IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0438541
(1999-11-12)
|
우선권정보 |
JP-0125891 (1999-05-06) |
발명자
/ 주소 |
|
출원인 / 주소 |
- Mitsubishi Denki Kabushiki Kaisha
|
대리인 / 주소 |
|
인용정보 |
피인용 횟수 :
21 인용 특허 :
4 |
초록
▼
In a semiconductor integrated circuit device supporting a boundary scan test, the state of an I/O cell is set under the control of a DC test control circuit through a boundary scan register utilized for the boundary scan test for setting an external terminal connected with a pad in a desired state.
In a semiconductor integrated circuit device supporting a boundary scan test, the state of an I/O cell is set under the control of a DC test control circuit through a boundary scan register utilized for the boundary scan test for setting an external terminal connected with a pad in a desired state. A semiconductor integrated circuit device allowing execution of a DC test without increasing the circuit area and signal propagation delay is provided.
대표청구항
▼
In a semiconductor integrated circuit device supporting a boundary scan test, the state of an I/O cell is set under the control of a DC test control circuit through a boundary scan register utilized for the boundary scan test for setting an external terminal connected with a pad in a desired state.
In a semiconductor integrated circuit device supporting a boundary scan test, the state of an I/O cell is set under the control of a DC test control circuit through a boundary scan register utilized for the boundary scan test for setting an external terminal connected with a pad in a desired state. A semiconductor integrated circuit device allowing execution of a DC test without increasing the circuit area and signal propagation delay is provided. 13134, 19960400, Cooperman; US-5517441, 19960500, Dietz et al.; US-5598115, 19970100, Holst; US-5642114, 19970600, Komoto et al.; US-5642322, 19970600, Yoneda; US-5646878, 19970700, Samra; US-5649149, 19970700, Stormon; US-5699288, 19971200, Kim et al.; US-5706224, 19980100, Srinivasan; US-5745488, 19980400, Thompson; US-5818786, 19981000, Yoneda; US-5818873, 19981000, Wall; US-5841874, 19981100, Kempke et al., 380/050; US-5860085, 19990100, Stormon; US-5870324, 19990200, Helwig et al.; US-5893931, 19990400, Peng; US-5920886, 19990700, Feldmeier; US-5930359, 19990700, Kempke; US-5933363, 19990800, Shindo; US-5940852, 19990800, Rangasayee et al.; US-5949696, 19990900, Threewitt; US-5949734, 19990900, Matano; US-6000008, 19991200, Simcoe; US-6006306, 19991200, Haywood; US-6011795, 20000100, Varghese et al., 370/392; US-6014732, 20000100, Naffziger; US-6044005, 20000300, Gibson et al., 365/049; US-6065064, 20000500, Satoh et al., 709/249; US-6081440, 20000600, Washburn et al., 365/049; US-6108227, 20000800, Voelkel; US-6108747, 20000800, Kaganoi; US-6144574, 20001100, Kobayashi et al.; US-6181698, 20010100, Hariguchi; US-6226710, 20010500, Melchoir; US-6237061, 20010500, Srinivasan et al., 711/108; US-6266262, 20010700, Washburn; US-6289414, 20010900, Feldmeier et al., 711/108
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