$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Circuit protection device with half cycle self test 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-031/14
  • G01R-031/08
  • G01R-031/02
  • H02H-003/16
출원번호 US-0725525 (2000-11-29)
발명자 / 주소
  • Macbeth, Bruce F.
출원인 / 주소
  • Pass & Seymour, Inc.
대리인 / 주소
    Wall Marjama & Bilinski LLP
인용정보 피인용 횟수 : 62  인용 특허 : 10

초록

A circuit protection device connected between two lines of an AC power source self checks for an introduced simulated ground fault every half cycle during a period when a trip SCR cannot conduct. If the self check fails, the device is tripped on the next half cycle of different phase. Possible respo

대표청구항

A circuit protection device connected between two lines of an AC power source self checks for an introduced simulated ground fault every half cycle during a period when a trip SCR cannot conduct. If the self check fails, the device is tripped on the next half cycle of different phase. Possible respo

이 특허에 인용된 특허 (10)

  1. Thomas N. Packard ; James P. Romano, Arc fault or ground fault detector with self-test feature.
  2. Brooks Stanley J. ; Reneau Charles E., Arcing fault detector testing and demonstration system.
  3. Nemir David C. ; Hirsh Stanley S. ; Rubio Edward, Fail safe fault interrupter.
  4. Irwin Lawrence F. (12860 San Fernando Rd. Sylmar CA 91342), Ground line fault interrupter adapter unit.
  5. Neiger Benjamin (New York NY) Gershen Bernard (Centerport NY) Rosenbaum Saul (East Meadow NY), Intelligent ground fault circuit interrupter.
  6. Neiger Benjamin ; Gershen Bernard ; Rosenbaum Saul, Intelligent ground fault circuit interrupter.
  7. Torezan Edward M. (Irvington NY) Leopold Howard S. (Melville NY), Miswiring indicator in ground fault protection devices.
  8. Martellock Paul T. (Syracuse NY) Dougherty John J. (Avon CT) Lund Nora A. (Canton CT), Overcurrent circuit interrupter using RMS sampling.
  9. DiSalvo Nicholas L., Reset lockout for circuit interrupting device.
  10. Clunn Robert Henry, Test circuit for an AFCI/GFCI circuit breaker.

이 특허를 인용한 특허 (62)

  1. Chan, David; Porter, James A.; Bradley, Roger M., Circuit interrupter with continuous self-testing feature.
  2. DiSalvo, Nicholas L.; Mernyk, Ross; Bradley, Roger M.; Stewart, Stephen; Germain, Frantz; Calixto, Armando, Circuit interrupting device with automatic test.
  3. DiSalvo, Nicholas L., Circuit interrupting device with reset lockout.
  4. Campolo, Steve; Disalvo, Nicholas L.; Ziegler, William R., Circuit interrupting device with reset lockout and reverse wiring protection and method of manufacture.
  5. Gao, Shaohua, Circuit interruption device with indicator having function of auto-monitoring and multi-protecting circuit.
  6. Gao, Shaohua; Zhao, Feng, Circuit protection device with automatic monitoring of operation fault.
  7. Macbeth, Bruce F., Circuit protection device with half cycle self test.
  8. Finlay, Sr., David A.; Richards, Jeffrey C., Circuit protection device with timed negative half-cycle self test.
  9. Beck, Riley D.; Layton, Kent D., Current saturation detection and clamping circuit and method.
  10. Finlay, Sr., David A.; Macbeth, Bruce F.; Morgan, Kent R.; Murphy, Patrick J.; Packard, Thomas N.; Richards, Jeffrey C.; Savicki, Jr., Gerald R.; Weeks, Richard, Electrical device with miswire protection and automated testing.
  11. Finlay, Sr., David A.; Macbeth, Bruce F.; Morgan, Kent R.; Murphy, Patrick J.; Packard, Thomas N.; Richards, Jeffrey C; Savicki, Jr., Gerald R.; Weeks, Richard, Electrical device with miswire protection and automated testing.
  12. McMahon, Michael F.; Morgan, Kent R., Electrical wiring device with protective features.
  13. McMahon, Michael; Morgan, Kent R., Electrical wiring device with protective features.
  14. Kamor, Michael; Porter, James; Dykema, Kurt, Fault circuit interrupter device.
  15. Simonin, Stephen Paul, GFCI test monitor circuit.
  16. Bonilla, Nelson; DeBartolo, Jr., Joseph V., GFCI that cannot be reset unit wired correctly on line side and power is applied.
  17. Bonilla, Nelson; DeBartolo, Jr., Joseph V., GFCI that cannot be reset until wired correctly on line side and power is applied.
  18. Bonilla, Nelson; DeBartolo, Jr., Joseph V., GFCI that cannot be reset until wired correctly on line side and power is applied.
  19. Simonin, Stephen Paul, GFCI with voltage level comparison and indirect sampling.
  20. Armstrong, Bruce, Ground fault circuit interrupter (GFCI) monitor.
  21. Armstrong, Bruce, Ground fault circuit interrupter (GFCI) monitor.
  22. Armstrong, Bruce, Ground fault circuit interrupter (GFCI) monitor.
  23. Beck, Riley D.; Grange, Scott R., Ground fault circuit interrupter and method.
  24. Beck, Riley D.; Layton, Kent D., Ground fault circuit interrupter and method.
  25. Beck, Riley D.; Layton, Kent D., Ground fault circuit interrupter and method.
  26. Beck, Riley D.; Layton, Kent D.; Grange, Scott R., Ground fault circuit interrupter and method.
  27. Beck, Riley D.; Layton, Kent D.; Tyler, Matthew A.; Grange, Scott R., Ground fault circuit interrupter and method.
  28. Ostrovsky, Michael; Aronov, Alek; Kamor, Michael; Mathew, Renjith, Ground fault detector.
  29. Pan, Xincheng; Chen, Ze, Ground fault protection circuit and ground fault circuit interrupter.
  30. Brazis, Jr., Paul W., High speed controllable load.
  31. Brazis, Jr., Paul W., High speed controllable load.
  32. Beck, Riley D.; Layton, Kent D.; Tyler, Matthew A.; Grange, Scott R., Impedance measuring circuit.
  33. Chen,Wusheng; Wang,Fu; Wang,Lianyun, Intelligent life testing methods and apparatus for leakage current protection.
  34. Zhang, Feng; Chen, Hongliang; Wang, Fu; Chen, Wusheng; Zhang, Yulin; Song, Huaiyin, Intelligent life testing methods and apparatus for leakage current protection.
  35. Zhang,Feng; Chen,Hongliang; Wang,Fu; Chen,Wusheng; Zhang,Yulin; Song,Huaiyin, Intelligent life testing methods and apparatus for leakage current protection.
  36. Beck, Riley D.; Layton, Kent D.; Tyler, Matthew A.; Grange, Scott R., Method for determining a circuit element parameter.
  37. Lewinski, Artur J.; Teggatz, Ross; Cosby, Thomas Edward, Methods and apparatus for continuous ground fault self test.
  38. Lewinski, Artur J.; Teggatz, Ross; Cosby, Thomas E., Methods and apparatus for continuous ground fault self-test.
  39. Weeks, Richard, Protection device with a sandwiched cantilever breaker mechanism.
  40. Weeks, Richard; Morgan, Kent R.; Richards, Jeffrey C.; Finlay, Sr., David A.; Murphy, Patrick J., Protection device with a sandwiched cantilever breaker mechanism.
  41. Weeks, Richard; Morgan, Kent R.; Richards, Jeffrey C.; Finlay, Sr., David A.; Murphy, Patrick J.; Savicki, Jr., Gerald R., Protection device with a sandwiched cantilever breaker mechanism.
  42. Radosavljevic, Dejan; Richards, Jeffrey C.; Morgan, Kent R.; Finlay, Sr., David A., Protective device with automated self test.
  43. Radosavljevic, Dejan; Richards, Jeffrey C.; Morgan, Kent R.; Finlay, Sr., David A., Protective device with automated self test.
  44. Macbeth, Bruce F.; Finlay, Sr., David A.; Richards, Jeffrey C., Protective device with automated self-test.
  45. Macbeth, Bruce F.; Richards, Jeffrey C.; Finlay, Sr., David A., Protective device with automated self-test.
  46. Richards, Jeffrey C.; Finlay, Sr., David A.; Macbeth, Bruce F., Protective device with automated self-test.
  47. Finlay, Sr., David A.; Packard, Thomas N.; Macbeth, Bruce F., Protective device with end-of-life indication before power denial.
  48. Packard, Thomas N.; Malley, Daniel P.; Finlay, Sr., David A., Protective device with miswire protection.
  49. Du, Hai Hu; Haines, Joshua P; McMahon, Michael F., Protective device with non-volatile memory miswire circuit.
  50. Radosavljevic, Dejan; Richards, Jeffrey C.; Morgan, Kent R.; Finlay, Sr., David A., Protective device with separate end-of-life trip mechanism.
  51. Radosavljevic, Dejan; Richards, Jeffrey C.; Morgan, Kent; Finlay, Sr., David A., Protective device with separate end-of-life trip mechanism.
  52. Chan, David; Campolo, Steve, Reverse wiring detect in circuit interrupting devices.
  53. Chan,David; Campolo,Steve, Reverse wiring detect in circuit interrupting devices.
  54. Ostrovsky, Michael; Kevelos, Adam, Self testing fault circuit apparatus and method.
  55. Ostrovsky, Michael; Kevelos, Adam, Self testing fault circuit apparatus and method.
  56. Baldwin,John R.; Yu,David; Bonilla,Nelson, Self testing ground fault circuit interrupter (GFCI).
  57. Baldwin, John R.; Fanzutti, Robert; Yu, Daming, Self testing ground fault circuit interrupter (GFCI) with end of life (EOL) detection that rejects false EOL information.
  58. Baldwin, John R.; Fanzutti, Robert; Yu, Daming, Self testing ground fault circuit interrupter (GFCI) with end of life (EOL) detection that rejects false EOL information.
  59. Mernyk, Ross; Bradley, Roger M., Self-testing circuit interrupting device.
  60. Salas, Luis F., Self-testing ground fault circuit interrupter.
  61. Beck, Riley D.; Layton, Kent D.; Tyler, Matthew A.; Grange, Scott R., Single wound current transformer impedance measurement circuit.
  62. Lindsey, Robert Wayne; Johnson, Curtis Brian, Testing method for a ground fault detector.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로