초록 ▼

A radiation attenuation system is disclosed. The system includes a polymeric resin comprising a web. The system also includes a radiation attenuation material dispersed at least partially in the web. The system has a radiation transmission attenuation factor of at least about 10% of a primary 100 kV

A radiation attenuation system is disclosed. The system includes a polymeric resin comprising a web. The system also includes a radiation attenuation material dispersed at least partially in the web. The system has a radiation transmission attenuation factor of at least about 10% of a primary 100 kVp x-ray beam. A method of making a radiation attenuation system including a radiation attenuation material dispersed at least partially in a polymeric resin is also disclosed. The method includes extruding the radiation attenuation material and the polymeric resin thereby forming an extrusion. The method also includes forming the extrusion into a web. The web has a radiation transmission attenuation factor of at least about 10% of a primary 100 kVp x-ray beam. A shield for the attenuation of radiation is also disclosed.

대표청구항 ▼

A radiation attenuation system is disclosed. The system includes a polymeric resin comprising a web. The system also includes a radiation attenuation material dispersed at least partially in the web. The system has a radiation transmission attenuation factor of at least about 10% of a primary 100 kV

A radiation attenuation system is disclosed. The system includes a polymeric resin comprising a web. The system also includes a radiation attenuation material dispersed at least partially in the web. The system has a radiation transmission attenuation factor of at least about 10% of a primary 100 kVp x-ray beam. A method of making a radiation attenuation system including a radiation attenuation material dispersed at least partially in a polymeric resin is also disclosed. The method includes extruding the radiation attenuation material and the polymeric resin thereby forming an extrusion. The method also includes forming the extrusion into a web. The web has a radiation transmission attenuation factor of at least about 10% of a primary 100 kVp x-ray beam. A shield for the attenuation of radiation is also disclosed. fields, which deflect the primary charged particle beam from its propagation along the first axis to the propagation of the primary charged particle beam along the second axis, said two deflection fields deflecting the secondary charged particle to provide the propagation of the secondary charged particle beam to the detecting region of said detector outside said opening. 3. The method according to claim 1, wherein said affecting comprises passing the primary charged particle beam through a beam directing device including a focusing assembly having an optical axis parallel to said first axis, and a deflection assembly, the deflection assembly deflecting the primary charged particle beam to provide from its propagation along the first axis to the propagation of the primary charged particle beam along the second axis parallel to said optical axis of the focusing assembly. 4. The method according to claim 3, wherein said deflecting comprises applying to the primary charged particle beam two deflection fields at two successive locations along the optical axis of the focusing assembly. 5. The method according to claim 3, wherein said first axis is substantially parallel to and spaced-apart from the optical axis of the focusing assembly. 6. The method according to claim 5, wherein said second axis substantially coincides with the optical axis of the focusing assembly. 7. The method according to claim 3, wherein said first axis substantially coincides with the optical axis of the focusing assembly. 8. The method according to claim 7, wherein said second axis is parallel to and spaced-apart from the optical axis of the focusing assembly. 9. A method of separating between a primary charged particle beam and a secondary charged particle beam, the secondary charged particle beam resulting from interaction of the primary charged particle beam with the sample, the method comprising: (a) directing the primary charged particle beam towards a deflection assembly along a first axis passing through an opening in a detector, which has charged particle detecting regions outside said opening; (b) passing the primary charged particle beam through the deflection assembly thereby affecting the trajectory of the primary charged particle beam to provide the primary charged particle beam propagation to the sample along a second axis substantially parallel to and spaced-apart from said first axis, thereby causing the secondary charged particle beam propagation to the detecting region of said detector outside said opening. 10. A method of separating between a primary charged particle beam and a secondary charged particle beam, the secondary charged particle beam resulting from interaction of the primary charged particle beam with the sample, the method comprising: (a) directing the primary charged particle beam towards a beam directing device along a first axis passing through an opening in a detector, which has charged particle detecting regions outside said opening; (b) passing the primary charged particle beam through the beam directing device that includes a focusing assembly defining an optical axis and a deflection assembly, the deflection assembly being operable to produced two deflection fields in two successive regions, respectively, along the optical axis of the focusing assembly, to thereby affect the trajectory of the primary charged particle beam to provide the primary charged particle beam deflection from its propagation along the first axis to the propagation of the primary charged particle beam to the sample along a second axis substantially parallel to and spaced-apart from said first axis, said two deflection fields affecting the trajectory of the secondary charged particle beam to cause the secondary charged particle beam propagation to the detecting region of said detector outside said opening. 11. A method of separating between a primary charged particle beam and a secondary charged particle beam, the secondary charged par