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Integrated ion implant scrubber system 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B01D-053/04
출원번호 US-0997393 (2001-11-29)
발명자 / 주소
  • Hayes, Michael W.
  • Holst, Mark R.
  • Arno, Jose I.
  • Tom, Glenn M.
출원인 / 주소
  • Advanced Technology Materials, Inc
대리인 / 주소
    Zitzmann, Oliver A.Hultquist, Steven J.
인용정보 피인용 횟수 : 9  인용 특허 : 18

초록

An ion implantation process system, including an ion implanter apparatus for carrying out an ion implantation process. A supply of source gas for the ion implantation process is arranged to flow to the ion implanter apparatus, which discharges an effluent gas stream including ionization products of

대표청구항

1. A process for treating an ion implant system effluent stream to remove acid gas and hydride components thereof, comprising contacting the effluent stream with a dry scrubber composition comprising CuO and MnOx,wherein x is from 1 to 2 inclusive, and wherein the ion implant system effluent stream

이 특허에 인용된 특허 (18)

  1. Holst Mark ; Balliew Patrick, Alternating wash/dry water scrubber entry.
  2. Tom Glenn M. (New Milford CT), Differential gas sensing in-line monitoring system.
  3. Hultquist Steven J. (Raleigh NC) Tom Glenn M. (New Milford CT), Dopant delivery system for semiconductor manufacture.
  4. Lane Scott ; Shah Dinesh ; Colman Ronald,GB2 ; Heading Liam R.,GB6 ; Simpson Eric,GBX, Flow-stabilized wet scrubber system for treatment of process gases from semiconductor manufacturing operations.
  5. Tom Glenn M. ; McManus James V. ; Olander W. Karl, Fluid storage and delivery system comprising high work capacity physical sorbent.
  6. Tom Glenn M. ; McManus James V. ; Olander W. Karl, Fluid storage and delivery system utilizing carbon sorbent medium.
  7. Tom Glenn M. (New Milford CT), In-line detector system for real-time determination of impurity concentration in a flowing gas stream.
  8. Tom Glenn M. (New Milford CT), In-line detector system for real-time determination of impurity concentration in a flowing gas stream.
  9. Kitahara Koichi (Kanagawa JPX) Shimada Takashi (Kanagawa JPX), Method for cleaning exhaust gases.
  10. Kitahara Koichi (Kanagawa JPX) Shimada Takashi (Kanagawa JPX) Akita Noboru (Kanagawa JPX) Hiramoto Tadashi (Kanagawa JPX) Sasaki Kohhei (Kanagawa JPX), Method for cleaning exhaust gases.
  11. Sugimori Yoshiaki,JPX ; Watanabe Tadaharu,JPX ; Kikuchi Hitoshi,JPX ; Endo Fumitaka,JPX ; Ichimura Shinji,JPX ; Yoshida Megumi,JPX ; Imai Hiroaki,JPX, Method for removing hydrides, alkoxides and alkylates out of a gas using cupric hydroxide.
  12. Miller Cynthia A. ; Tom Glenn M., Piezoelectric sensor for hydride gases, and fluid monitoring apparatus comprising same.
  13. Otsuka Kenji,JPX ; Arakawa Satoshi,JPX ; Nawa Youji,JPX, Process for cleaning harmful gas.
  14. Shimada Takashi (Hiratsuka JPX) Okumura Toshio (Hiratsuka JPX) Hatakeyama Toshiya (Hiratsuka JPX), Process for cleaning harmful gas.
  15. Delobel Olivier (Paris FRX) Louise Jean (Villejuif FRX) Cornut Philippe (Echirolles FRX), Process for removing gaseous hydrides from a solid support comprising metallic oxides.
  16. Tom Glenn M. ; McManus James V., Process system with integrated gas storage and delivery unit.
  17. Nowack Gerhard P. (Bartlesville OK) Johnson Marvin M. (Bartlesville OK) Cross Joseph B. (Bartlesville OK) Tooley Patricia A. (Bartlesville OK) Cymbaluk Ted H. (Bartlesville OK), Removal of trialkyl arsines from fluids.
  18. Tom Glenn M. (New Milford CT) McManus James V. (Danbury CT), Storage and delivery system for gaseous hydride, halide, and organometallic group V compounds.

이 특허를 인용한 특허 (9)

  1. Dietz, James; Bishop, Steven E.; McManus, James V.; Lurcott, Steven M.; Wodjenski, Michael J.; Kaim, Robert; DiMeo, Jr., Frank, Fluid storage and dispensing system including dynamic fluid monitoring of fluid storage and dispensing vessel.
  2. Dietz, James; Bishop, Steven E.; McManus, James V.; Lurcott, Steven M.; Wodjenski, Michael J.; Kaim, Robert; Dimeo, Jr., Frank, Fluid storage and dispensing system including dynamic fluid monitoring of fluid storage and dispensing vessel.
  3. Dietz, James; Bishop, Steven E.; McManus, James V.; Lurcott, Steven M.; Wodjenski, Michael J.; Kaim, Robert; Dimeo, Jr., Frank, Fluid storage and dispensing system including dynamic fluid monitoring of fluid storage and dispensing vessel.
  4. McManus, James V.; Dietz, James; Lurcott, Steven M., Fluid storage and dispensing system including dynamic fluid monitoring of fluid storage and dispensing vessel.
  5. Sweeney, Joseph D.; Marganski, Paul J.; Olander, W. Karl; Wang, Luping, Method and apparatus for the abatement of toxic gas components from a semiconductor manufacturing process effluent stream.
  6. Sweeney,Joseph D.; Marganski,Paul J.; Olander,W. Karl, Method and apparatus for the abatement of toxic gas components from a semiconductor manufacturing process effluent stream.
  7. Giurgiutiu, Victor; Bao, Jingjing; Peterson, Gregory William; Rubel, Glenn, Methods and sensors for the detection of active carbon filters degradation with EMIS-ECIS PWAS.
  8. Giurgiutiu, Victor; Bao, Jingjing; Peterson, Gregory William; Rubel, Glenn, Methods and sensors for the detection of active carbon filters degradation with EMIS-ECIS PWAS.
  9. Olander, W. Karl; Sweeney, Joseph D.; Wang, Luping, Semiconductor manufacturing facility utilizing exhaust recirculation.
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