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An apparatus and method for operating an appliance in an energy conservation mode is described. The appliance includes a number of peripheral devices and auxiliary components ancillary to main operation of the appliance, and the method includes reducing power to at least some of the peripheral devic

An apparatus and method for operating an appliance in an energy conservation mode is described. The appliance includes a number of peripheral devices and auxiliary components ancillary to main operation of the appliance, and the method includes reducing power to at least some of the peripheral devices and auxiliary components in an energy conservation mode, thereby reducing energy consumption by the peripheral devices and auxiliary components.

대표청구항 ▼

An apparatus and method for operating an appliance in an energy conservation mode is described. The appliance includes a number of peripheral devices and auxiliary components ancillary to main operation of the appliance, and the method includes reducing power to at least some of the peripheral devic

An apparatus and method for operating an appliance in an energy conservation mode is described. The appliance includes a number of peripheral devices and auxiliary components ancillary to main operation of the appliance, and the method includes reducing power to at least some of the peripheral devices and auxiliary components in an energy conservation mode, thereby reducing energy consumption by the peripheral devices and auxiliary components. circuitry for sampling a waveform at a predetermined sampling rate. 11. The automatic test system as recited in claim 10, further comprising: a software program for executing at least one predetermined test event on an automatic test system, wherein the software program is executable on the automatic test system for exercising the electronic device. 12. The automatic test system as recited in claim 10, wherein the software program controls pin electronics circuitry for detecting the occurrence of an edge in a sampled waveform. 13. The automatic test system as recited in claim 10, wherein the tester is used to test integrated circuits in a production environment. 14. A computer-implemented system