A device for detecting leaks in membranes, etc., for liquid media, whereby the membrane is provided, over at least one partial area of its surface extension, with at least one electrical conductor that produces a change in a measurement signal of the electrical resistance of the conductor when a cha
A device for detecting leaks in membranes, etc., for liquid media, whereby the membrane is provided, over at least one partial area of its surface extension, with at least one electrical conductor that produces a change in a measurement signal of the electrical resistance of the conductor when a change occurs on the membrane surface, the membrane being provided with a swellable nonwoven that joins or separates the conductors when influenced by the liquid.
대표청구항▼
A device for detecting leaks in membranes, etc., for liquid media, whereby the membrane is provided, over at least one partial area of its surface extension, with at least one electrical conductor that produces a change in a measurement signal of the electrical resistance of the conductor when a cha
A device for detecting leaks in membranes, etc., for liquid media, whereby the membrane is provided, over at least one partial area of its surface extension, with at least one electrical conductor that produces a change in a measurement signal of the electrical resistance of the conductor when a change occurs on the membrane surface, the membrane being provided with a swellable nonwoven that joins or separates the conductors when influenced by the liquid. the overall image defect and measured at different illumination settings. 7. A method for optimizing image properties of at least three optical elements, in which relative position of the optical elements is adjusted with respect to one another, characterized by the following procedural steps: a) measurement of overall image defects of all optical elements, consisting of an image defect of at least one movable element and an image defect of at least one stationary optical element, in which all optical elements are traversed by measuring light; b) representation of the measured overall image defect as a linear combination of base functions of an orthogonal function set; c) movement of one or more of the at least one movable optical element alone or jointly to a new measurement position; d) renewed measurement of the overall image defect of the optical elements, consisting of the image defect of one of the moved element and the jointly moved optical elements, and the image defect of any remaining optical elements, in which all optical elements are traversed by measuring light; e) representation of the new overall image defect as a linear combination of the base functions of an orthogonal function set; f) calculation of the image defects of the one moved optical element or of the jointly moved optical elements and calculation of the image defect of the remaining optical elements, using the representations obtained in steps b) and e); g) repetition of the procedural steps c) to f) for at least one other optical element, until each movable optical element has been moved at least once relative to a closest adjacent optical element or elements; h) calculation of a target position of the movable optical elements from the image defects of the individual movable optical elements and the at least one stationary optical element, in which the overall image defect is minimized; i) movement of the movable optical elements to the calculated target position. 8. The method according to claim 7, characterized in that at least one movable optical element can be rotated about the optical axis. 9. The method according to claim 7, characterized in that air image data are used for measurement of the overall image defect. 10. The method according to claim 7, characterized in that wave front data of an imaging light bundle after a projection objective lens system are measured for determination of the overall image defect. 11. The method according to claim 10, characterized in that the air image data is used for measurement of the overall image defect and measured at different illumination settings. 12. The method according to claim 7, characterized in that Zernike functions are chosen as orthogonal function set. 13. A method for optimizing image properties of at least three optical elements, in which relative position of the optical elements is adjusted with respect to one another, characterized by the following procedural steps: a) subdivision of the at least three optical elements into a first part to be moved, and a second, stationary part; b) measurement of overall image defects of all optical elements in an initial position, in which all optical elements are traversed by measuring light; c) representation of the measured overall image defect as a linear combination of base functions of an orthogonal function set; d) movement of the part of the optical elements to be moved, to a new measurement position; e) renewed measurement of a new overall image defect of all optical elements in the new measurement position, in which the optical elements are traversed by measuring light; f) representation of the new overall image defect as a linear combination of the base functions of an orthogonal function set; g) calculation of the image defect of the moved part of the optical elements and calculation of the image defect of the stationary part of the optical elements, using the representation obtained in steps c) and f); h) calculation
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이 특허에 인용된 특허 (3)
Lahlouh John (San Jose CA) Stewart Ray F. (Redwood City CA) Wasley Robert S. (San Carlos CA) Hauptly Paul D. (Fremont CA) Welsh Laurence M. (Palo Alto CA), Devices for detecting and obtaining information about an event.
Van Rijn, Cornelis Johannes Maria; Wissink, Jeroen Mathijn; Nijdam, Wietze, Nozzle device and nozzle for atomisation and/or filtration and methods for using the same.
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