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A system that adapts wireless link parameters for a wireless communication link. A measure is determined of errors occurring in communication over a wireless link. In a case that the measure of errors corresponds to more errors than a first predetermined threshold, communication changes from a first

A system that adapts wireless link parameters for a wireless communication link. A measure is determined of errors occurring in communication over a wireless link. In a case that the measure of errors corresponds to more errors than a first predetermined threshold, communication changes from a first set of wireless link parameters to a second set of wireless link parameters. The second set of wireless link parameters corresponds to higher error tolerance than the first set of wireless link parameters. In a case that the measure of errors corresponds to fewer errors than a second predetermined threshold, communication changes from the first set of wireless link parameters to a third set of wireless link parameters. The third set of wireless link parameters corresponds to lower error tolerance than the first set of wireless link parameters. Preferably, the measure of errors is determined by monitoring a number of NACK messages and a number of ACK messages that occur. It is determined that the measure of errors corresponds to more errors than the first predetermined threshold when more than a predetermined number of NACK messages occur in succession. It is determined that the measure of errors corresponds to fewer errors than the second predetermined threshold when more than a predetermined number of ACK messages occur in succession.

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A system that adapts wireless link parameters for a wireless communication link. A measure is determined of errors occurring in communication over a wireless link. In a case that the measure of errors corresponds to more errors than a first predetermined threshold, communication changes from a first

A system that adapts wireless link parameters for a wireless communication link. A measure is determined of errors occurring in communication over a wireless link. In a case that the measure of errors corresponds to more errors than a first predetermined threshold, communication changes from a first set of wireless link parameters to a second set of wireless link parameters. The second set of wireless link parameters corresponds to higher error tolerance than the first set of wireless link parameters. In a case that the measure of errors corresponds to fewer errors than a second predetermined threshold, communication changes from the first set of wireless link parameters to a third set of wireless link parameters. The third set of wireless link parameters corresponds to lower error tolerance than the first set of wireless link parameters. Preferably, the measure of errors is determined by monitoring a number of NACK messages and a number of ACK messages that occur. It is determined that the measure of errors corresponds to more errors than the first predetermined threshold when more than a predetermined number of NACK messages occur in succession. It is determined that the measure of errors corresponds to fewer errors than the second predetermined threshold when more than a predetermined number of ACK messages occur in succession. rther comprising a first surface and a second surface opposite the first surface, the optical birefringent crystal filter adapted to transmit separate portions of light exiting the optical birefringent crystal filter to at least one of a second interferometer, the second mirror, or a light output. 2. A compound intercavity interferometer of claim 1, wherein: a. the optical birefringent crystal filter further comprises uncoated birefringment crystal. 3. The compound intercavity interferometer of claim 2 wherein: a. the first beam splitter is at least one of (i) a birefringent beam splitter or (ii) a non-birefringent beam splitter; and b. the second beam splitter is at least one of (i) a birefringent beam splitter or (ii) a non-birefringent beam splitter. 4. The compound intercavity interferometer of claim 2, wherein: a. an S-polarized reflection at the first surface provides an optical coupling to the optical pathway; and b. a second surface of the birefringent plate exploits birefringence to yield P-polarization of light entering the birefringent plate from the optical pathway. 5. The compound intercavity interferometer of claim 2, wherein: a. the beam splitter comprises a crystal. 6. The compound intercavity interferometer of claim 2, wherein: a. the compound intercavity interferometer is rotatable about its surface normal to vary a degree of birefringence. 7. A compound intercavity interferometer of claim 1, wherein: a. θBis greater than the Brewster angle. 8. A compound intercavity interferometer for a free-electron laser (FEL) comprising: a. a first beam splitter positioned at a predetermined angle with respect to an optical pathway within an FEL, the first beam splitter further comprising a first surface and a second surface opposite the first surface, the first beam splitter adapted to receive light along the optical pathway and further adapted to transmit a predetermined first portion of light incident to the first surface to a first resonator and transmit a second portion of light incident to the first surface through the second surface; and b. a second beam splitter positioned at a predetermined angle with respect to the second portion of light, the second beam splitter comprising a first surface and a second surface opposite the first surface such that a predetermined portion of light entering the second beam splitter is transmitted to a second resonator. 9. The compound intercavity interferometer of claim 8, wherein: a. the crystal is at least one of(i) sapphire or (ii) quartz. 10. The filter of claim 8, wherein: a. the compound intercavity interferometer is tunable using piezoelectric gap tuning. 11. A compound intercavity interferometer for FEL lasers comprising: a. a first birefringent plate disposed within the FEL at a predetermined angle; and b. a second birefringent plate disposed within the FEL at a predetermined angle, the second birefringent plate disposed substantially parallel to the first birefringent plate; c. wherein a first predetermined portion of the first birefringent plate and a second predetermined portion of the second birefringent plate define a vacuum gap disposed intermediate the first birefringent plate and the second birefringent plate. 12. The compound intercavity interferometer of claim 11, wherein: a. at least one birefringent plate comprises uncoated birefringment sapphire. 13. A resonator for a free-electron laser (FEL) comprising: a. a first mirror aligned along a first optical pathway disposed at least partially within the FEL; b. a second mirror disposed at a predetermined position at least partially in the FEL opposite the first mirror; c. a wiggler disposed in the FEL intermediate the first mirror and the second mirror and aligned substantially about the optical pathway; and d. a compound intercavity interferometer, further comprising: i. a birefringent plate disposed within the FEL substantially abo ut the optical pathway at a predetermined angle relative to the optical pathway; ii. a Michelson interferometer able to receive a predetermined portion of light provided by the birefringent plate; and iii. a birefringent Fox-Smith laser interferometer nested within the Michelson interferometer; e. wherein i. an S-polarized reflection at a first surface of the birefringent plate provides an optical coupling in the compound intercavity interferometer for light traveling substantially about the optical pathway; ii. a second surface of the birefringent plate exploits birefringence to yield P-polarization; iii. a predetermined portion of the light entering the compound intercavity interferometer is diverted to reflect off the second mirror; and iv. a predetermined first portion of the light entering the birefringent plate is diverted to the Fox-Smith resonator and a predetermined second portion of the light entering the birefringent plate is diverted to the Michelson resonator. 14. The resonator of claim 13, wherein: a. the Michelson resonator is at least one of (i) a birefringent Michelson resonator or (ii) a non-birefringent Michelson resonator. 15. The resonator of claim 13, further comprising: a. a non-birefringent interferometer disposed about the pathway intermediate the wiggler and the second mirror. 16. The resonator of claim 15, wherein: a. the compound intercavity interferometer is disposed within the FEL substantially at the Brewster angle with respect to the optical pathway. 17. The resonator of claim 13, wherein: a. the birefringent plate further comprises two parallel uncoated birefringent sapphire substrate plates defining a variable space vacuum gap therebetween. 18. The resonator of claim 17, wherein: a. vacuum gap size, sapphire crystal orientation, and sapphire thickness are chosen so that a birefringent passband for each birefringent sapphire substrate plate is approximately equal to a gap passband between the birefringent sapphire substrate plates. 19. The resonator of claim 18, wherein: a. the gap passband is chosen to appropriately suppress FEL sidebands. 20. The resonator of claim 17, wherein: a. the compound intercavity interferometer is tunable using piezoelectric gap tuning. 21. A method of obtaining enhanced optical performance in a free electron laser (FEL) at a modulation frequency vrfto achieve a desired configuration of non-integral harmonic mode locking for a resonators described in claim 13, comprising: a. determining a cavity axial mode spacing vcav; b. selecting an integer N that substantially corresponds to a predetermined number of radio frequency (rf) periods contained in a cavity round trip; c. selecting an integer P that substantially corresponds to a predetermined fractional deviation from a predetermined integral harmonic mode locking; d. calculating a modulation frequency using the formula vrf=(N-1/p)vcav; and e. using the calculated modulation frequency to operate the FEL. 22. The method of claim 21 wherein step (a) further comprises: a. determining a spacing L between a first end mirror and a second end mirror in the FEL; and b. calculating vcavto equal c/2L where c is the speed of propagation of light. 23. The method of claim 21 wherein step (b) further comprises: a. selecting a value of N as the nearest integer for which integral harmonic mode locking would be achieved. 24. The method of claim 21, wherein P in step (c) comprises at least one of: a. the number of round trips which circulating optical pulses must execute in order to synchronize with an injected electron pulse in a time domain; and b. axial mode spacing between modes of a predetermined hypermode in a frequency domain. 25. The method of claim 24 wherein: a. P is calculated in the frequency domain from vax(hypermode)=P*vrf. 26. The method of claim 21, wherein: a. enha