초록 ▼

A housing is described for use in preparing a sample for chemical analysis, the housing having a sample entrance, a sample exit, and a passageway therebetween; the housing further comprising at least three ridges, the ridges integral with the housing, depending into the passageway, and defining a su

A housing is described for use in preparing a sample for chemical analysis, the housing having a sample entrance, a sample exit, and a passageway therebetween; the housing further comprising at least three ridges, the ridges integral with the housing, depending into the passageway, and defining a supporting profile for holding a sorbent retaining member.

대표청구항 ▼

A housing is described for use in preparing a sample for chemical analysis, the housing having a sample entrance, a sample exit, and a passageway therebetween; the housing further comprising at least three ridges, the ridges integral with the housing, depending into the passageway, and defining a su

A housing is described for use in preparing a sample for chemical analysis, the housing having a sample entrance, a sample exit, and a passageway therebetween; the housing further comprising at least three ridges, the ridges integral with the housing, depending into the passageway, and defining a supporting profile for holding a sorbent retaining member. ng areas are reconfigured to replace unusable faulty PLBs with spare PLBs. Spare PLBs are initially allocated throughout the working area. Specifically, each operational PLB within the working area is allocated an adjacent preferred spare PLB. Predetermined configurations of the FPGA utilizing the preferred spares are used to avoid the faulty PLBs. If the initially allocated spares are incapable of utilization, then a subsequent portion of the PLBs within the working area are allocated as spares and new replacement configurations determined. As the number of spare PLBs is diminished over time, additional spare PLBs are at some point necessarily removed from the self-testing areas. In this manner, the testing and roving capabilities of the self-testing area are also inevitably diminished. Eventually, roving, testing, and even operation of the FPGA will cease.