초록 ▼

A fault detection system detecting malfunctions or deteriorations, which may result in an inverter fault, is provided. The system has a temperature sensor installed on a semiconductor module to monitor a temperature rise rate. It is judged that an abnormal condition has occurred if the thermal resis

A fault detection system detecting malfunctions or deteriorations, which may result in an inverter fault, is provided. The system has a temperature sensor installed on a semiconductor module to monitor a temperature rise rate. It is judged that an abnormal condition has occurred if the thermal resistance is increased by the deterioration of a soldering layer of the semiconductor module or by drive circuit malfunctions and, as a result, the relation between an operation mode and the temperature rise rate falls outside a predetermined range.

대표청구항 ▼

1. An inverter system, comprising: a plurality of inverters, each of the inverters comprising a semiconductor module;a processor that controls said inverters;an information transmission line over which said inverters and said processor are connected; anda fault detection system for each of said inve

1. An inverter system, comprising: a plurality of inverters, each of the inverters comprising a semiconductor module;a processor that controls said inverters;an information transmission line over which said inverters and said processor are connected; anda fault detection system for each of said inverters, each fault detection system comprising:a temperature sense device installed on the semiconductor module of a respective one of said inverters;temperature measuring means for measuring a temperature from said temperature sense device; andfault detecting means coupled to said temperature measuring means for detecting a deterioration or a fault of the semiconductor module of the respective one of said inverters, based on the temperature measured by said temperature measuring means and an operation command issued to the respective one of said inverters,wherein said processor changes an operation command issued to each respective inverter according to deterioration or a fault in the semiconductor module of the respective inverter.