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In a titanium nitride-based optical coating, the structural stability of the coating is enhanced by providing a damage-retardation base layer between the titanium nitride layer and a substrate. Where the optical coating is to provide solar control, the titanium nitride layer is selected primarily fo

In a titanium nitride-based optical coating, the structural stability of the coating is enhanced by providing a damage-retardation base layer between the titanium nitride layer and a substrate. Where the optical coating is to provide solar control, the titanium nitride layer is selected primarily for achieving desired optical characteristics, while the thickness of the damage-retardation layer is selected primarily for achieving desired mechanical characteristics. The damage-retardation layer is formed of a grey metal, with nickel chromium being the preferred metal. The grey metal layer reduces the likelihood that the titanium nitride layer will crack. The tendency of such a layer to crack and form worm tracks is further reduced by exposing the substrate to a plasma preglow and/or by using a slip agent on the side of the substrate on which the layers are to be formed.

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In a titanium nitride-based optical coating, the structural stability of the coating is enhanced by providing a damage-retardation base layer between the titanium nitride layer and a substrate. Where the optical coating is to provide solar control, the titanium nitride layer is selected primarily fo

In a titanium nitride-based optical coating, the structural stability of the coating is enhanced by providing a damage-retardation base layer between the titanium nitride layer and a substrate. Where the optical coating is to provide solar control, the titanium nitride layer is selected primarily for achieving desired optical characteristics, while the thickness of the damage-retardation layer is selected primarily for achieving desired mechanical characteristics. The damage-retardation layer is formed of a grey metal, with nickel chromium being the preferred metal. The grey metal layer reduces the likelihood that the titanium nitride layer will crack. The tendency of such a layer to crack and form worm tracks is further reduced by exposing the substrate to a plasma preglow and/or by using a slip agent on the side of the substrate on which the layers are to be formed. 096/059; US-3747120, 19730700, Stemme, 346/075; US-3833161, 19740900, Krumbein, 226/092; US-3903541, 19750900, Von Meister et al., 354/317; US-3946398, 19760300, Kyser et al., 346/001; US-3959048, 19760500, Stanfield et al., 156/094; US-4026756, 19770500, Stanfield et al., 156/554; US-4081577, 19780300, Horner, 427/424; US-4142107, 19790200, Hatzakis et al., 250/571; US-4215927, 19800800, Grant et al., 354/317; US-4249985, 19810200, Stanfield, 156/554; US-4265545, 19810500, Slaker, 356/431; US-4301469, 19811100, Modeen et al., 358/075; US-4345831, 19820800, Kachelries, 356/444; US-4490729, 19841200, Clark et al., 346/075; US-4501480, 19850200, Matsui et al., 354/298; US-4564280, 19860100, Fukuda, 354/317; US-4594598, 19860600, Iwagami, 346/140; US-4621037, 19861100, Kanda et al., 430/030; US-4623236, 19861100, Stella, 354/318; US-4633300, 19861200, Sakai, 358/041; US-4636808, 19870100, Herron, 346/075; US-4666307, 19870500, Matsumoto et al., 356/404; US-4670779, 19870600, Nagano, 358/075; US-4736221, 19880400, Shidara, 354/317; US-4741621, 19880500, Taft et al., 356/376; US-4745040, 19880500, Levine, 430/021; US-4755844, 19880700, Tsuchiya et al., 354/317; US-4777102, 19881000, Levine, 430/021; US-4796061, 19890100, Ikeda et al., 355/073; US-4814630, 19890300, Lim, 250/578; US-4821114, 19890400, Gebhardt, 358/075; US-4845551, 19890700, Matsumoto, 358/080; US-4851311, 19890700, Millis et al., 430/030; US-4857430, 19890800, Millis et al., 430/030; US-4875067, 19891000, Kanzaki et al., 354/325; US-4969045, 19901100, Haruki et al., 358/228; US-4994918, 19910200, Lingemann, 358/214; US-5027146, 19910600, Manico et al., 354/299; US-5034767, 19910700, Netz et al., 354/317; US-5101286, 19920300, Patton, 358/487; US-5124216, 19920600, Giapis et al., 430/030; US-5155596, 19921000, Kurtz et al., 358/214; US-5196285, 19930300, Thomson, 430/030; US-5200817, 19930400, Birnbaum, 358/080; US-5212512, 19930500, Shiota, 354/319; US-5231439, 19930700, Takahashi et al., 354/313; US-5235352, 19930800, Pies et al., 346/140; US-5255408, 19931000, Blackman, 015/308; US-5266805, 19931100, Edgar, 250/330; US-5267030, 19931100, Giorgianni et al., 358/527; US-5292605, 19940300, Thomson, 430/030; US-5296923, 19940300, Hung, 358/527; US-5334247, 19940800, Columbus et al., 118/411; US-5350651, 19940900, Evans et al., 430/021; US-5350664, 19940900, Simons, 430/362; US-5357307, 19941000, Glanville et al., 354/324; US-5360701, 19941100, Elton et al., 430/501; US-5371542, 19941200, Pauli et al., 348/262; US-5391443, 19950200, Simons et al., 430/021; US-5414779, 19950500, Mitch, 382/199; US-5416550, 19950500, Skye et al., 354/298; US-5418119, 19950500, Simons, 430/507; US-5418597, 19950500, Lahcanski et al., 355/076; US-5432579, 19950700, Tokuda, 354/293; US-5436738, 19950700, Manico, 358/503; US-5440365, 19950800, Gates et al., 354/298; US-5447811, 19950900, Buhr et al., 430/020; US-5448380, 19950900, Park, 358/520; US-5452018, 19950900, Capitant et al., 348/651; US-5465155, 19951100, Edgar, 358/500; US-5477345, 19951200, Tse, 358/500; US-5496669, 19960300, Pforr et al., 430/022; US-5516608, 19960500, Hobbs et al., 430/030; US-5519510, 19960500, Edgar, 358/471; US-5546477, 19960800, Knowles et al., 382/242; US-5550566, 19960800, Hodgson et al., 345/202; US-5552904, 19960900, Ryoo et al., 358/518; US-5563717, 19961000, Koeng et al., 358/406; US-5568270, 19961000, Endo, 358/298; US-5576836, 19961100, Sano et al., 358/302; US-5581376, 19961200, Harrington, 358/518; US-5587752, 19961200, Petruchik, 396/315; US-5596415, 19970100, Cosgrove et al., 358/296; US-5627016, 19970500, Manico, 430/434; US-5649260, 19970700, Wheeler et al., 396/569; US-5664253, 19970900, Meyers, 396/603; US-5664255, 19970900, Wen, 396/627; US-5667944, 19970900, Reem et al., 430/359; US-5678116, 19971000, Sugimoto et al., 396/611; US-5691118, 19971100, Haye, 430/357; US-5695914, 19971200, Simon et al., 430/379; US-5698382, 19971200, Nakahanada et al., 430/418; US-5726773, 19980300, Mehlo et al