$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Laser fluence compensation of a curved surface 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • A61F-009/007
출원번호 US-0757794 (2001-01-11)
발명자 / 주소
  • Kliewer, Michael L.
  • Smith, Michael J.
출원인 / 주소
  • LaserSight Technologies, Inc.
대리인 / 주소
    Bollman, William H.
인용정보 피인용 횟수 : 57  인용 특허 : 3

초록

A laser system and techniques which compensate for laser fluence drop off or losses of irradiation as an ablating laser beam is traversed on a curved surface (e.g., on corneal tissue). The disclosed ablating laser system and techniques compensate for fluence differentials from pulse-to-pulse by adju

대표청구항

A laser system and techniques which compensate for laser fluence drop off or losses of irradiation as an ablating laser beam is traversed on a curved surface (e.g., on corneal tissue). The disclosed ablating laser system and techniques compensate for fluence differentials from pulse-to-pulse by adju

이 특허에 인용된 특허 (3)

  1. Hohla Kristian,DEX, Excimer laser system for correction of vision with reduced thermal effects.
  2. Yoder ; Jr. Paul R. (Wilton CT), Methods and apparatus for laser sculpture of the cornea.
  3. Telfair William B. (Newtown CT) Yoder ; Jr. Paul R. (Wilton CT) Martin Clifford A. (Bridgeport CT) L\Esperance ; Jr. Francis A. (Englewood NJ), Sculpture apparatus for correcting curvature of the cornea.

이 특허를 인용한 특허 (57)

  1. Zadoyan, Ruben; Holland, Guy Vern; Bor, Zolt; Bouvier, Marcel, Apparatus and method for correction of aberrations in laser system optics.
  2. Dunki-Jacobs, Robert J., Apparatus and method for medically treating a tattoo.
  3. Dunki-Jacobs, Robert J., Combined SBI and conventional image processor.
  4. Sulfridge, Marc, Conductive interconnect structures and formation methods using supercritical fluids.
  5. Sulfridge, Marc, Conductive interconnect structures and formation methods using supercritical fluids.
  6. Sulfridge, Marc, Conductive interconnect structures and formation methods using supercritical fluids.
  7. Chernyak,Dimitri, Corneal topography-based target warping.
  8. Chernyak, Dimitri, Corneal topography-based target warping system.
  9. Chernyak,Dimitri, Corneal topography-based target warping system.
  10. Fujieda,Masanao, Method and apparatus for obtaining irradiation intensity of a laser beam, and apparatus for irradiating the laser beam.
  11. Weir, Michael P., Method for creating a pixel image from sampled data of a scanned beam imager.
  12. Sluyterman van Langeweyde, Georg; Cabeza-Guillén, Jesús-Miguel, Method for generating an ablation program, method for ablating a body and means for carrying out said method.
  13. Mrochen, Michael; Kaemmerer, Maik; Seiler, Theo, Method of generating a control program for a device for photorefractive corneal surgery of the eye.
  14. Sheetz, Jane A.; Brophy, Jere J.; Youmans, David C.; Ritchie, Paul G., Method of in vivo monitoring using an imaging system including scanned beam imaging unit.
  15. Chong, Chin Hui; Lee, Choon Kuan, Method of manufacturing an interposer.
  16. Cropper, Michael S.; Huitema, Thomas W.; Weir, Michael P.; Dunki-Jacobs, Robert J.; Brophy, Jere J.; Trusty, Robert M.; Byrum, Randal T.; Youmans, David C.; Conlon, Sean P.; Long, Gary L.; Ritchie, Paul G.; Sheetz, Jane A., Methods and devices for repairing damaged or diseased tissue using a scanning beam assembly.
  17. Wong,Jonathan; Chernyak,Dimitri, Methods and systems for differentiating left and right eye images.
  18. Sulfridge, Marc, Methods for forming interconnects in microelectronic workpieces and microelectronic workpieces formed using such methods.
  19. Sulfridge, Marc, Methods for forming interconnects in microelectronic workpieces and microelectronic workpieces formed using such methods.
  20. Sulfridge, Marc, Methods for forming interconnects in microelectronic workpieces and microelectronic workpieces formed using such methods.
  21. Youmans, David C.; Sheetz, Jane A.; Long, Gary L.; Ritchie, Paul G.; Cropper, Michael S.; Brophy, Jere J.; White, Bradley E., Methods for imaging the anatomy with an anatomically secured scanner assembly.
  22. Weir, Michael P.; Dunki-Jacobs, Robert J., Micro-electromechanical device.
  23. Hiatt, William M.; Kirby, Kyle K., Microelectronic devices and methods for filing vias in microelectronic devices.
  24. Hiatt, William M.; Kirby, Kyle K., Microelectronic devices and methods for filling vias in microelectronic devices.
  25. Kirby, Kyle K.; Akram, Salman; Hembree, David R.; Rigg, Sidney B.; Farnworth, Warren M.; Hiatt, William M., Microelectronic devices and methods for forming interconnects in microelectronic devices.
  26. Kirby, Kyle K.; Akram, Salman; Hembree, David R.; Rigg, Sidney B.; Farnworth, Warren M.; Hiatt, William M., Microelectronic devices and methods for forming interconnects in microelectronic devices.
  27. Clark, Douglas; Oliver, Steven D.; Kirby, Kyle K.; Dando, Ross S., Microelectronic workpieces and methods and systems for forming interconnects in microelectronic workpieces.
  28. Rigg, Sidney B.; Watkins, Charles M.; Kirby, Kyle K.; Benson, Peter A.; Akram, Salman, Microelectronics devices, having vias, and packaged microelectronic devices having vias.
  29. Lee, Teck Kheng; Lim, Andrew Chong Pei, Microfeature workpiece substrates having through-substrate vias, and associated methods of formation.
  30. Hiatt, William M.; Dando, Ross S., Microfeature workpieces and methods for forming interconnects in microfeature workpieces.
  31. Borthakur, Swarnal, Microfeature workpieces having conductive interconnect structures formed by chemically reactive processes, and associated systems and methods.
  32. Borthakur, Swarnal, Microfeature workpieces having conductive interconnect structures formed by chemically reactive processes, and associated systems and methods.
  33. Borthakur, Swarnal, Microfeature workpieces having conductive interconnect structures formed by chemically reactive processes, and associated systems and methods.
  34. Tuttle, Mark E., Microfeature workpieces having interconnects and conductive backplanes, and associated systems and methods.
  35. Tuttle, Mark E., Microfeature workpieces having interconnects and conductive backplanes, and associated systems and methods.
  36. Dunki-Jacobs, Robert J.; Byrum, Randal T.; Sheetz, Jane A.; Conlon, Sean P.; Youmans, David C.; Trusty, Robert M.; Bally, Kurt R.; Long, Gary L.; Ritchie, Paul G.; Cropper, Michael S.; Huitema, Thomas W.; White, Bradley E., Optical scanning module and means for attaching the module to medical instruments for introducing the module into the anatomy.
  37. Lee, Teck Kheng, Partitioned through-layer via and associated systems and methods.
  38. Lee, Teck Kheng, Partitioned through-layer via and associated systems and methods.
  39. Lee, Teck Kheng, Partitioned through-layer via and associated systems and methods.
  40. Dunki-Jacobs, Robert J.; Weir, Michael P., Position tracking and control for a scanning assembly.
  41. Weir, Michael P., Power modulation of a scanning beam for imaging, therapy, and/or diagnosis.
  42. Weir, Michael P.; Lewis, John R.; Malik, Amjad I.; Wiklof, Christopher A.; Watson, Mathew D.; James, Richard A., Receiver aperture broadening for scanned beam imaging.
  43. Dunki-Jacobs, Robert J.; Weir, Michael P., SBI motion artifact removal apparatus and method.
  44. Youmans, David C., Scanned beam device and method using same which measures the reflectance of patient tissue.
  45. Dunki Jacobs, Robert J., Scanning beam imaging with adjustable detector sensitivity or gain.
  46. Dunki-Jacobs, Robert J.; Yazdi, Youseph; Weir, Michael P.; Ritchie, Paul G.; Youmans, David C.; Gill, Robert P., System and method using fluorescence to examine within a patient's anatomy.
  47. Watkins, Charles M.; Hiatt, William M., System and methods for forming apertures in microfeature workpieces.
  48. Watkins, Charles M.; Hiatt, William M., Systems and methods for forming apertures in microfeature workpieces.
  49. Watkins, Charles M.; Hiatt, William M., Systems and methods for forming apertures in microfeature workpieces.
  50. Watkins, Charles M.; Hiatt, William M., Systems and methods for forming apertures in microfeature workpieces.
  51. Watkins, Charles M.; Hiatt, William M., Systems and methods for forming apertures in microfeature workpieces.
  52. Wong, Jonathan; Chernyak, Dimitri, Systems for differentiating left and right eye images.
  53. Akram, Salman; Watkins, Charles M.; Hiatt, William M.; Hembree, David R.; Wark, James M.; Farnworth, Warren M.; Tuttle, Mark E.; Rigg, Sidney B.; Oliver, Steven D.; Kirby, Kyle K.; Wood, Alan G.; Velicky, Lu, Through-wafer interconnects for photoimager and memory wafers.
  54. Akram, Salman; Watkins, Charles M.; Hiatt, William M.; Hembree, David R.; Wark, James M.; Farnworth, Warren M.; Tuttle, Mark E.; Rigg, Sidney B.; Oliver, Steven D.; Kirby, Kyle K.; Wood, Alan G.; Velicky, Lu, Through-wafer interconnects for photoimager and memory wafers.
  55. Akram, Salman; Watkins, Charles M.; Hiatt, William M.; Hembree, David R.; Wark, James M.; Farnworth, Warren M.; Tuttle, Mark E.; Rigg, Sidney B.; Oliver, Steven D.; Kirby, Kyle K.; Wood, Alan G.; Velicky, Lu, Through-wafer interconnects for photoimager and memory wafers.
  56. Chernyak, Dimitri; Fabrikant, Anatoly, Tilt compensation, measurement, and associated adjustment of refractive prescriptions during surgical and other treatments of the eye.
  57. Chernyak, Dimitri; Fabrikant, Anatoly, Tilt compensation, measurement, and associated adjustment of refractive prescriptions during surgical and other treatments of the eye.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로