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An optical inspection system has a topology sensing assembly. A height detector detects whether a region of a circuit has a height different from a height of the surface, and provides height data. A topology representation of the circuit, based on the height data, forms the basis for a reduced repre

An optical inspection system has a topology sensing assembly. A height detector detects whether a region of a circuit has a height different from a height of the surface, and provides height data. A topology representation of the circuit, based on the height data, forms the basis for a reduced representation of the topology, and subsequent defect analysis.

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An optical inspection system has a topology sensing assembly. A height detector detects whether a region of a circuit has a height different from a height of the surface, and provides height data. A topology representation of the circuit, based on the height data, forms the basis for a reduced repre

An optical inspection system has a topology sensing assembly. A height detector detects whether a region of a circuit has a height different from a height of the surface, and provides height data. A topology representation of the circuit, based on the height data, forms the basis for a reduced representation of the topology, and subsequent defect analysis. ght receiving signal at a high sensitivity side when both the first and second light receiving signals are not saturated, and forms foreign matter data on the basis of the first light receiving signal at a low sensitivity side when only one of the first and second light receiving signals is saturated. 2. A surface inspection apparatus according to claim 1, wherein a first characteristic of the first luminous flux emitted by the light source section and a second characteristic of the second luminous flux emitted by the light source section lie in a wavelength of luminous flux or polarized-light component. 3. A surface inspection apparatus according to claim 1, wherein a first irradiation angle of the first irradiation optical system is set to be smaller than a second irradiation angle of the second irradiation optical system. 4. A surface inspection apparatus comprising: a light source section for emitting a luminous flux irradiated on a surface of an inspected object; an irradiation optical system for irradiating a luminous flux on the surface of the inspected object at a fixed irradiation angle; a displacement section for displacing the inspected object relative to an irradiation luminous flux of the irradiation optical system; a first light receiving optical system for receiving a first scattered light in a first scattering direction of the irradiation luminous flux irradiated by the irradiation optical system and emitted from an inspection object on the surface of the inspected object; a second light receiving optical system for receiving a second scattered light in a second scattering direction of the irradiation luminous flux irradiated by the irradiation optical system and emitted from the inspection object on the surface of the inspected object; a first light receiving section for converting the first scattered light received by the first light receiving optical system into a first light receiving signal; a second light receiving section for converting the second scattered light received by the second light receiving optical system into a second light receiving signal; and a signal forming section for synthesizing the first light receiving signal and the second light receiving signal to thereby form a measuring signal, wherein the first light receiving section and the second light receiving section respectively form the first light receiving signal and the second light receiving signal which are different in sensitivity or dynamic range from each other, wherein the signal forming section synthesizes the first light receiving signal and the second light receiving signal which are different in sensitivity or dynamic range to form the measuring signal, and wherein the signal forming section forms foreign matter data on the basis of the first light receiving signal at a high sensitivity side when both the first and second light receiving signals are not saturated, and forms foreign matter data on the basis of the first light receiving signal at a low sensitivity side when only one of the first and second light receiving signals is saturated. 5. A surface inspection apparatus according to claim 4, wherein a first scattering direction forms a larger angle with respect to the irradiation direction of luminous flux than that of a second scattering direction. 6. A surface inspection apparatus according to claim 4, wherein the signal forming section extracts a foreign matter signal included in the first light receiving signal and a foreign matter signal included in second light receiving signal, to discriminate that the foreign matter signals included in a predetermined range in respective light receiving signals so that the light receiving signals which are satisfied with predetermined conditions are used preferentially to form the measuring signal. 7. A surface inspection apparatus according to claim 6, wherein the signal forming section forms foreign matter data by a start coordinate and an end coordinate when crossing a fixed level and by a peak coordinate and a peak level in a range between the start coordinate and the end coordinate exceeding the fixed level on the basis of the first light receiving signal or the second light receiving signal. 8. A surface inspection apparatus according to claim 7, wherein the signal forming section forms foreign matter data on the basis of the light receiving signal lower in sensitivity, when the foreign matter signal that is detected by the light receiving signal higher in sensitivity out of the first light receiving signal and the second light receiving signal is saturated. 9. A surface inspection apparatus comprising: a light emitting means for emitting a first luminous flux and a second luminous flux for irradiating on a surface of an inspected object; a first irradiation means for irradiating the first luminous flux on the surface of the inspected object at a first irradiation angle; a second irradiation means for irradiating the second luminous flux on the surface of the inspected object at a second irradiation angle different from the first irradiation angle; a displacement means for displacing the inspected object relative to irradiation luminous fluxes of the first and second irradiation means; a light receiving means for receiving scattered light of the first luminous flux irradiated by the first irradiation means and produced from an inspection object on the surface of the inspected object, and scattered light of the second luminous flux irradiated by the second irradiation means and produced from the inspection object on the surface of the inspected object; a first conversion means for converting scattered light of the first luminous flux received by the light receiving means into a first light receiving signal; a second conversion means for converting scattered light of the second luminous flux received by the light receiving means into a second light receiving signal; a signal forming means for forming a measuring signal on the basis of the first light receiving signal and the second light receiving signal, wherein the first conversion means and the second conversion means respectively form the first light receiving signal and the second light receiving signal which are different in sensitivity or dynamic range from each other, wherein the signal forming means synthesizes the first light receiving signal and the second light receiving signal which are different in sensitivity or dynamic range from each other to form the measuring signal, and wherein the signal forming means forms foreign matter data on the basis of the first light receiving signal at a high sensitivity side when both the first and second light receiving signals are not saturated, and forms foreign matter data on the basis of the first light receiving signal at a low sensitivity side when only one of the first and second light receiving signals is saturated. 10. A surface inspection apparatus according to claim 9, wherein the light emitting means includes a first light emitting unit and a second light emitting unit, and wherein a first characteristic of the first luminous flux emitted by the first light emitting unit and a second characteristic of the second luminous flux emitted by the second light emitting unit lie in a wavelength of luminous flux or polarized-light component. 11. A surface inspection apparatus according to claim 9, wherein a first irradiation angle of the first irradiation means is set to be smaller than a second irradiation angle of the second irradiation optical system. 12. A surface inspection apparatus comprising: a light emitting means for emitting a luminous flux for irradiating on a surface of an inspected object; an irradiation means for irradiating a luminous flux on the surface of the inspected object at a fixed irradiation angle; a displacement means for displacing the inspected object relative to an irradiation luminous flux of the irradiation means; a first ligh t receiving means for receiving a first scattered light in a first scattering direction of the irradiation luminous flux irradiated by the irradiation means and produced from an inspection object on the surface of the inspected object; a second light receiving means for receiving a second scattered light in a second scattering direction of the irradiation luminous flux irradiated by the irradiation means and produced from the inspection object on the surface of the inspected object; a first conversion means for converting the first scattered light received by the first light receiving means into a first light receiving signal; a second conversion means for converting the second scattered light received by the second light receiving means into a second light receiving signal; a signal forming means for forming a measuring signal by synthesizing the first light receiving signal and the second light receiving signal, wherein the first conversion means and the second conversion means respectively form the first light receiving signal and the second light receiving signal which are different in sensitivity or dynamic range from each other, wherein the signal forming means forms the measuring signal by synthesizing the first light receiving signal and the second light receiving signal which are different in sensitivity or dynamic range from each other, and wherein the signal forming means forms foreign matter data on the basis of the first light receiving signal at a high sensitivity side when both the first and second light receiving signals are not saturated, and forms foreign matter data on the basis of the first light receiving signal at a low sensitivity side when only one of the first and second light receiving signals is saturated. 13. A surface inspection apparatus according to claim 12, wherein the first scattering direction forms a larger angle with respect to the irradiation direction of luminous flux than that of the second scattering direction. 14. A surface inspection apparatus according to claim 12, wherein the signal forming means extracts a foreign matter signal included in the first light receiving signal and a foreign matter signal included in the second light receiving signal, to discriminate that the foreign matter signals included in a predetermined range in respective light receiving signals so that the light receiving signals which are satisfied with predetermined conditions are used preferentially to form the measuring signal. 15. A surface inspection apparatus according to claim 14, wherein the signal forming means forms foreign matter data by a start coordinate and an end coordinate when crossing a fixed level and by a peak coordinate and a peak level in a range between the start coordinate and the end coordinate exceeding the fixed level on the basis of the first light receiving signal or the second light receiving signal. 16. A surface inspection apparatus according to claim 15, wherein the signal forming means forms foreign matter data in the basis of the light receiving signal of low sensitivity, when the foreign matter signal detected by the light receiving signal that is higher in sensitivity out of the first light receiving signal and the second light receiving signal is saturated. 17. A surface inspection method comprising: a step for emitting a first luminous flux and a second luminous flux for irradiating on a surface of an inspected object; a step for irradiating the first luminous flux on the surface of the inspected object at a first irradiation angle; a step for irradiating the second luminous flux on the surface of the inspected object at a second irradiation angle different from the first irradiation angle; a step for displacing the inspected object relative to an irradiation luminous flux; a step for receiving scattered light of the first luminous flux produced from an inspection object on the surface of the inspected object, and scattered light of the second luminous flux