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Silica-based slurry 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G09G-001/02
  • G09G-001/07
출원번호 US-0882548 (2001-06-14)
발명자 / 주소
  • Hellring, Stuart D.
  • McCann, Colin P.
  • Kahle, Charles F.
  • Li, Yuzhuo
  • Keleher, Jason
출원인 / 주소
  • PPG Industries Ohio, Inc.
대리인 / 주소
    Marmo, Carol A.
인용정보 피인용 횟수 : 26  인용 특허 : 28

초록

This invention relates to a slurry composition and a method of its preparation. In particular, the slurry composition of the present invention includes a silica wherein the silica comprises a surface modification. The silica-based slurry of the present invention is suitable for polishing articles an

대표청구항

This invention relates to a slurry composition and a method of its preparation. In particular, the slurry composition of the present invention includes a silica wherein the silica comprises a surface modification. The silica-based slurry of the present invention is suitable for polishing articles an

이 특허에 인용된 특허 (28)

  1. Swift Harold E. ; Krivak Thomas G. ; Jones Laurence E., Amorphous precipitated silica characterized by high dispersion in cured organic rubber compositions.
  2. Swift Harold E. ; Krivak Thomas G. ; Jones Laurence E., Amorphous precipitated silica characterized by high dispersion in cured organic rubber compositions.
  3. Krivak Thomas G. ; Jones Larry E., Amorphous precipitated silica having a low proportion of small pores.
  4. Kohyama Katsuhisa (Kita-Kyushu JPX) Kimura Tsuneo (Kita-Kyushu JPX) Kidera Teruo (Fukumamachi JPX) Kajiwara Yukio (Kita-Kyushu JPX), Aqueous dispersion of silicic anhydride and abrasive composition comprising the dispersion.
  5. Grumbine Steven K. ; Streinz Christopher C. ; Mueller Brian L., Composition and slurry useful for metal CMP.
  6. Patkar Shailesh D. ; Swift Harold E. ; Scott William B., Dispersible free flowing particulate silica composition.
  7. Clapp Clarence P. (Danville IL) Torrey George S. (Danville IL), Food release compositions.
  8. Shechter Tal, Forming emulsions.
  9. Maloney James E. (Eagan MN) Oakes Thomas R. (Stillwater MN), Hydrophobic silica or silicate, compositions containing the same and methods for making and using the same.
  10. Grabbe Alexis ; Michalske Terry Arthur ; Smith William Larry, Method for chemical surface modification of fumed silica particles.
  11. Kobayashi Hideki (Chiba JPX) Ohnishi Masayuki (Chiba JPX), Method for modifying the surface of finely divided silica.
  12. Griffith Phillip Joseph,GBX ; Herron William,GBX ; Harkness Brian Robert,GBX ; Taylor Rosemary Margaret,GBX ; Wilson David James,GBX, Method for preparing hydrophobic fumed silica.
  13. Burns Gary Thomas ; Hahn James Richard ; Reese Clifford Carlton, Method for preparing hydrophobic silica gels.
  14. Sasaki Shigeo (Yokkaichi JPX), Method for preventing agglomeration of colloidal silica and silicon wafer polishing composition using the same.
  15. Stoll, Robert W.; MacLaury, Michael R., Method for treating fumed silica.
  16. Muroyama Masakazu,JPX, Method of forming a wiring layer on a semiconductor by polishing with treated slurry.
  17. Griffith Phillip J.,GBX ; Harkness Brian R.,GBX ; Herron William,GBX ; Taylor Rosemary M.,GBX ; Wilson David J.,GBX, Method of preparing hydrophobic precipitated silica.
  18. Sollman Kenneth J. (Brewster NY) Pickwell Robert J. (Mt. Kisco NY) Ranney Maurice W. (Tokyo JPX), Organofunctional silane coupling agent-powder mixtures.
  19. Dew James T. (Jeannette PA) Evans Larry R. (Jeannette PA) Waddell Walter H. (Pittsburgh PA), Particulate amorphous precipitated silica.
  20. Ronay Maria, Polish process and slurry for planarization.
  21. Grumbine Steven K. ; Streinz Christopher C. ; Hoglund Eric W.G., Polishing composition including an inhibitor of tungsten etching.
  22. Kato Hiroshi,JPX ; Hayashi Kazuhiko,JPX ; Kohno Hiroyuki,JPX, Polishing slurries and a process for the production thereof.
  23. Reinhardt Helmut (Rodenkirchen DT) Trebinger Karl (Wesseling DT) Kallrath Gottfried (Wesseling DT), Process for hydrophobizing silicas and silicates with organosilanes.
  24. Laufer ; Siegmar, Process for preparing finely divided hydrophobic oxide particles.
  25. Jansen Rolf-Michael (Kelkheim DEX) Zimmermann Andreas (Griesheim DEX), Process for the preparation of xerogels.
  26. Muller, Karl-Hans; Tailfer, Roland, Shoe cream polish composition.
  27. Kennan Linda D. (Midland MI) Knapp Theodore L. (Midland MI) Monroe Carl M. (Midland MI) Skostins Olgerts (Midland MI), Treated silica for reinforcing silicone elastomer.
  28. Garafalo Theresa A. ; Smith Robert A., Treating process for precipitated silica fillers.

이 특허를 인용한 특허 (26)

  1. Hayashi, Hirokatsu; Fukunaga, Kenji; Fukuda, Kentaro, Cake of easily dispersible precipitated silica.
  2. Sun,Fred F.; Lu,Bin; Lightle,Ethan K.; Wang,Shumin, Coated metal oxide particles for CMP.
  3. Grumbine, Steven; Dysard, Jeffrey; Fu, Lin; Ward, William; Whitener, Glenn, Composition for tungsten CMP.
  4. Grumbine, Steven; Dysard, Jeffrey; Fu, Lin; Ward, William; Whitener, Glenn, Composition for tungsten CMP.
  5. Grumbine, Steven; Dysard, Jeffrey; Fu, Lin; Ward, William; Whitener, Glenn, Composition for tungsten CMP.
  6. Fu, Lin; Dysard, Jeffrey; Grumbine, Steven, Composition for tungsten buffing.
  7. Carter, Phillip; Bogush, Gregory H; Khan, Farhana; Johns, Timothy P; Vacassy, Robert, Compositions and methods for dielectric CMP.
  8. Belmont, James A., Compositions comprising silane modified metal oxides.
  9. Lu, Jiong-Ping; Xia, Changfeng, Copper surface passivation during semiconductor manufacturing.
  10. van Kessel, Theodore G., Method and apparatus for real-time measurement of trace metal concentration in chemical mechanical polishing (CMP) slurry.
  11. van Kessel, Theodore G., Method and apparatus for real-time measurement of trace metal concentration in chemical mechanical polishing (CMP) slurry.
  12. Grumbine, Steven; Dysard, Jeffrey, Mixed abrasive tungsten CMP composition.
  13. Ward, William; Whitener, Glenn; Grumbine, Steven; Dysard, Jeffrey, Mixed abrasive tungsten CMP composition.
  14. Yadav, Tapesh, Nano-engineered inks, methods for their manufacture and their applications.
  15. Daley, Jon; Campbell, Kristy A., Phase change current density control structure.
  16. Daley, Jon; Campbell, Kristy A., Phase change current density control structure.
  17. Daley, Jon; Campbell, Kristy A., Phase change current density control structure.
  18. Daley, Jon; Campbell, Kristy A., Phase change current density control structure.
  19. Iwata, Toru; Sugawa, Akira, Polishing composition and method for polishing magnetic disk substrate.
  20. Iwata, Toru; Sugawa, Akira, Polishing composition and method for polishing magnetic disk substrate.
  21. Dysard, Jeffrey; Anjur, Sriram; Grumbine, Steven; White, Daniela; Ward, William, Polishing composition and method utilizing abrasive particles treated with an aminosilane.
  22. Grumbine, Steven; Li, Shoutian; Ward, William; Singh, Pankaj; Dysard, Jeffrey, Polishing composition and method utilizing abrasive particles treated with an aminosilane.
  23. Chen, Wei; Moyer, Eric Scott; Nguyen, Binh Thanh; Wang, Sheng; Wanous, Mark A.; Zhou, Xiaobing, Polysilane—polysilazane copolymers and methods for their preparation and use.
  24. Swisher,Robert G.; Wang,Alan E.; Allison,William C., Polyurethane urea polishing pad.
  25. Hellring,Stuart D.; McCann,Colin P.; Babu,Suryadevara V.; Li,Yuzhuo; Narayanan,Satish; Auger,Robert L., Silica and silica-based slurry.
  26. Siddiqui,Junaid Ahmed; Compton,Timothy Frederick; Hu,Bin; Richards,Robin Edward, Tunable composition and method for chemical-mechanical planarization with aspartic acid/tolyltriazole.
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