IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0353602
(1999-07-14)
|
우선권정보 |
JP-0214776 (1998-07-15) |
발명자
/ 주소 |
- Nagao, Yoshitaka
- Takabayashi, Akiharu
|
출원인 / 주소 |
|
대리인 / 주소 |
Fitzpatrick, Cella, Harper & Scinto
|
인용정보 |
피인용 횟수 :
25 인용 특허 :
1 |
초록
▼
A computer processing method for designing an installation layout of solar cell modules on an installation surface of a photovoltaic power generation system is provided. Installation information of the solar cell modules are automatically calculated so as to be fit within the installable area of the
A computer processing method for designing an installation layout of solar cell modules on an installation surface of a photovoltaic power generation system is provided. Installation information of the solar cell modules are automatically calculated so as to be fit within the installable area of the installation surface on the basis of information on the solar cell module, information on the installation surface, and information on installation conditions of the solar cell modules, and the calculated installation information is outputted.
대표청구항
▼
A computer processing method for designing an installation layout of solar cell modules on an installation surface of a photovoltaic power generation system is provided. Installation information of the solar cell modules are automatically calculated so as to be fit within the installable area of the
A computer processing method for designing an installation layout of solar cell modules on an installation surface of a photovoltaic power generation system is provided. Installation information of the solar cell modules are automatically calculated so as to be fit within the installable area of the installation surface on the basis of information on the solar cell module, information on the installation surface, and information on installation conditions of the solar cell modules, and the calculated installation information is outputted. r adjusting an adaptive interleaver in response to performance parameters of a transmission system. f a pattern vector other than said first predetermined vector fails, sequentially driving a second set of pattern vectors on said DUT, wherein a second predetermined vector of said second set of pattern vectors comprises said pattern vector under test, and outputting said trigger signal having a second value in association said sequentially driving said second set of pattern vectors. 12. The program product of claim 11 further including instructions for performing the step of, if said first predetermined vector fails, repeating said step of sequentially driving said first set of pattern vectors on said DUT. 13. The program product of claim 11 further including instructions for performing the steps of, if no pattern vector fails: repeating said step of sequentially driving said second set of pattern vectors on said DUT and outputting said trigger signal having said second value in association with said sequentially driving said second set of pattern vectors; and varying a device parameter of said DUT until at least one of said second set of pattern vector fails. 14. The program product of claim 13 wherein said step of varying said device parameter comprises the step of raising a temperature of said DUT. 15. The program product of claim 11 further including programming for performing the steps of: if said second predetermined pattern vector fails, repeating said step of sequentially driving said first set of pattern vectors on said DUT and outputting said trigger signal having said first value in association with said sequentially driving said first set of pattern vectors. 16. The program product of claim 15 further including instructions for performing the steps of, if said second predetermined pattern vector does not fail, repeating sequentially driving said second set of pattern vectors on said DUT, and outputting said trigger signal having a second value in association said sequentially driving said second set of pattern vectors; and varying a device parameter of said DUT until at least one of said second set of pattern vector fails. 17. The program product of claim 16 wherein said step of varying said device parameter comprises the step of raising a temperature of said DUT. 18. The program product of claim 11 wherein said trigger signal is operable for correlating a failure of said pattern under test and a structural portion of said DUT. 19. A data processing system comprising: circuitry operable for sequentially driving a first set of pattern vectors on a device under test (DUT), wherein a first predetermined vector of said first set of pattern vectors comprises a pattern vector under test, and outputting a trigger signal having a first value in association with said sequentially driving said first set of pattern vectors; circuitry operable for, if a pattern vector other than said first predetermined vector fails, sequentially driving a second set of pattern vectors on said DUT, wherein a second predetermined vector of said second set of pattern vectors comprises said pattern vector under test, and outputting said trigger signal having a second value in association said sequentially driving said second set of pattern vectors. 20. The data processing system of claim 19 further including circuitry operable for, if said first predetermined vector fails, repeating said step of sequentially driving said first set of pattern vectors on said DUT. 21. The data processing system of claim 19 further including circuitry operable for, if no pattern vector fails: repeating said step of sequentially driving said second set of pattern vectors on said DUT and outputting said trigger signal having said second value in association with said sequentially driving said second set of pattern vectors; and varying a device parameter of said DUT until at least one of said second set of pattern vector fails. 22. The data processing system of claim 21 wherein said step of varying said device parameter comprises the step of raising a temperature of said DUT. 23. The data processing system of claim 19 further including: circuitry operable for, if said second predetermined pattern vector fails, repeating said step of sequentially driving said first set of pattern vectors on said DUT and outputting said trigger signal having said first value in association with said sequentially driving said first set of pattern vectors. 24. The data processing system of claim 23 further including: circuitry operable for, if said second predetermined pattern vector does not fail, repeating sequentially driving said second set of pattern vectors on said DUT, and outputting said trigger signal having a second value in association said sequentially driving said second set of pattern vectors; and circuitry operable for varying a device parameter of said DUT until at least one of said second set of pattern vector fails. 25. The data processing system of claim 24 wherein said step of varying said device parameter comprises the step of raising a temperature of said DUT. 26. The data processing system of claim 19 wherein said trigger signal is operable for correlating a failure of said pattern under test and a structural portion of said DUT. iscriminator for comparing the transmitted output signal level to a predetermined target output signal level, and if similar, transmitting a positive test result signal. ection unit. 9. A method, comprising: receiving at a first interface operational state data of a processing tool related to the manufacture of a processing piece; receiving additional state data of the processing tool from a sensor that is coupled to the processing tool at a second interface; sending the state data from the first interface to a controller; sending the additional state data to the controller as it is received at the second interface; accumulating the state data and the additional state data at the controller; sending the accumulated state data from the controller to a fault detection unit upon occurrence of a predetermined event; determining if a fault condition exists with the processing tool based upon the accumulated state data; and performing a predetermined action on the processing tool in response to the presence of a fault condition. 10. The method of claim 9, further comprising: translating the state data at the second interface from a first communications protocol used by the sensor to a second communications protocol used by the controller. 11. A method, comprising: receiving at a first interface operational state data of a processing tool related to the manufacture of a processing piece; sending the state data from the first interface to a controller; accumulating the state data at the controller; sending the accumulated state data from the controller to a fault detection unit upon completion of a lot of processing pieces processed by the tool; determining if a fault condition exists with the processing tool based upon the state data; and performing a predetermined action on the processing tool in response to the presence of a fault condition. 12. A system, comprising: a processing tool adapted to manufacture a processing piece; a first interface, coupled to the processing tool, the first interface adapted to receive operational state data of the processing tool related to the manufacture of the processing piece; a fault detection unit adapted to determine if a fault condition exists with the processing tool based on said operational state data; and a framework adapted to receive the state data from the first interface, to send the data to the fault detection unit, and to perform a predetermined action on the processing tool in response to the presence of a fault condition; and wherein the framework includes: a controller adapted to receive and accumulate the state data as the data is received by the first interface, and to send the state data to the fault detection unit upon occurrence of a predetermined event; and a second interface, coupled between the first interface and the controller, the second interface adapted to receive the state data from the first interface, and to translate the state data between a first communications protocol used by the first interface and a second communications protocol used by the framework. 13. The system of claim 12, wherein the second interface is further adapted to send the translated state data to the controller. 14. The system of claim 12, wherein the framework further includes: a third interface, coupled between the controller and the fault detection unit, and adapted to receive the state data from the controller prior to sending the data to the fault detection unit. 15. The system of claim 14, wherein the third interface is further adapted to translate the state data from the second communications protocol used by the framework to a third communications protocol used by the fault detection unit. 16. The system of claim 15, wherein the framework is an Advanced Process Control (APC) framework, and the second communications protocol used by the framework is a Common Object Request Broker Architecture Interface Definition Language (CORBA IDL). 17. The system of claim 14, wherein the third interface is further adapted to send an alarm signal to the controller providing that a fault condition was determined by the fa ult detection unit. 18. The system of claim 17, wherein the controller is further adapted to send a control signal to the first interface reflective of the predetermined action providing that a fault condition exists. 19. The system of claim 18, wherein the predetermined action is to shut down the processing tool. 20. The system of claim 12, wherein the fault detection unit is further adapted to compare the state data of the processing tool and processing piece to predetermined state data to determine the presence of the fault condition. 21. The system of claim 12, wherein the processing tool is a semiconductor fabrication tool, and the processing piece is a silicon wafer. 22. A system, comprising: a processing tool adapted to manufacture a processing piece; a first interface, coupled to the processing tool, the first interface adapted to receive operational state data of the processing tool related to the manufacture of the processing piece; a fault detection unit adapted to determine if a fault condition exists with the processing tool based on said operational state data; a framework adapted to receive the state data from the first interface, to send the data to the fault detection unit, and to perform a predetermined action on the processing tool in response to the presence of a fault condition; a sensor, coupled to the processing tool, the sensor adapted to receive additional state data from the processing tool; and wherein the framework includes: a controller adapted to receive and accumulate the state data and the additional state data as it is received by the first interface, and to send the accumulated state data to the fault detection unit upon occurrence of a predetermined event; and a second interface, coupled between the sensor and the controller, the second interface adapted to receive the additional state data from the sensor, and to translate the additional state data between a first communications protocol used by the sensor and a second communications protocol used by the framework. 23. A system, comprising: a processing tool adapted to manufacture a processing piece; a first interface, coupled to the processing tool, the first interface adapted to receive operational state data of the processing tool related to the manufacture of the processing piece; a fault detection unit adapted to determine if a fault condition exists with the processing tool based on said operational state data; and an advanced process control (APC) framework adapted to receive the state data from the first interface, to send the data to the fault detection unit, and to perform a predetermined action on the processing tool in response to the presence of a fault condition. and Joseph P. Coyle. 6) Ser. No. 09/387,120, entitled "Method and Apparatus for Programmable Adjustment of Computer System Bus Parameters" (P3614) filed on even date herewith by Garry M. Tobin and Joseph P. Coyle. 7) Ser. No. 09/386,985, entitled "Method and Apparatus for HASS Testing of Busses Under Programmable Control" (P3723) filed on even date herewith by Joseph P. Coyle and Garry M. Tobin.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.