IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0850863
(2001-05-08)
|
발명자
/ 주소 |
|
출원인 / 주소 |
|
대리인 / 주소 |
Westman, Champlin & Kelly, P.A.
|
인용정보 |
피인용 횟수 :
13 인용 특허 :
10 |
초록
▼
A method of the invention allows the determination of aircraft sideslip using an air data probe and an inertial reference unit. A lateral sideslip component βLof the aircraft is calculated as a function of inertial flight information. An angular sideslip component βAof the aircraft is also calculate
A method of the invention allows the determination of aircraft sideslip using an air data probe and an inertial reference unit. A lateral sideslip component βLof the aircraft is calculated as a function of inertial flight information. An angular sideslip component βAof the aircraft is also calculated as a function of inertial flight information. The lateral sideslip component βLand the angular sideslip component βAare combined to obtain a total sideslip angle βTOTALfor the aircraft. The total sideslip angle βTOTALcan be used to compensate static pressure, angle of attack and other aircraft parameters for sideslip effects.
대표청구항
▼
A method of the invention allows the determination of aircraft sideslip using an air data probe and an inertial reference unit. A lateral sideslip component βLof the aircraft is calculated as a function of inertial flight information. An angular sideslip component βAof the aircraft is also calculate
A method of the invention allows the determination of aircraft sideslip using an air data probe and an inertial reference unit. A lateral sideslip component βLof the aircraft is calculated as a function of inertial flight information. An angular sideslip component βAof the aircraft is also calculated as a function of inertial flight information. The lateral sideslip component βLand the angular sideslip component βAare combined to obtain a total sideslip angle βTOTALfor the aircraft. The total sideslip angle βTOTALcan be used to compensate static pressure, angle of attack and other aircraft parameters for sideslip effects. 9981200, Banez; US-5855128, 19990100, Voiculescu; US-5865044, 19990200, Wu; US-5870912, 19990200, Vito; US-5881587, 19990300, Vito; US-5887464, 19990300, Perez; US-5901586, 19990500, Hale; US-5906121, 19990500, Mankarious; US-5921115, 19990700, Winner; US-D412826, 19990800, Calpito; US-5996721, 19991200, Winner; US-6029483, 20000200, Daniels; US-6089055, 20000700, Vito; US-6116065, 20000900, Hale; US-D432390, 20001000, Geringer et al.; US-6131426, 20001000, Tarnofsky; US-6192724, 20010200, Vito; US-6202456, 20010300, Vickers; US-6212920, 20010400, Winner; US-6223568, 20010500, Wu; US-6223569, 20010500, Wu; US-6230527, 20010500, Wu; US-6240753, 20010600, Wu led "SYSTEM AND METHOD FOR TESTING A CIRCUIT IMPLEMENTED ON A PROGRAMMABLE LOGIC DEVICE" invented by Chakravarthy K. Allamsetty.
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