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Method for electrochemically depositing metal on a semiconductor workpiece 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C25D-021/12
출원번호 US-0732513 (2000-12-07)
발명자 / 주소
  • Chen, Linlin
  • Wilson, Gregory J.
  • McHugh, Paul R.
  • Weaver, Robert A.
  • Ritzdorf, Thomas L.
출원인 / 주소
  • Semitool, Inc.
대리인 / 주소
    Perkins Coie LLP
인용정보 피인용 횟수 : 235  인용 특허 : 94

초록

A process for metallization of a workpiece, such as a semiconductor workpiece. In an embodiment, an alkaline electrolytic copper bath is used to electroplate copper onto a seed layer, electroplate copper directly onto a barrier layer material, or enhance an ultra-thin copper seed layer which has bee

대표청구항

A process for metallization of a workpiece, such as a semiconductor workpiece. In an embodiment, an alkaline electrolytic copper bath is used to electroplate copper onto a seed layer, electroplate copper directly onto a barrier layer material, or enhance an ultra-thin copper seed layer which has bee

이 특허에 인용된 특허 (94)

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