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Sensor platform, apparatus incorporating platform, and process using the platform

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01B-009/02
출원번호 US-0609846 (2000-07-05)
우선권정보 GB-19990015703 (1999-07-05); GB-20000011420 (2000-05-11)
발명자 / 주소
  • Budach, Wolfgang Ernst Gustav
  • Neuschaefer, Dieter
출원인 / 주소
  • Novartis AG
대리인 / 주소
    Townsend and Townsend and Crew LLP
인용정보 피인용 횟수 : 74  인용 특허 : 69

초록

A sensor platform for use in sample analysis comprises a substrate (30) of refractive index (n1) and a thin, optically transparent layer (32) of refractive index (n2) on the substrate, (n2) is greater than (n1). The platform incorporates one or multiple corrugated structures in the form of periodic

대표청구항

A sensor platform for use in sample analysis comprises a substrate (30) of refractive index (n1) and a thin, optically transparent layer (32) of refractive index (n2) on the substrate, (n2) is greater than (n1). The platform incorporates one or multiple corrugated structures in the form of periodic

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