초록 ▼

This present invention is embodied in a large array printhead having a large array of thin-film ink drop generators formed on a single monolithic substrate. The large array printhead includes a multiplexing device to reduce parasitic resistance and the number of incoming leads. In a preferred embodi

This present invention is embodied in a large array printhead having a large array of thin-film ink drop generators formed on a single monolithic substrate. The large array printhead includes a multiplexing device to reduce parasitic resistance and the number of incoming leads. In a preferred embodiment, the substrate is initially patterned and etched and the multiplexing device is attached to the substrate at a later time. The present invention also includes methods of fabricating a plurality of large array printhead embodiments using a single monolithic substrate made of a suitable material, preferably having a low coefficient of thermal expansion.

대표청구항 ▼

This present invention is embodied in a large array printhead having a large array of thin-film ink drop generators formed on a single monolithic substrate. The large array printhead includes a multiplexing device to reduce parasitic resistance and the number of incoming leads. In a preferred embodi

This present invention is embodied in a large array printhead having a large array of thin-film ink drop generators formed on a single monolithic substrate. The large array printhead includes a multiplexing device to reduce parasitic resistance and the number of incoming leads. In a preferred embodiment, the substrate is initially patterned and etched and the multiplexing device is attached to the substrate at a later time. The present invention also includes methods of fabricating a plurality of large array printhead embodiments using a single monolithic substrate made of a suitable material, preferably having a low coefficient of thermal expansion. nozzle for sampling a gas, including a target material gas to be analyzed; a filter which removes a small particle from the sampled gas; a sample introduction tube which connects together said sampling nozzle and said filter; means for adding continuously an internal standard gas at a known constant concentration to the sampled gas in said sample introduction tube, wherein the internal standard gas has a chemical property similar to the target material gas and has substantially the same ionization efficiency as the target material gas; means for introducing the sampled gas and the internal standard gas, at the same time, into an atmospheric pressure chemical ionization source; for ionizing the target material gas and the internal standard gas, at the same time; a mass spectrometer for subjecting respective ions, generated in the atmospheric pressure chemical ionization source from the target material gas and the internal standard gas, to mass spectrometry and measuring electrical signals from the respective ions; a data processing unit for calculating the ion intensity ratio between the target material gas in the sampled gas and the internal standard gas from the measured electrical signals to analyze, continuously, the concentration of the target material gas quantitatively in real time; and means for controlling combustion of an incineration furnace based on the concentration of the target material gas. 2. A monitoring device for analyzing a sample, comprising: a sampling nozzle which is disposed in a flue for sampling a flue gas including a target material gas to be analyzed; a filter which removes a small particle from the sampled gas; a sample introduction tube which connects together said sampling nozzle and said filter; means for adding continuously an internal standard gas at a known constant concentration to the sampled gas in said sample introduction tube, wherein the internal standard gas has a chemical property similar to the target material gas and has substantially the same ionization efficiency as the target material gas; means for introducing the sampled gas and the internal standard gas, at the same time, into an atmospheric pressure chemical ionization means for ionizing the target material gas and the internal standard gas, at the same time; a mass spectrometer for subjecting respective ions generated from the target material gas and the internal standard gas to mass spectrometry; and a data processing unit for processing results-of the mass spectrometry, wherein the data processing unit is made to continuously analyze the target material gas quantitatively in real time by calculating the ion signal intensity ratio of the target material gas to the internal standard gas. 3. A monitoring device according to claim 2, wherein the internal standard has substantially the same ionization efficiency as the target material. 4. A monitoring device for analyzing a sample, comprising: a sampling nozzle which is disposed in a flue for sampling a flue gas including a target material gas to be analyzed; a filter which removes a small particle from the sampled gas; a sample introduction tube which connects together said sampling nozzle and said filter; means for adding continuously an internal standard gas at a known constant concentration into the sampled gas in said sample introduction tube, wherein the internal standard gas has a chemical property similar-to the target material gas and has substantially the same ionization efficiency as the target material gas, and the internal standard gas is a substance resulting from replacement of at least one element constituting the target material gas by isotope thereof; means for introducing the sampled gas and the internal standard gas, at the same time, into an atmospheric pressure chemical ionization means for ionizing the target material gas and the internal standard gas, at the same time; a mass spectrometer for subjecting respective ions genera