High speed high resolution hyperspectral sensor
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G01B-009/02
G01J-003/45
출원번호
US-0556660
(2000-04-24)
발명자
/ 주소
Hutchin, Richard A.
Otto, Oberdan W.
출원인 / 주소
Optical Physics Company
대리인 / 주소
Fulbright & Jaworski L.L.P.
인용정보
피인용 횟수 :
7인용 특허 :
9
초록▼
A high speed high resolution spectral sensor is formed by placing a cascade of chained wide field-of-view Mach-Zender interferometers inside a dispersive sensor between the sensor's grating and the focusing lens. Also is disclosed an optical filter with wide field-of-view capabilities. Such a filter
A high speed high resolution spectral sensor is formed by placing a cascade of chained wide field-of-view Mach-Zender interferometers inside a dispersive sensor between the sensor's grating and the focusing lens. Also is disclosed an optical filter with wide field-of-view capabilities. Such a filter is formed by inserting a plurality of gap plates of certain thicknesses and refractive indices. The invention provides formulas for calculation of optimal dimensions for such gap plates.
대표청구항▼
A high speed high resolution spectral sensor is formed by placing a cascade of chained wide field-of-view Mach-Zender interferometers inside a dispersive sensor between the sensor's grating and the focusing lens. Also is disclosed an optical filter with wide field-of-view capabilities. Such a filter
A high speed high resolution spectral sensor is formed by placing a cascade of chained wide field-of-view Mach-Zender interferometers inside a dispersive sensor between the sensor's grating and the focusing lens. Also is disclosed an optical filter with wide field-of-view capabilities. Such a filter is formed by inserting a plurality of gap plates of certain thicknesses and refractive indices. The invention provides formulas for calculation of optimal dimensions for such gap plates. ntal et al.; US-5473381, 19951200, Lee; US-5475435, 19951200, Yonemitsu et al.; US-5485216, 19960100, Lee; US-5485280, 19960100, Fujinami et al.; US-5497199, 19960300, Asada et al.; US-5502489, 19960300, Kim et al.; US-5508750, 19960400, Hewlett et al.; US-5517247, 19960500, Correa et al.; US-5517248, 19960500, Isoda; US-5534935, 19960700, Kawai et al.; US-5550592, 19960800, Markandey et al.; US-5563651, 19961000, Christopher et al.; US-5563660, 19961000, Tsukagoshi; US-5565998, 19961000, Coombs et al.; US-5596371, 19970100, Pakhchyan et al.; US-5606373, 19970200, Dopp et al.; US-5610662, 19970300, Hackett; US-5621470, 19970400, Sid-Ahmed; US-5631706, 19970500, Tsunashima
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이 특허에 인용된 특허 (9)
Buican Tudor N. (Albuquerque NM), Apparatus and method for measuring fluorescence intensities at a plurality of wavelengths and lifetimes.
Hantel Peter (Am Gansemarkt 6 D-37276 Meinhard DEX) Thiel Jurgen (Siemensstrasse 11 D-52074 Aachen DEX), Interferometer system and method for controlling the activation of a regulating interferometer in response to an output.
Fu, Jiyou; Sapiens, Noam; Peterlinz, Kevin A.; Pandev, Stilian Ivanov, Method and system for spectroscopic beam profile metrology including a detection of collected light according to wavelength along a third dimension of a hyperspectral detector.
Schulenburg, Nielson Wade; Warren, David Wheeler; Rudy, Donald J.; Martino, Michael G.; Chatelain, Mark Alan; Rocha, Michael Arthur, Nadir emissive hyperspectral measurement operation (NEHMO).
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