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Fully automatic rapid microscope slide scanner 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06K-009/00
출원번호 US-0563437 (2000-05-03)
발명자 / 주소
  • Soenksen, Dirk G.
출원인 / 주소
  • Aperio Technologies, Inc.
대리인 / 주소
    Rawlins, Pattric J.Procopio, Cory, Hargreaves & Savitch LLP
인용정보 피인용 횟수 : 229  인용 특허 : 27

초록

Apparatus for and method of fully automatic rapid scanning and digitizing of an entire microscope sample, or a substantially large portion of a microscope sample, using a linear array detector synchronized with a positioning stage that is part of a computer controlled microscope slide scanner. The i

대표청구항

Apparatus for and method of fully automatic rapid scanning and digitizing of an entire microscope sample, or a substantially large portion of a microscope sample, using a linear array detector synchronized with a positioning stage that is part of a computer controlled microscope slide scanner. The i

이 특허에 인용된 특허 (27)

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  178. Olsen, Allen; Crandall, Greg; Soenksen, Dirk G., System and computer readable medium for pre-focus of digital slides.
  179. Olson, Allen; Saligrama, Kiran; Soenksen, Dirk G., System and method for assessing virtual slide image quality.
  180. Crandall,Greg J.; Eichhorn,Ole; Olson,Allen H.; Soenksen,Dirk G., System and method for data management in a linear-array-based microscope slide scanner.
  181. Henderson, David LaVan; Kenny, Kevin Bernard; Yazdanfar, Siavash, System and method for enhanced predictive autofocusing.
  182. Wetzel, Arthur W.; Gilbertson, II, John R.; Beckstead, Jeffrey A.; Feineigle, Patricia A.; Hauser, Christopher R., System and method for finding regions of interest for microscopic digital montage imaging.
  183. Wetzel,Arthur W.; Gilbertson, II,John R.; Beckstead,Jeffrey A.; Feineigle,Patricia A.; Hauser,Christopher R.; Palmieri, Jr.,Frank A., System and method for finding regions of interest for microscopic digital montage imaging.
  184. Wetzel,Arthur W.; Gilbertson, II,John R.; Beckstead,Jeffrey A.; Feineigle,Patricia A.; Hauser,Christopher R.; Palmieri, Jr.,Frank A., System and method for finding regions of interest for microscopic digital montage imaging.
  185. Watson,Matthew C.; Venkatraman,Suresh; Tate,Matt, System and method for image analysis of slides.
  186. Eichhorn, Ole, System and method for managing images over a network.
  187. Eichhorn, Ole, System and method for managing images over a network.
  188. Eichhorn, Ole, System and method for managing images over a network.
  189. Grossman,Peter Alexander, System and method for manipulating an image on a screen.
  190. Soenksen, Dirk G.; Zirker-Smith, Kathy, System and method for quality assurance in pathology.
  191. Soenksen, Dirk G.; Zirker-Smith, Kathy, System and method for quality assurance in pathology.
  192. Soenksen, Dirk G.; Zirker-Smith, Kathy, System and method for quality assurance in pathology.
  193. Soenksen, Dirk G.; Zirker-Smith, Kathy, System and method for quality assurance in pathology.
  194. Dorrer, Rainer, System and method for re-locating an object in a sample on a slide with a microscope imaging device.
  195. Zeineh,Jack A., System and method for reconstructing a diagnostic trajectory.
  196. Zeineh,Jack A., System and method for remote navigation of a specimen.
  197. Thakkar, Rahul C., System and method for retrieving an image containing image statistical data.
  198. Crandall, Greg, System and method for single optical axis multi-detector microscope slide scanner.
  199. Crandall, Greg, System and method for single optical axis multi-detector microscope slide scanner.
  200. Perz, Cynthia B.; De La Torre-Bueno, Jose, System and method of registering field of view.
  201. Gally, Brian J.; Palmateer, Lauren; Kothari, Manish; Cummings, William J., System and method of testing humidity in a sealed MEMS device.
  202. Gally, Brian J.; Palmateer, Lauren; Kothari, Manish; Cummings, William J., System and method of testing humidity in a sealed MEMS device.
  203. Wetzel, Arthur W.; Gilbertson, II, John R.; Beckstead, Jeffrey A.; Feineigle, Patricia A.; Hauser, Christopher R.; Palmieri, Jr., Frank A., System for creating microscopic digital montage images.
  204. Wetzel,Arthur W.; Gilbertson, II,John R.; Beckstead,Jeffrey A.; Feineigle,Patricia A.; Hauser,Christopher R.; Palmieri, Jr.,Frank A., System for creating microscopic digital montage images.
  205. Abeytunge, Sanjee; Li, Yongbiao; Larson, Bjorg; Rajadhyaksha, Milind; Toledo-Crow, Ricardo, System, method and computer readable medium for imaging large areas with microscopic resolution.
  206. Winkelman, James; Tanasijevic, Milenko; Zahniser, David; Linder, James, Systems and methods for analyzing body fluids.
  207. Winkelman, James; Tanasijevic, Milenko; Zahniser, David; Linder, James, Systems and methods for analyzing body fluids.
  208. Eichorn, Ole; Olson, Allen, Systems and methods for analyzing digital slide images using algorithms constrained by parameter data.
  209. Berestka, John; Berestka, Noah John, Systems and methods for analyzing the eye.
  210. Eichhorn, Ole; Crandall, Greg; Soenksen, Dirk; Hashagen, Steven; Wrenn, Mark, Systems and methods for creating and viewing three dimensional virtual slides.
  211. Eichhorn,Ole; Crandall,Greg; Hashagen,Steven; Soenksen,Dirk; Wrenn,Mark, Systems and methods for creating and viewing three dimensional virtual slides.
  212. Winkelman, James; Tanasijevic, Milenko; Zahniser, David, Systems and methods for determining a complete blood count and a white blood cell differential count.
  213. Eichhorn, Ole; Soenksen, Dirk G., Systems and methods for image pattern recognition.
  214. Eichhorn,Ole; Soenksen,Dirk G., Systems and methods for image pattern recognition.
  215. Cummings,William; Gally,Brian, Systems and methods for measuring color and contrast in specular reflective devices.
  216. Eichhorn, Ole, Systems and methods for viewing three dimensional virtual slides.
  217. Foran,David J.; Chen,Wenjin, Systems for analyzing microtissue arrays.
  218. Foran,David J.; Chen,Wenjin, Systems for analyzing microtissue arrays.
  219. Spitzig, Roger; Richards, Bob; Boston, Michael; Rawlings, David, Verification system and method in a document processing environment.
  220. Spitzig, Roger; Richards, Bob; Boston, Michael; Rawlings, David, Verification system and method in a document processing environment.
  221. Eichhorn, Ole; Brumme, Anne, Viewing digital slides.
  222. Eichhorn, Ole; Brumme, Anne, Viewing digital slides.
  223. Eichhorn, Ole, Viewing three dimensional digital slides.
  224. Eichhorn, Ole, Viewing three dimensional digital slides.
  225. Eichhorn, Ole, Viewing three dimensional digital slides.
  226. Eichhorn, Ole, Viewing three dimensional digital slides.
  227. Najmabadi, Peyman; Crandall, Gregory J.; Stearrett, Aaron Alan; Soenksen, Dirk G.; Lee, Christopher Adam; Perz, Cynthia, Whole slide fluorescence scanner.
  228. Najmabadi, Peyman; Crandall, Gregory J.; Stearrett, Aaron Alan; Soenksen, Dirk G.; Lee, Christopher Adam; Perz, Cynthia, Whole slide fluorescence scanner.
  229. Najmabadi, Peyman; Crandall, Gregory J.; Stearrett, Aaron Alan; Soenksen, Dirk G.; Lee, Christopher Adam; Perz, Cynthia, Whole slide fluorescence scanner.
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