4572387, 19860200, Luker et al.; US-4598835, 19860700, Brownbill; US-4623070, 19861100, Nishikawa; US-4635808, 19870100, Nolan; US-4655356, 19870400, Fuchs; US-4664279, 19870500, Obrist et al.; US-4667838, 19870500, Yeager; US-4682700, 19870700, Montgomery et al.; US-4708255, 19871100, Thompson; US-4726484, 19880200, Lutz; US-4739893, 19880400, Zumbuhl; US-4768669, 19880900, Zane et al.; US-4770306, 19880900, Szczesniak; US-4793506, 19881200, Thompson; US-4805792, 19890200, Lecinski, Jr.; US-4811857, 19890300, Thompson; US-4823967, 19890400, Thompson; US-4856668, 19890800, Pfefferkorn; US-4872304, 19891000, Thompson; U
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이 특허에 인용된 특허 (9)
Derderian, Gregory; Orlandi, Robert D.; Shu, Larry S.; Siadat, Bahram, Apparatus and method for heat flow measurement.
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