초록 ▼

A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, a

A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.

대표청구항 ▼

1. A method for measuring a gap between a proximity probe and a conductive target material, said method including the steps of: providing a network of components including a first electrical component and a proximity probe component serially connected;driving a dynamic current through the serially c

1. A method for measuring a gap between a proximity probe and a conductive target material, said method including the steps of: providing a network of components including a first electrical component and a proximity probe component serially connected;driving a dynamic current through the serially connected electrical components for impressing a first analog voltage across the network and a second analog voltage cross the proximity probe component;sampling and digitizing the first analog voltage impressed across said serially connected resistance and probe components to obtain a first digitized voltage value;sampling and digitizing a second analog voltage impressed across the probe component to obtain a second digitized voltage value;digitally convolving said first digitized voltage and said second digitized voltage into a first complex number and a second complex number respectively;calculating a voltage ratio of said second complex number to a difference between said first complex number and said second complex number;processing said voltage ratio into a gap value correlative to a gap between said proximity probe and a conductive target material.2. The method of claim 1 further including the step of outputting a signal as a function of said gap value which is correlative to said gap between said proximity probe and said conductive target material.3. The method of claim 1 wherein said processing step further includes the step of calculating a complex electrical impedance value of said proximity probe from said voltage ratio and processing said impedance value into said gap value correlative to said gap between said proximity probe and said conductive target material.4. The method of claim 3 further including the step of outputting a signal as a function of said gap value which is correlative to said gap between said proximity probe and said conductive target material.5. The apparatus of claim 1 wherein said processing step further includes the steps of calculating a complex electrical impedance value of said proximity probe from said voltage ratio, normalizing said complex electrical impedance value into a normalized value and processing said normalized value into said gap value correlative to said gap between said proximity probe and said conductive target material.6. The apparatus of claim 5 further including means for outputting a signal as a function of said gap value which is correlative to said gap between said proximity probe and said conductive target material.