$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Analog temperature measurement apparatus and method 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01K-007/00
출원번호 US-0474835 (1999-12-30)
발명자 / 주소
  • Javanifard, Jahanshir J.
  • Wells, Steve
  • Giduturi, Hari
  • Ward, Dave
출원인 / 주소
  • Intel Corporation
대리인 / 주소
    Blakely, Sokoloff, Taylor & Zafman LLP
인용정보 피인용 횟수 : 49  인용 특허 : 6

초록 ▼

A temperature measurement device includes at least one constant current generator to provide a first current and a second current to a temperature sensor, and a signal processing element to provide an analog output signal corresponding to a temperature of the temperature sensor based on a difference

대표청구항 ▼

A temperature measurement device includes at least one constant current generator to provide a first current and a second current to a temperature sensor, and a signal processing element to provide an analog output signal corresponding to a temperature of the temperature sensor based on a difference

이 특허에 인용된 특허 (6)

  1. O\Brien Michael J. (Churchville NY) Johnson Kenneth A. (Walworth NY) Ellis ; Jr. Charles E. (Phelps NY), Dual range temperature monitoring circuits.
    상세보기
  2. Sanchez Hector ; Philip Ross D. ; Mamileti Lakshmikant, Integrated circuit and method therefor.
    상세보기
  3. Evertt Jeff ; Tedrow Kerry, Pump supply self regulation for flash memory cell pair reference circuit.
    상세보기
  4. Beatty Timothy S. ; McAllister Christopher P. ; Fletcher Thomas D., Temperature measurement and compensation scheme.
    상세보기
  5. Armstrong Desmond R. (Wallington GB2) Hughes John B. (Hove GB2), Temperature sensing circuit.
    상세보기
  6. Sanchez Hector ; Alvarez Jose, Temperature sensor.
    상세보기

이 특허를 인용한 특허 (49)

  1. Rutkowski,David J.; Floros,John H.; Sharaa,Imad, Calibration of a hall effect sensor.
    상세보기
  2. Rutkowski,David J.; Floros,John H.; Sharaa,Imad, Hall Effect sensor temperature compensator.
    상세보기
  3. Kappes,Michael Steven; Behzad,Arya Reza, Highly accurate temperature sensor employing mixed-signal components.
    상세보기
  4. Pan,Michael (Meng An), Method and system for a temperature sensor for transmitter output power compensation.
    상세보기
  5. Pan, Meng-An, Method and system for transmitter output power compensation.
    상세보기
  6. Han, Jung-Im; Shim, Jeo Young; Chung, Won Seok; Knamkoong, Kak, Method for identifying a biomolecule.
    상세보기
  7. Walker, Darryl G., Multi-chip non-volatile semiconductor memory package including heater and sensor elements.
    상세보기
  8. Walker, Darryl G., Multi-chip non-volatile semiconductor memory package including heater and sensor elements.
    상세보기
  9. Walker, Darryl G., Multi-chip non-volatile semiconductor memory package including heater and sensor elements.
    상세보기
  10. Walker, Darryl G., Multi-chip non-volatile semiconductor memory package including heater and sensor elements.
    상세보기
  11. Franch, Robert L.; Jenkins, Keith A., On chip temperature measuring and monitoring circuit and method.
    상세보기
  12. Franch,Robert L.; Jenkins,Keith A., On chip temperature measuring and monitoring circuit and method.
    상세보기
  13. Franch,Robert L.; Jenkins,Keith A., On chip temperature measuring and monitoring circuit and method.
    상세보기
  14. Franch, Robert L.; Jenkins, Keith A., On chip temperature measuring and monitoring method.
    상세보기
  15. Franch, Robert L.; Jenkins, Keith A., On chip temperature measuring and monitoring method.
    상세보기
  16. Ramaswami, Ravi; Bienek, Michael D., Over temperature detection apparatus and method thereof.
    상세보기
  17. Walker, Darryl G., Power up of semiconductor device having a temperature circuit and method therefor.
    상세보기
  18. Nervegna, Louis J., Programmable precision oscillator.
    상세보기
  19. Griffin, Jed; Russell, Daniel J., Self-calibrating, wide-range temperature sensor.
    상세보기
  20. Walker, Darryl G., Semiconductor device having a temperature circuit that provides a plurality of temperature operating ranges.
    상세보기
  21. Walker, Darryl G., Semiconductor device having subthreshold operating circuits including a back body bias potential based on temperature range.
    상세보기
  22. Walker, Darryl G., Semiconductor device having temperature sensor circuit that detects a temperature range upper limit value and a temperature range lower limit value.
    상세보기
  23. Walker, Darryl G., Semiconductor device having temperature sensor circuits.
    상세보기
  24. Walker, Darryl G., Semiconductor device having variable parameter selection based on temperature.
    상세보기
  25. Walker, Darryl, Semiconductor device having variable parameter selection based on temperature and test method.
    상세보기
  26. Walker, Darryl, Semiconductor device having variable parameter selection based on temperature and test method.
    상세보기
  27. Walker, Darryl, Semiconductor device having variable parameter selection based on temperature and test method.
    상세보기
  28. Walker, Darryl, Semiconductor device having variable parameter selection based on temperature and test method.
    상세보기
  29. Walker, Darryl, Semiconductor device having variable parameter selection based on temperature and test method.
    상세보기
  30. Walker, Darryl G., Semiconductor device having variable parameter selection based on temperature and test method.
    상세보기
  31. Walker, Darryl G., Semiconductor device having variable parameter selection based on temperature and test method.
    상세보기
  32. Walker, Darryl G., Semiconductor device having variable parameter selection based on temperature and test method.
    상세보기
  33. Walker,Darryl, Semiconductor device having variable parameter selection based on temperature and test method.
    상세보기
  34. Badami, Kais Kaizar; Koch, James K., Sensing device.
    상세보기
  35. Breinlinger,Richard H., Solid state temperature measuring device and method.
    상세보기
  36. Schnaitter, William N., System for on-chip temperature measurement in integrated circuits.
    상세보기
  37. Schnaitter,William N., System for on-chip temperature measurement in integrated circuits.
    상세보기
  38. Schnaitter,William N., System for on-chip temperature measurement in integrated circuits.
    상세보기
  39. Oyabe,Kazunori; Yamazaki,Tomoyuki; Miyasaka,Yasushi, Temperature measurement device of power semiconductor device.
    상세보기
  40. Kim,Kwang hyun; Kim,Chan Kyung, Temperature sensing circuit and method.
    상세보기
  41. Walker, Darryl G., Temperature sensing circuit with hysteresis and time delay.
    상세보기
  42. Feldman, Emanuel; Marnfeldt, Goran N., Temperature sensing circuitry for an implantable medical device.
    상세보기
  43. Walker, Darryl G., Testing and setting performance parameters in a semiconductor device and method therefor.
    상세보기
  44. Walker, Darryl G., Testing and setting performance parameters in a semiconductor device and method therefor.
    상세보기
  45. Walker, Darryl G., Testing and setting performance parameters in a semiconductor device and method therefor.
    상세보기
  46. Rider, Scott; LeClerg, Frank E., Thermal memory control.
    상세보기
  47. Hsu, Pochang; Mishra, Animesh; Shi, Jun, Throttling memory in a computer system.
    상세보기
  48. Hsu, Pochang; Mishra, Animesh; Shi, Jun, Throttling memory in a computer system.
    상세보기
  49. Hsu, Pochang; Mishra, Animesh; Shi, Jun, Throttling memory in response to an internal temperature of a memory device.
    상세보기

관련 콘텐츠

섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로