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Cargo inspection apparatus and process 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-023/04
출원번호 US-0686048 (2000-10-11)
발명자 / 주소
  • Sychev, Boris S.
인용정보 피인용 횟수 : 68  인용 특허 : 5

초록

A cargo inspection apparatus and process includes scanning containers with x-rays along two different planes. Outputs from x-ray sensors along the two different planes are collected for use in establishing the presence of contraband within the container. Using the sensor output data, images of the c

대표청구항

A cargo inspection apparatus and process includes scanning containers with x-rays along two different planes. Outputs from x-ray sensors along the two different planes are collected for use in establishing the presence of contraband within the container. Using the sensor output data, images of the c

이 특허에 인용된 특허 (5)

  1. Krug Kristoph D. (Framingham MA) Ellenbogen Michael (West Newton MA) Hurd Paul J. (Norfolk MA) Tortora John O. (Westford MA), Detecting contraband by employing interactive multiprobe tomography.
  2. Krug Kristoph D. (Framingham MA) Aitkenhead William F. (Sharon MA) Eilbert Richard F. (Lincoln MA) Stillson Jeffrey H. (Nashua NH) Stein Jay A. (Framingham MA), Detecting explosives or other contraband by employing transmitted and scattered X-rays.
  3. Krug Kristoph D. (Framingham MA) Stein Jay A. (Framingham MA) Taylor Adam L. (Boston MA), Device and method for inspection of baggage and other objects.
  4. Krug Kristoph D. (Framingham MA) Stein Jay A. (Framingham MA) Taylor Adam L. (Boston MA), Device and method for inspection of baggage and other objects.
  5. Bjorkholm Paul J. (1801 Port Barmouth Newport Beach CA 92660) Le Khai M. (5071 Audrey Dr. Huntington Beach CA 92649) Moler Keith E. (2512 E. Willow St. ; No. 104 Long Beach CA 90806), Three-dimensional reconstruction based on a limited number of X-ray projections.

이 특허를 인용한 특허 (68)

  1. Might,Matthew B.; Ferderer,Mark A.; Bowser,Gary F., Angled-beam detection system for container inspection.
  2. Blackburn, Brandon W.; Hunt, Alan W.; Chichester, David L., Apparatus and methods for real-time detection of explosives devices.
  3. Mastronardi, Richard, Backscatter X-ray inspection van with top-down imaging.
  4. Cason, W. Randall, Backscatter inspection portal.
  5. Cason,W. Randall, Backscatter inspection portal.
  6. Kaminski, Joseph W., Beam forming apparatus.
  7. Kaminski, Joseph W., Beam forming apparatus.
  8. Akery, Alan, Cargo inspection system.
  9. Akery, Alan, Cargo inspection system.
  10. Kotowski, Andreas; Agrawal, Neeraj, Cargo scanning system with boom structure.
  11. Garfinkle,Jeffrey, Cargo security method and apparatus.
  12. Morton, Edward James, Combined scatter and transmission multi-view imaging system.
  13. Morton, Edward James, Combined scatter and transmission multi-view imaging system.
  14. Morton, Edward James; Baldwin, Francis; Kotowski, Andreas F., Compact mobile cargo scanning system.
  15. Morton, Edward James; Baldwin, Francis; Kotowski, Andreas F., Compact mobile cargo scanning system.
  16. Bendahan,Joseph, Computed tomography cargo inspection system and method.
  17. Morton, Edward James, Covert surveillance using multi-modality sensing.
  18. Morton, Edward James, Detector support structures for gantry scanner systems.
  19. Li,Jianmin; Liang,Zhizhong; Su,Jianjun; Sun,Shangmin; Zhang,Qing; Wan,Jing; Wang,Jianxin, Double-radiant-source framework for container detecting system.
  20. Morton, Edward James, Drive-through scanning systems.
  21. Bjorkholm, Paul, Dual angle radiation scanning of objects.
  22. Bjorkholm, Paul, Dual angle radiation scanning of objects.
  23. Bjorkholm, Paul, Dual energy radiation scanning of contents of an object.
  24. Bjorkholm,Paul, Dual energy radiation scanning of contents of an object.
  25. Bjorkholm, Paul, Dual energy radiation scanning of objects.
  26. Morton, Edward James; Kotowski, Andreas F., Four-sided imaging system and method for detection of contraband.
  27. Morton, Edward James, Gantry scanner systems.
  28. Gozani, Tsahi; Bendahan, Joseph; Brown, Craig Mathew; Langeveld, Willem Gerhardus Johannes; Stevenson, John David, High-energy X-ray-spectroscopy-based inspection system and methods to determine the atomic number of materials.
  29. Gozani, Tsahi; Bendahan, Joseph; Brown, Craig Matthew; Langevel, Willem G. J.; Stevenson, John David, High-energy X-ray-spectroscopy-based inspection system and methods to determine the atomic number of materials.
  30. Jarvi, Ari; Tykkylainen, Jarno; Morton, Edward James, Intelligent security management system.
  31. Langeveld, Willem Gerhardus Johannes; Bendahan, Joseph; Gozani, Tsahi; King, Michael; Strellis, Dan; Franco, Edward; Alfonso, Krystal R., Low-dose radiographic imaging system.
  32. Dugan, Peter; Finch, Robert L.; Paradis, Rosemary D., Material context analysis.
  33. Muenster, Matthias; Nittikowski, Joerg; Dreiseitel, Pia; Mader, Andreas; Heinkel, Rainer; Ries, Thomas; Naumann, Dirk; Siedenburg, Uwe, Method and apparatus for detecting a particular material in an object by means of electromagnetic radiation.
  34. Lüghausen, Kai Mark; Doll, Theodor, Method and device for detecting the structure of moving single items, in particular for detecting foreign particles in liquid or paste-like products.
  35. Klein, Albert, Method and device for the online determination of the ash content of a substance conveyed on a conveyor, and device for carrying out such an online determination.
  36. Beneke, Knut, Method for adjusting color in an image.
  37. Hasnah,Moumen O.; Chapman,Leroy Dean, Method for detecting a mass density image of an object.
  38. Wernick,Miles N.; Yang,Yongyi, Method for detecting a mass density image of an object.
  39. Pfander, Andreas; Hughes, Ronald James, Methods for improving processing speed for object inspection.
  40. Morton, Edward James; Kotowski, Andreas F., Mobile imaging system and method for detection of contraband.
  41. Mastronardi, Richard; Fleury, Dean; Schubert, Jeffrey R.; DiMare, Joseph; Schueller, Richard; Chalmers, Alexander, Multiple image collection and synthesis for personnel screening.
  42. Mastronardi, Richard; Fleury, Dean; Schubert, Jeffrey R.; DiMare, Joseph; Schueller, Richard; Chalmers, Alexander, Multiple image collection and synthesis for personnel screening.
  43. Mastronardi, Richard; Fleury, Dean; Schubert, Jeffrey R.; DiMare, Joseph; Schueller, Richard; Chalmers, Alexander, Multiple image collection and synthesis for personnel screening.
  44. Mastronardi, Richard; Fleury, Dean; Schubert, Jeffrey R.; DiMare, Joseph; Schueller, Richard; Chalmers, Alexander, Multiple image collection and synthesis for personnel screening.
  45. Clayton,James E.; Bjorkholm,Paul, Object examination by delayed neutrons.
  46. Gray, Stephen; Hughes, Ronald, Personnel screening system.
  47. Gray, Stephen; Hughes, Ronald, Personnel screening system.
  48. Gray, Stephen; Hughes, Ronald; Ryge, Peter; Kotowski, Andreas F., Personnel screening system.
  49. Gray, Stephen; Hughes, Ronald; Ryge, Peter; Kotowski, Andreas F., Personnel screening system.
  50. Gray, Stephen; Hughes, Ronald; Smith, Jerel, Personnel screening system.
  51. Morton, Edward James, Portable security inspection system.
  52. Suyama, Toshiyasu; Maruno, Tadashi; Sasaki, Toshihide; Sonoda, Junichi; Takihi, Shinji, Radiation detection device, radiation image acquiring system, radiation inspection system, and radiation detection method.
  53. Ford,John; Seppi,Edward J., Radiation scanning units including a movable platform.
  54. Seppi, Edward J.; Ford, John; Marc, Marcel, Radiation scanning units including a movable platform.
  55. Seppi, Edward J., Radiation scanning units with reduced detector requirements.
  56. Carver, James; Kotowski, Andreas F., Relocatable X-ray imaging system and method for inspecting commercial vehicles and cargo containers.
  57. Schmied, Ralf; Bauer, Walter; Runft, Werner; Bessler, Florian, Sensor device for a packaging machine.
  58. Testoni,Anne L., Spectrum simulation for semiconductor feature inspection.
  59. Langeveld, Willem Gerhardus Johannes; Gozani, Tsahi; Bendahan, Joseph, System and method for X-ray source weight reduction.
  60. Armistead, Jr., Robert A.; Chang, William; Franco, Edward D.; Bendahan, Joseph; Browne, Jolyon A., Systems and methods for automated, rapid detection of high-atomic-number materials.
  61. Armistead, Jr., Robert A.; Chang, William; Franco, Edward D.; Bendahan, Joseph; Browne, Jolyon A., Systems and methods for automated, rapid detection of high-atomic-number materials.
  62. Curtis,Steven E.; Anderton,R. Larry, Systems and methods for estimating presence of a material within a volume of interest using x-ray.
  63. Bendahan, Joseph; Morton, Edward James; Yaish, David; Kolkovich, Yossi; Goldberg, Jacques, Systems and methods for high-Z threat alarm resolution.
  64. Bendahan, Joseph; King, Michael, Thin gap chamber neutron detectors.
  65. Mastronardi, Richard; Rothschild, Peter J., Top-down X-ray inspection trailer.
  66. Morton, Edward James; Peyton, Anthony J., Ultra wide band detectors.
  67. Dinca,Dan Cristian; Mastronardi,Richard; Rothschild,Peter J., X-ray imaging of baggage and personnel using arrays of discrete sources and multiple collimated beams.
  68. Kaval, Brian, X-ray imaging system having improved mobility.
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