IPC분류정보
국가/구분 |
United States(US) Patent
등록
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국제특허분류(IPC7판) |
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출원번호 |
US-0654420
(2000-09-01)
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발명자
/ 주소 |
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출원인 / 주소 |
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대리인 / 주소 |
Tarolli, Sundheim, Covell & Tummino L.L.P.
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인용정보 |
피인용 횟수 :
3 인용 특허 :
13 |
초록
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An autoignition material includes a plurality of agglomerates. Each agglomerate comprises an oxidizer material particle. A plurality of metal fuel particles are disposed on the oxidizer material particle. The metal fuel particles are present in a weight ratio effective to substantially stoichiometri
An autoignition material includes a plurality of agglomerates. Each agglomerate comprises an oxidizer material particle. A plurality of metal fuel particles are disposed on the oxidizer material particle. The metal fuel particles are present in a weight ratio effective to substantially stoichiometrically balance the oxidizer material particle. The metal fuel particles exothermically react with the oxidizer material particle when the autoignition material is exposed to a temperature of about 80° C. to about 250° C. A thin binder film adheres the metal fuel particles to the oxidizer material particle and maintains the metal fuel particles in intimate contact with the oxidizer particle.
대표청구항
▼
An autoignition material includes a plurality of agglomerates. Each agglomerate comprises an oxidizer material particle. A plurality of metal fuel particles are disposed on the oxidizer material particle. The metal fuel particles are present in a weight ratio effective to substantially stoichiometri
An autoignition material includes a plurality of agglomerates. Each agglomerate comprises an oxidizer material particle. A plurality of metal fuel particles are disposed on the oxidizer material particle. The metal fuel particles are present in a weight ratio effective to substantially stoichiometrically balance the oxidizer material particle. The metal fuel particles exothermically react with the oxidizer material particle when the autoignition material is exposed to a temperature of about 80° C. to about 250° C. A thin binder film adheres the metal fuel particles to the oxidizer material particle and maintains the metal fuel particles in intimate contact with the oxidizer particle. 88) pp. 561-565, American Institute of Physics. Eidenzon, A.M., et al., "Interrelation Between Distributions of Growth- and Thermally- Induced Microdefects and impurity Distribution in Dislocation-Free Silicon Grown by the Czochralski Method with a Constant Magnetic Field Acting on the Melt," Sov. Phys. 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