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Latch circuitry has a data input stage for sampling a first input signal responsive to a first timing signal and generating a signal on an intermediate node in the latch circuitry. The latch circuitry also has a scan input stage for sampling a second input signal responsive to a second timing signal

Latch circuitry has a data input stage for sampling a first input signal responsive to a first timing signal and generating a signal on an intermediate node in the latch circuitry. The latch circuitry also has a scan input stage for sampling a second input signal responsive to a second timing signal, and generating a signal on the intermediate node. The latch circuitry also has an output stage for generating an output signal on an output node of the latch circuitry responsive to the signal on the intermediate node and a third timing signal. The data input signal has a maximum voltage level and at least one stage of the latch circuitry is operable to effectively shift the voltage level so that the output signal has a higher maximum voltage level than that of the data input signal.

대표청구항 ▼

Latch circuitry has a data input stage for sampling a first input signal responsive to a first timing signal and generating a signal on an intermediate node in the latch circuitry. The latch circuitry also has a scan input stage for sampling a second input signal responsive to a second timing signal

Latch circuitry has a data input stage for sampling a first input signal responsive to a first timing signal and generating a signal on an intermediate node in the latch circuitry. The latch circuitry also has a scan input stage for sampling a second input signal responsive to a second timing signal, and generating a signal on the intermediate node. The latch circuitry also has an output stage for generating an output signal on an output node of the latch circuitry responsive to the signal on the intermediate node and a third timing signal. The data input signal has a maximum voltage level and at least one stage of the latch circuitry is operable to effectively shift the voltage level so that the output signal has a higher maximum voltage level than that of the data input signal. t measurement data referring to local measurements effected by said first local probe, and a second detection arrangement associated with the second local probe and adapted to independently detect second measurement data referring to local measurements effected by said second local probe; and a controller adapted to control via said positioning arrangement said distance relations on the basis of at least one of said first and second measurement data, wherein at least one of said first and second measurement conditions is adjusted on the basis of one of said first and second measurement data according to a time constant and is adjusted on the basis of the other of said first and second measurement data according to another time constant. 3. A local probe measuring device for effecting local measurements referring to a sample, comprising: a first local probe for local measurements with respect to a sample or a reference surface; a second local probe for local measurements with respect to the sample or the reference surface; a rigid mechanical coupling between the first local probe and the second local probe; a positioning arrangement adapted to commonly adjust distance relations of the probes with respect to the sample or the reference surface to commonly adjust a first measurement condition of the first local probe with respect to the sample or the reference surface, and a second measurement condition of the second local probe with respect to the sample or the reference surface; a detection arrangement comprising a first detection arrangement associated with the first local probe and adapted to independently detect first measurement data referring to local measurements effected by said first local probe, and a second detection arrangement associated with the second local probe and adapted to independently detect second measurement data referring to local measurements effected by said second local probe, wherein said second detection arrangement is adapted to detect a second interaction of said second local probe with the sample or the reference surface independently of any interaction of the first local probe with the sample or the reference surface to obtain said second measurement data, wherein a controller, said positioning arrangement and said detection arrangement are adapted to adjust said first measurement condition on the basis of said first measurement data and then to obtain said second measurement data for the resulting second measurement condition, or to adjust said second measurement condition on the basis of said second measurement data and then to obtain said first measurement data for the resulting first measurement condition, and wherein said controller and said detection arrangement are adapted to obtain first measurement data as a function of second measurement data or vice versa. 4. A local probe measuring device for effecting local measurements referring to a sample, comprising: a first local probe for local measurements with respect to a sample or a reference surface; a second local probe for local measurements with respect to the sample or the reference surface, a rigid mechanical coupling between the first local probe and the second local probe; a positioning arrangement adapted to commonly adjust distance relations of the probes with respect to the sample or the reference surface to commonly adjust a first measurement condition of the first local probe with respect to the sample or the reference surface, and a second measurement condition of the second local probe with respect to the sample or the reference surface; a detection arrangement comprising a first detection arrangement associated with the first local probe and adapted to independently detect first measurement data referring to local measurements effected by said first local probe, and a second detection arrangement associated with the second local probe and adapted to independently detect second mea surement data referring to local measurements effected by said second local probe; and a feedback control loop comprising said positioning arrangement and one of said first and second detection arrangements to stabilize at least one of said first and second measurement conditions, wherein said feedback control loop comprises two feedback control sub-loops, one comprising one of said first and second detection arrangements, and the other comprising the other of said first and second detection arrangements, said feedback control loops having different time constants. 5. A local probe measuring device for effecting local measurements referring to a sample, comprising: a first local probe for local measurements with respect to a sample or a reference surface; a second local probe for local measurements with respect to the sample or the reference surface; a rigid mechanical coupling between the first local probe and the second local probe; a positioning arrangement adapted to commonly adjust distance relations of the probes with respect to the sample or the reference surface to commonly adjust a first measurement condition of the first local probe with respect to the sample or the reference surface, and a second measurement condition of the second local probe with respect to the sample or the reference surface; a detection arrangement comprising a first detection arrangement associated with the first local probe and adapted to independently detect first measurement data referring to local measurements effected by said first local probe, and a second detection arrangement associated with the second local probe and adapted to independently detect second measurement data referring to local measurements effected by said second local probe, wherein a distance between interaction or measurement sections of said local probes in a height direction associated with said sample or said reference surface is adjustable. 6. The device according to claim 5, wherein the distance is adjustable by tilting at least one of a mounting arrangement of said local probes and a probe substrate integral with said local probes. 7. A local probe measuring device for effecting local measurements referring to a sample, comprising: a first local probe for local measurements with respect to a sample or a reference surface; a second local probe for local measurements with respect to the sample or the reference surface; a rigid mechanical coupling between the first local probe and the second local probe; a positioning arrangement adapted to commonly adjust distance relations of the probes with respect to the sample or the reference surface to commonly adjust: a) a first measurement condition of the first local probe with respect to the sample or the reference surface, and b) a second measurement condition of the second local probe with respect to the sample or the reference surface; a detection arrangement comprising a first detection arrangement associated with the first local probe and adapted to independently detect first measurement data referring to local measurements effected by said first local probe and a second detection arrangement associated with the second local probe and adapted to independently detect second measurement data referring to local measurements effected by said second local probe, wherein said detection arrangement comprises a piezo-electrical detection arrangement, and wherein at least one of said local probes comprises piezo-electrical material sensitive to movements of the respective local probe. 8. A local probe measuring device for measuring local interactions between a local probe arrangement and a sample, comprising: a first local probe adapted to interact locally with a sample or a reference surface; a second local probe adapted to interact locally with a sample or the reference surface; a rigid mechanical coupling between the first local probe and the second local probe; a positioning