Method for enhancing the contrast for a transmission electron microscope
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
H01J-047/00
G01N-023/00
출원번호
US-0623933
(2000-10-27)
우선권정보
DE-0011395 (1998-03-16)
국제출원번호
PCT/DE99/00727
(1999-03-12)
국제공개번호
WO99/47910
(1999-09-23)
발명자
/ 주소
Haking, Ansgar
Troster, Helmut
Richter, Karsten
Trendelenburg, Michael
출원인 / 주소
Deutsches Krebsforschungszentrum Stiftung Des Offentlichen Rechts
대리인 / 주소
Collard & Roe, P.C.
인용정보
피인용 횟수 :
1인용 특허 :
3
초록▼
The intention is to provide a process for the contrast enhancement of a specific particle in an image of a specimen, taken by a transmission electron microscope, in which a calculated contrast-rich image is created by way of the background intensities calculated from the intensities of a first image
The intention is to provide a process for the contrast enhancement of a specific particle in an image of a specimen, taken by a transmission electron microscope, in which a calculated contrast-rich image is created by way of the background intensities calculated from the intensities of a first image being drawn off pixel by pixel, whereby the background intensities are calculated as a function of the intensities of a second image. In this situation, it is intended that this process should feature a higher range of application than processes known hitherto, and, in particular, are well-suited for contrast enhancement for gold particles in immuno-gold marking. It is proposed, for this purpose, that the first image be taken under conditions in which the particle features the highest possible contrast, and that the second image is taken in a selected energy window which is selected in such a way that the contrast difference between the two images for the particle differs by the corresponding contrast difference for at least a second specimen constituent.
대표청구항▼
The intention is to provide a process for the contrast enhancement of a specific particle in an image of a specimen, taken by a transmission electron microscope, in which a calculated contrast-rich image is created by way of the background intensities calculated from the intensities of a first image
The intention is to provide a process for the contrast enhancement of a specific particle in an image of a specimen, taken by a transmission electron microscope, in which a calculated contrast-rich image is created by way of the background intensities calculated from the intensities of a first image being drawn off pixel by pixel, whereby the background intensities are calculated as a function of the intensities of a second image. In this situation, it is intended that this process should feature a higher range of application than processes known hitherto, and, in particular, are well-suited for contrast enhancement for gold particles in immuno-gold marking. It is proposed, for this purpose, that the first image be taken under conditions in which the particle features the highest possible contrast, and that the second image is taken in a selected energy window which is selected in such a way that the contrast difference between the two images for the particle differs by the corresponding contrast difference for at least a second specimen constituent. ven one image of the plurality of images being based upon the respective location of a corresponding one or more detectors of the plurality of detectors used to acquire said given one image; and processing the plurality of concurrent images to derive an output image of the target surface, including relative depth information based upon the differing apparent lighting direction from each one image of the plurality of concurrent images. 2. The method of claim 1, wherein the step of detecting comprises detecting light returning from an area of the target surface which is greater than an area defined the illuminated spot. 3. The method of claim 1, in which the step of processing comprises generating an orientation map of target surface normals based upon the first image and second image. 4. The method of claim 3, in which the step of processing further comprises the step of creating an orientation histogram from the orientation map and comparing the orientation histogram to one or more prototype orientation histograms to classify the target surface. 5. The method of claim 3, in which the step of processing further comprises the step of creating a depth map from the orientation map. 6. The method of claim 3, in which the step of processing further comprises the step of creating a 3-dimensional mesh from the depth map. 7. The method of claim 6, in which the step of processing comprises rendering the 3-dimensional mesh with virtual lighting and viewpoint to enhance either one or both of depth perception and surface topography. 8. The method of claim 6, in which the step of processing comprises computing two stereographic images from the 3-dimensional mesh in which a viewer's binocular disparity is calculated. 9. The method of claim 1, in which the step of processing comprises rendering the output image to exhibit enhanced surface topography in relation to each one of the plurality of concurrent images. 10. The method of claim 1, in which the step of processing comprises rendering the output image to exhibit enhanced lighting perspective relative to each one of the plurality of concurrent images. 11. The method of claim 1, in which the step of processing comprises rendering two stereographic images in which a viewer's binocular disparity is calculated, the two stereographic images being output images to a viewer's eyes. 12. The method of claim 1, wherein the output beam of light comprises visible light and ultraviolet light, wherein the first detector detects returning visible light and the second detector detects returning ultraviolet light. 13. The method of claim 1, wherein the output beam of light comprises visible light and infrared light, wherein a first detector of the plurality of detectors detects returning visible light and a second detector of the plurality of detectors detects returning infrared light. 14. The method of claim 1, in which the beam of light is an output beam of light emitting from a resonant waveguide, and further comprising, prior to the step of outputting the steps of: generating a first beam of light of a first color, a second beam of light of a second color and a third beam of light of a third color; and combining the first beam, the second beam and the third beam before entering the resonant waveguide, the combined first beam, second beam and third beam forming the output beam. 15. The method of claim 1, in which the output beam of light is a sequence of light pulses, and wherein the step of detecting is synchronized with the sequence of light pulses, the detected returning light at said given time corresponding to a given light pulse and said acquired pixel. 16. The method of claim 1 wherein the step of detecting returning light comprises detecting reflected light. 17. The method of claim 1 wherein the step of detecting returning light comprises detecting fluorescent light emitted from the target surface responsive to the output beam. 18. The method of claim 1 wherein the step of detecting ret
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이 특허에 인용된 특허 (3)
Kundmann Michael Karl ; Gubbens Alexander Jozef ; Friedman Stuart Lawrence ; Krivanek Ondrej L.,GB2, Automated adjustment of an energy filtering transmission electron microscope.
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