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Method and apparatus for multidomain data analysis 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01B-011/28
  • G06K-009/00
출원번호 US-0542724 (2000-04-04)
발명자 / 주소
  • Sidorowich, John J.
출원인 / 주소
  • Therma-Wave, Inc.
대리인 / 주소
    Stallman & Pollock LLP
인용정보 피인용 횟수 : 36  인용 특허 : 19

초록

An optical measuring device generates a plurality of measured optical data from inspection of a thin film stack. The measured optical data group naturally into several domains. In turn the thin film parameters associated with the data fall into two categories: local and global. Local "genes" represe

대표청구항

An optical measuring device generates a plurality of measured optical data from inspection of a thin film stack. The measured optical data group naturally into several domains. In turn the thin film parameters associated with the data fall into two categories: local and global. Local "genes" represe

이 특허에 인용된 특허 (19)

  1. Ngo John-Thomas Calderon (Sunnyvale CA) Bhadkamkar Neal Ashok (Palo Alto CA), Adaptive filter for signal processing and method therefor.
  2. Allen Bradley P. (Hermosa Beach CA), Autonomous learning and reasoning agent.
  3. Winston Patrick H. (88 Monument St. Concord MA 01742), Data processing system and method for searching for improved results from a process.
  4. Shaefer Craig G. (Charlestown MA), Genetic algorithm.
  5. Harvey Robert L. (Lexington MA), Genetic algorithm technique for designing neural networks.
  6. McCormack Michael D. (Plano TX) Feldman D. Scott (Anchorage AK) Bowling Chester M. (Evergreen CO), Genetic method of scheduling the delivery of non-uniform inventory.
  7. Tolson Michael (Mill Valley CA), Image processing using genetic mutation of neural network parameters.
  8. Weininger David (Santa Fe NM), Method and apparatus for designing molecules with desired properties by evolving successive populations.
  9. Chow Wanyee Apple ; Chen Ming C. ; Lin Yung-Tao ; Shiau Ying, Method and apparatus for inspecting manufactured products for defects in response to in-situ monitoring.
  10. Opsal Jon ; Sidorowich John J., Method and apparatus for optical data analysis.
  11. Opsal Jon ; Sidorowich John J., Method and apparatus for optical data analysis.
  12. Horie Masahiro (Kamikyo JPX) Fujiwara Nariaki (Kamikyo JPX) Kokubo Masahiko (Kamikyo JPX), Method of measuring film thicknesses.
  13. Koza John R. (25372 La Rena La. Los Altos CA 94022) Rice James P. (Redwood City CA), Non-linear genetic process for data encoding and for solving problems using automatically defined functions.
  14. Koza John R. (25372 La Rena La. Los Altos Hills CA 94022) Rice James P. (Redwood City CA), Non-linear genetic process for use with plural co-evolving populations.
  15. Wada Yorio (Suginami JPX) Hyakumura Kazushi (Hachiouji JPX), Optical measuring device of film thickness.
  16. Shaefer Craig G. (Charlestown MA), Optimization techniques using genetic algorithms.
  17. Wagner John S., System for identifying known materials within a mixture of unknowns.
  18. Lyon Bruce C. (Victor NY), System for integrating multiple genetic algorithm applications.
  19. Konsella Shane (Boise ID), Use of a genetic algorithm to optimize memory space.

이 특허를 인용한 특허 (36)

  1. Cantin, Jason F., Adaptive cataclysms in genetic algorithms.
  2. Cantin, Jason F., Controlling quarantining and biasing in cataclysms for optimization simulations.
  3. Cantin, Jason F., Controlling quarantining and biasing in cataclysms for optimization simulations.
  4. Kwak, Hidong; Krishnan, Shankar; Lee, Shing; Zou, Haixing, Measurement systems configured to perform measurements of a specimen and illumination subsystems configured to provide illumination for a measurement system.
  5. Den Boef, Arie Jeffrey Maria; Bleeker, Arno Jan; Van Dommelen, Youri Johannes Laurentius Maria; Dusa, Mircea; Kiers, Antoine Gaston Marie; Luehrmann, Paul Frank; Pellemans, Henricus Petrus Maria; Van Der Schaar, Maurits; Grouwstra, Cedric Desire; Van Kraaij, Markus Gerardus Martinus, Method and apparatus for angular-resolved spectroscopic lithography characterization.
  6. Den Boef, Arie Jeffrey Maria; Bleeker, Arno Jan; Van Dommelen, Youri Johannes Laurentius Maria; Dusa, Mircea; Kiers, Antoine Gaston Marie; Luehrmann, Paul Frank; Pellemans, Henricus Petrus Maria; Van Der Schaar, Maurits; Grouwstra, Cedric Desire; Van Kraaij, Markus Gerardus Martinus, Method and apparatus for angular-resolved spectroscopic lithography characterization.
  7. Den Boef, Arie Jeffrey Maria; Bleeker, Arno Jan; Van Dommelen, Youri Johannes Laurentius Maria; Dusa, Mircea; Kiers, Antoine Gaston Marie; Luehrmann, Paul Frank; Pellemans, Henricus Petrus Maria; Van Der Schaar, Maurits; Grouwstra, Cedric Desire; Van Kraaij, Markus Gerardus Martinus, Method and apparatus for angular-resolved spectroscopic lithography characterization.
  8. Den Boef, Arie Jeffrey; Bleeker, Arno Jan; Van Dommelen, Youri Johannes Laurentius Maria; Dusa, Mircea; Kiers, Antoine Gaston Marie; Luehrmann, Paul Frank; Pellemans, Henricus Petrus Maria; Van Der Schaar, Maurits; Grouwstra, Cédric Désiré; Van Kraaij, Markus Gerardus Martinus Maria, Method and apparatus for angular-resolved spectroscopic lithography characterization.
  9. Den Boef, Arie Jeffrey; Dusa, Mircea; Kiers, Antoine Gaston Marie; Van Der Schaar, Maurits, Method and apparatus for angular-resolved spectroscopic lithography characterization.
  10. Sidorowich,John J., Method and apparatus for multidomain data analysis.
  11. Nabatova Gabain,Nataliya; Wasai,Yoko, Method for analyzing thin-film layer structure using spectroscopic ellipsometer.
  12. Van der Schaar, Maurits; Den Boef, Arie Jeffrey; Mos, Everhardus Cornelis, Method of measurement, an inspection apparatus and a lithographic apparatus.
  13. Zhao,Qiang; Kaack,Torsten; Yoo,Sungchul; Tan,Zhengquan, Methods for measurement or analysis of a nitrogen concentration of a specimen.
  14. Zangooie,Shahin; Wen,Youxian; Pois,Heath; Opsal,Jon, Multiple tool and structure analysis.
  15. Sezginer,Abdurrahman; Johnson,Kenneth, Overlay metrology method and apparatus using more than one grating per measurement direction.
  16. Sezginer,Abdurrahman; Johnson,Kenneth, Overlay metrology method and apparatus using more than one grating per measurement direction.
  17. Saha, Gobinda; Kumar, Anil, Photoalignment materials having improved adhesion.
  18. Plumhoff, Jason, Process change detection through the use of evolutionary algorithms.
  19. Cantin, Jason F., Speculative asynchronous sub-population evolutionary computing utilizing a termination speculation threshold.
  20. O'Neil, Joseph Thomas, System for utilizing genetic algorithm to provide constraint-based routing of packets in a communication network.
  21. Ferringer, Matthew Phillip; Clifton, Ronald Scott; Thompson, Timothy Guy, Systems and methods for a core management system for parallel processing of an evolutionary algorithm.
  22. Ferringer, Matthew Phillip; Clifton, Ronald Scott; Thompson, Timothy Guy, Systems and methods for an application program interface to an evolutionary software program.
  23. Ferringer, Matthew Phillip; Thompson, Timothy Guy, Systems and methods for auto-adaptive control over converged results for multi-dimensional optimization.
  24. Ferringer, Matthew Phillip; Thompson, Timothy Guy, Systems and methods for box fitness termination of a job of an evolutionary software program.
  25. Ferringer, Matthew Phillip; Thompson, Timothy Guy, Systems and methods for generating feasible solutions from two parents for an evolutionary process.
  26. Fielden, John; Janik, Gary; Lee, Shing, Systems and methods for measurement of a specimen with vacuum ultraviolet light.
  27. Fielden, John; Janik, Gary; Lee, Shing, Systems and methods for measurement of a specimen with vacuum ultraviolet light.
  28. Fielden, John; Janik, Gary; Lee, Shing, Systems and methods for measurement of a specimen with vacuum ultraviolet light.
  29. Fielden,John; Janik,Gary; Lee,Shing, Systems and methods for measurement of a specimen with vacuum ultraviolet light.
  30. Janik,Gary, Systems and methods for measurement or analysis of a specimen using separated spectral peaks in light.
  31. Thompson, Timothy Guy; Ferringer, Matthew Phillip; DiPrinzio, Marc David; Clifton, Ronald Scott, Systems and methods for optimizing satellite constellation deployment.
  32. Smith, Patrick L.; Ferringer, Matthew Phillip, Systems and methods for prioritizing funding of projects.
  33. Ferringer, Matthew Phillip; Thompson, Timothy Guy; Clifton, Ronald Scott; DiPrinzio, Marc David, Systems and methods for supporting restricted search in high-dimensional spaces.
  34. Thompson, Timothy Guy; Ferringer, Matthew Phillip, Systems and methods for vector scalability of evolutionary algorithms.
  35. Cantin, Jason F., Using global and local catastrophes across sub-populations in parallel evolutionary computing.
  36. Cantin, Jason F., Using global and local catastrophes across sub-populations in parallel evolutionary computing.
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